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Authors: KANGASMAKI A TIKKANEN P KEINONEN J ORMAND WE RAMAN S FULOP Z KISS AZ SOMORJAI E
Citation: A. Kangasmaki et al., LIFETIMES OF S-32 LEVELS, Physical review. C. Nuclear physics, 58(2), 1998, pp. 699-720

Authors: MOUROUX A ZHANG SL PETERSSON CS PALMANS R MAEX K AHLGREN T KEINONEN J
Citation: A. Mouroux et al., AN EXPERIMENTAL-STUDY OF CHEMICAL-VAPOR-DEPOSITION OF TUNGSTEN ON TI TIN ADHESION BILAYERS - MECHANICAL-PROPERTIES/, Surface & coatings technology, 99(3), 1998, pp. 274-280

Authors: SILLANPAA J VAINONENAHLGREN E HAUSSALO P KEINONEN J
Citation: J. Sillanpaa et al., STOPPING OF 5-100KEV HELIUM IN MOLYBDENUM, CHROMIUM, COPPER AND NICKEL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 142(1-2), 1998, pp. 1-8

Authors: SAJAVAARA T JOKINEN J ARSTILA K KEINONEN J
Citation: T. Sajavaara et al., TOF-ERDA SPECTROMETRY APPLIED FOR THE ANALYSIS OF BE MIGRATION IN (100)GAAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 225-229

Authors: ARSTILA K TIKKANEN P KEINONEN J
Citation: K. Arstila et al., MEASUREMENT OF HEAVY-ION STOPPING POWERS BY COMBINING DOPPLER-SHIFT ATTENUATION AND TRANSMISSION METHODS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 98-102

Authors: TARUS J NORDLUND K KURONEN A KEINONEN J
Citation: J. Tarus et al., EFFECT OF SURFACE ON DEFECT CREATION BY SELF-ION BOMBARDMENT OF SI(001), Physical review. B, Condensed matter, 58(15), 1998, pp. 9907-9915

Authors: AHLGREN T VAINONEN E LIKONEN J KEINONEN J
Citation: T. Ahlgren et al., CONCENTRATION-DEPENDENT DEUTERIUM DIFFUSION IN DIAMOND-LIKE CARBON-FILMS, Physical review. B, Condensed matter, 57(16), 1998, pp. 9723-9726

Authors: RAUHALA E AHLGREN T VAKEVAINEN K RAISANEN J KEINONEN J SAARINEN K LAINE T LIKONEN J
Citation: E. Rauhala et al., DEFECT FORMATION AND ANNEALING BEHAVIOR OF INP IMPLANTED BY LOW-ENERGY N-15 IONS, Journal of applied physics, 83(2), 1998, pp. 738-746

Authors: KANGASMAKI A TIKKANEN P KEINONEN J ORMAND WE RAMAN S
Citation: A. Kangasmaki et al., LIFETIMES OF P-32 LEVELS, Physical review. C. Nuclear physics, 55(4), 1997, pp. 1697-1714

Authors: AHLGREN T LIKONEN J SLOTTE J RAISANEN J RAJATORA M KEINONEN J
Citation: T. Ahlgren et al., CONCENTRATION-DEPENDENT AND INDEPENDENT SI DIFFUSION IN ION-IMPLANTEDGAAS, Physical review. B, Condensed matter, 56(8), 1997, pp. 4597-4603

Authors: LIEB KP HAUSSALO P BOLSE W ILLGNER C KEINONEN J NIEDERDRENK M
Citation: Kp. Lieb et al., STUDIES OF NA-IRRADIATED NI SI BILAYERS - NA MIGRATION AND NISI FORMATION/, Thin solid films, 302(1-2), 1997, pp. 162-168

Authors: WANG WH BOLSE W ILLGNER C LIEB KP KEINONEN J EWERT JC
Citation: Wh. Wang et al., RECRYSTALLIZATION AND DIFFUSION IN SODIUM-IMPLANTED SILICON, Thin solid films, 295(1-2), 1997, pp. 169-177

Authors: VAINONEN E LIKONEN J AHLGREN T HAUSSALO P KEINONEN J WU CH
Citation: E. Vainonen et al., HYDROGEN MIGRATION IN DIAMOND-LIKE CARBON-FILMS, Journal of applied physics, 82(8), 1997, pp. 3791-3796

Authors: LIKONEN J VAKEVAINEN K AHLGREN T RAISANEN J RAUHALA E KEINONEN J
Citation: J. Likonen et al., ANNEALING BEHAVIOR OF HIGH-DOSE-IMPLANTED NITROGEN IN INP, Applied physics A: Materials science & processing, 62(5), 1996, pp. 463-468

Authors: RAMAN S WARBURTON EK STARNER JW JURNEY ET LYNN JE TIKKANEN P KEINONEN J
Citation: S. Raman et al., SPECTROSCOPY OF F-20 LEVELS, Physical review. C. Nuclear physics, 53(2), 1996, pp. 616-646

Authors: FULOP Z LEVAI G SOMORJAI E KISS AZ CSEH J TIKKANEN P KEINONEN J
Citation: Z. Fulop et al., A COMPREHENSIVE STUDY OF THE S-34+ALPHA SYSTEM, Nuclear physics. A, 604(3), 1996, pp. 286-304

Authors: HAUSSALO P LIEB KP BOLSE W ILLGNER C KEINONEN J
Citation: P. Haussalo et al., STUDIES OF NA-SEGREGATION AT NI ALPHA-QUARTZ INTERFACES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 120(1-4), 1996, pp. 266-269

Authors: JOKINEN J KEINONEN J TIKKANEN P KURONEN A AHLGREN T NORDLUND K
Citation: J. Jokinen et al., COMPARISON OF TOF-ERDA AND NUCLEAR-RESONANCE REACTION TECHNIQUES FOR RANGE PROFILE MEASUREMENTS OF KEV ENERGY IMPLANTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 119(4), 1996, pp. 533-542

Authors: HAUSSALO P NORDLUND K KEINONEN J
Citation: P. Haussalo et al., STOPPING OF 5-100-KEV HELIUM IN TANTALUM, NIOBIUM, TUNGSTEN, AND AISI-316L STEEL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 111(1-2), 1996, pp. 1-6

Authors: JOKINEN J HAUSSALO P KEINONEN J RITALA M RIIHELA D LESKELA M
Citation: J. Jokinen et al., ANALYSIS OF ALN THIN-FILMS BY COMBINING TOF-ERDA AND NRB TECHNIQUES, Thin solid films, 289(1-2), 1996, pp. 159-165

Authors: NORDLUND K KEINONEN J MATTILA T
Citation: K. Nordlund et al., FORMATION OF ION IRRADIATION-INDUCED SMALL-SCALE DEFECTS ON GRAPHITE SURFACES, Physical review letters, 77(4), 1996, pp. 699-702

Authors: AHLGREN T VAKEVAINEN K RAISANEN J RAUHALA E KEINONEN J
Citation: T. Ahlgren et al., RANGE PROFILES OF 6-10 MEV N-15 IONS IMPLANTED IN SILICON, Applied surface science, 90(4), 1995, pp. 419-423

Authors: ARSTILA K KEINONEN J TIKKANEN P
Citation: K. Arstila et al., STOPPING POWER FOR LOW-VELOCITY HEAVY-IONS - (0.01-0.9) MEV NUCLEON SI IONS IN 18 (Z=13-79) METALS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101(4), 1995, pp. 321-326

Authors: NORDLUND K KEINONEN J RAUHALA E AHLGREN T
Citation: K. Nordlund et al., RANGE PROFILES IN SELF-ION-IMPLANTED CRYSTALLINE SI, Physical review. B, Condensed matter, 52(21), 1995, pp. 15170-15175

Authors: KURONEN A KEINONEN J BORNER H JOLIE J
Citation: A. Kuronen et al., SLOWING-DOWN OF 3-EV SM IONS IN EU COMPOUNDS, Physical review. B, Condensed matter, 52(17), 1995, pp. 12640-12643
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