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Results: 1-25 | 26-31
Results: 1-25/31
Model of low frequency noise in polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Kamarinos, G Brini, J
Citation: Ca. Dimitriadis et al., Model of low frequency noise in polycrystalline silicon thin-film transistors, IEEE ELEC D, 22(8), 2001, pp. 381-383
Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Dimitriadis, CA
Citation: Fv. Farmakis et al., Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors, IEEE ELEC D, 22(2), 2001, pp. 74-76
Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors
Authors: Farmakis, FV Dimitriadis, CA Brini, J Kamarinos, G
Citation: Fv. Farmakis et al., Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors, IEEE ELEC D, 22(2), 2001, pp. 83-85
Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs)
Authors: Farmakis, FV Tsamados, DM Brini, J Kamarinos, G Dimitriadis, CA Miyasaka, M
Citation: Fv. Farmakis et al., Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs), THIN SOL FI, 383(1-2), 2001, pp. 151-153
Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Kamarinos, G Brini, J
Citation: Ca. Dimitriadis et al., Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors, SOL ST ELEC, 45(2), 2001, pp. 365-368
On-current modeling of large-grain polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Angelis, CT Dimitriadis, CA Miyasaka, M
Citation: Fv. Farmakis et al., On-current modeling of large-grain polycrystalline silicon thin-film transistors, IEEE DEVICE, 48(4), 2001, pp. 701-706
Electrical and low frequency noise properties of Gd and GdCo silicide contacts on n-type Si
Authors: Dozsa, L Horvath, ZJ Molnar, GL Peto, G Dimitriadis, CA Papadimitriou, L Brini, J Kamarinos, G
Citation: L. Dozsa et al., Electrical and low frequency noise properties of Gd and GdCo silicide contacts on n-type Si, SEMIC SCI T, 15(7), 2000, pp. 653-657
Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Angelis, CT Dimitriadis, CA Miyasaka, M Ouisse, T
Citation: Fv. Farmakis et al., Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors, SOL ST ELEC, 44(6), 2000, pp. 913-916
Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors
Authors: Angelis, CT Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G Miyasaka, M Stoemenos, I
Citation: Ct. Angelis et al., Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors, SOL ST ELEC, 44(6), 2000, pp. 1081-1087
Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors
Authors: Dimitriadis, CA Kimura, M Miyasaka, M Inoue, S Farmakis, FV Brini, J Kamarinos, G
Citation: Ca. Dimitriadis et al., Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors, SOL ST ELEC, 44(11), 2000, pp. 2045-2051
Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G
Citation: Ca. Dimitriadis et al., Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors, J APPL PHYS, 88(5), 2000, pp. 2648-2651
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors (vol 86, pg 4600, 1999)
Authors: Angelis, CT Dimitriadis, CA Miyasaka, M Farmakis, FV Kamarinos, G Brini, J Stoemenos, J
Citation: Ct. Angelis et al., Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors (vol 86, pg 4600, 1999), J APPL PHYS, 87(3), 2000, pp. 1588-1588
Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors
Authors: Angelis, CT Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G Miyasaka, M
Citation: Ct. Angelis et al., Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors, APPL PHYS L, 76(17), 2000, pp. 2442-2444
Empirical relationship between low-frequency drain current noise and grain-boundary potential barrier height in high-temperature-processed polycrystalline silicon thin-film transistors
Authors: Angelis, CT Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G Gueorguiev, VK Ivanov, TE
Citation: Ct. Angelis et al., Empirical relationship between low-frequency drain current noise and grain-boundary potential barrier height in high-temperature-processed polycrystalline silicon thin-film transistors, APPL PHYS L, 76(1), 2000, pp. 118-120
Surface dopant concentration measurement using the Surface Charge Profiler(SCP) method: characterization of hydrogen and metallic contamination in silicon
Authors: Danel, A Tardif, F Kamarinos, G
Citation: A. Danel et al., Surface dopant concentration measurement using the Surface Charge Profiler(SCP) method: characterization of hydrogen and metallic contamination in silicon, MAT SCI E B, 58(1-2), 1999, pp. 64-70
Structural and trap properties of polycrystalline semiconducting FeSi2 thin films
Authors: Tassis, DH Dimitriadis, CA Polychroniadis, EK Brini, J Kamarinos, G
Citation: Dh. Tassis et al., Structural and trap properties of polycrystalline semiconducting FeSi2 thin films, SEMIC SCI T, 14(11), 1999, pp. 967-974
Low frequency noise measurements on TiN/n-Si Schottky diodes
Authors: Lee, JI Brini, J Kamarinos, G Dimitriadis, CA Logothetidis, S Patsalas, P
Citation: Ji. Lee et al., Low frequency noise measurements on TiN/n-Si Schottky diodes, APPL SURF S, 142(1-4), 1999, pp. 390-393
A new method for the determination of the channel length reduction in polysilicon thin film transistors (TFTs)
Authors: Farmakis, FV Brini, J Kamarinos, G Mathieu, N Dimitriadis, CA
Citation: Fv. Farmakis et al., A new method for the determination of the channel length reduction in polysilicon thin film transistors (TFTs), THIN SOL FI, 337(1-2), 1999, pp. 105-108
Hot-carrier phenomena in high temperature processed undoped-hydrogenated n-channel polysilicon thin film transistors (TFTs)
Authors: Farmakis, FV Dimitriadis, CA Brini, J Kamarinos, G Gueorguiev, VK Ivanov, TE
Citation: Fv. Farmakis et al., Hot-carrier phenomena in high temperature processed undoped-hydrogenated n-channel polysilicon thin film transistors (TFTs), SOL ST ELEC, 43(7), 1999, pp. 1259-1266
Contacts of titanium nitride to n- and p-type gallium nitride films
Authors: Dimitriadis, CA Karakostas, T Logothetidis, S Kamarinos, G Brini, J Nouet, G
Citation: Ca. Dimitriadis et al., Contacts of titanium nitride to n- and p-type gallium nitride films, SOL ST ELEC, 43(10), 1999, pp. 1969-1972
Leakage current variation during two different modes of electrical stressing in undoped hydrogenated n-channel polysilicon thin film transistors (TFTs)
Authors: Farmakis, FV Brini, J Kamarinos, G Dimitriadis, CA Gueorguiev, VK Ivanov, TE
Citation: Fv. Farmakis et al., Leakage current variation during two different modes of electrical stressing in undoped hydrogenated n-channel polysilicon thin film transistors (TFTs), MICROEL REL, 39(6-7), 1999, pp. 885-889
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
Authors: Angelis, CT Dimitriadis, CA Miyasaka, M Farmakis, FV Kamarinos, G Brini, J Stoemenos, J
Citation: Ct. Angelis et al., Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors, J APPL PHYS, 86(8), 1999, pp. 4600-4606
Dimension scaling of low frequency noise in the drain current of polycrystalline silicon thin-film transistors
Authors: Angelis, CT Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G Miyasaka, M
Citation: Ct. Angelis et al., Dimension scaling of low frequency noise in the drain current of polycrystalline silicon thin-film transistors, J APPL PHYS, 86(12), 1999, pp. 7083-7086
Photon emission and related hot-carrier effects in polycrystalline siliconthin-film transistors
Authors: Farmakis, FV Dimitriadis, CA Brini, J Kamarinos, G Gueorguiev, VK Ivanov, TE
Citation: Fv. Farmakis et al., Photon emission and related hot-carrier effects in polycrystalline siliconthin-film transistors, J APPL PHYS, 85(9), 1999, pp. 6917-6919
Low-frequency noise in polycrystalline semiconducting FeSi2 thin films
Authors: Tassis, DH Dimitriadis, CA Brini, J Kamarinos, G Birbas, A
Citation: Dh. Tassis et al., Low-frequency noise in polycrystalline semiconducting FeSi2 thin films, J APPL PHYS, 85(8), 1999, pp. 4091-4095
Risultati: 1-25 | 26-31