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Results: 1-21 |
Results: 21
Sputter-erosion dynamics of Ni(110) surface
Authors: Kahng, SJ Choi, BY Kuk, Y
Citation: Sj. Kahng et al., Sputter-erosion dynamics of Ni(110) surface, APPL SURF S, 183(1-2), 2001, pp. 76-79
Electrical characterization of an operating Si pn-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy
Authors: Buh, GH Chung, HJ Yi, JH Yoon, IT Kuk, Y
Citation: Gh. Buh et al., Electrical characterization of an operating Si pn-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy, J APPL PHYS, 90(1), 2001, pp. 443-448
Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study
Authors: Buh, GH Chung, HJ Kuk, Y
Citation: Gh. Buh et al., Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study, APPL PHYS L, 79(13), 2001, pp. 2010-2012
Variable-temperature scanning capacitance microscopy: A way to probe charge traps in oxide or semiconductor
Authors: Kim, CK Yoon, IT Kuk, Y Lim, H
Citation: Ck. Kim et al., Variable-temperature scanning capacitance microscopy: A way to probe charge traps in oxide or semiconductor, APPL PHYS L, 78(5), 2001, pp. 613-615
Interference pattern of a coherent electron beam by localized leakage magnetic field
Authors: Park, JY Kim, SH Park, WG Kuk, Y
Citation: Jy. Park et al., Interference pattern of a coherent electron beam by localized leakage magnetic field, APPL PHYS L, 78(12), 2001, pp. 1745-1747
Strained Ge overlayer on a Si(001)-(2X1) surface
Authors: Kahng, SJ Ha, YH Moon, DW Kuk, Y
Citation: Sj. Kahng et al., Strained Ge overlayer on a Si(001)-(2X1) surface, PHYS REV B, 61(16), 2000, pp. 10827-10831
Intermixing in Stranski-Krastanov germanium overlayer on Si(100)
Authors: Kahng, SJ Ha, YH Moon, DW Kuk, Y
Citation: Sj. Kahng et al., Intermixing in Stranski-Krastanov germanium overlayer on Si(100), J VAC SCI A, 18(4), 2000, pp. 1937-1940
Modification of surface-state dispersion upon Xe adsorption: A scanning tunneling microscope study
Authors: Park, JY Ham, UD Kahng, SJ Kuk, Y Miyake, K Hata, K Shigekawa, H
Citation: Jy. Park et al., Modification of surface-state dispersion upon Xe adsorption: A scanning tunneling microscope study, PHYS REV B, 62(24), 2000, pp. R16341-R16344
Segregation of Si in Ge overlayers grown on Si(100) with hydrogen surfactant
Authors: Kahng, SJ Ha, YH Moon, DW Kuk, Y
Citation: Sj. Kahng et al., Segregation of Si in Ge overlayers grown on Si(100) with hydrogen surfactant, APPL PHYS L, 77(7), 2000, pp. 981-983
Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy
Authors: Buh, GH Chung, HJ Kim, CK Yi, JH Yoon, IT Kuk, Y
Citation: Gh. Buh et al., Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy, APPL PHYS L, 77(1), 2000, pp. 106-108
Characterization of bimetallic cantilever for chemical sensor application
Authors: Jung, MY Kim, DW Choi, SS Kang, CJ Kuk, Y
Citation: My. Jung et al., Characterization of bimetallic cantilever for chemical sensor application, JPN J A P 1, 38(11), 1999, pp. 6555-6557
Fabrication of bimetallic cantilevers and its characterization
Authors: Jung, MY Choi, SS Kang, CJ Kuk, Y
Citation: My. Jung et al., Fabrication of bimetallic cantilevers and its characterization, SURF REV L, 6(6), 1999, pp. 1195-1199
Atomic view of Ge on the monohydride Si(001)-(2 x 1) surface
Authors: Kahng, SJ Park, JY Kuk, Y
Citation: Sj. Kahng et al., Atomic view of Ge on the monohydride Si(001)-(2 x 1) surface, PHYS REV B, 60(24), 1999, pp. 16558-16562
Adsorption and growth of Xe adlayers on the Cu(111) surface
Authors: Park, JK Kahng, SJ Ham, UD Kuk, Y Miyake, K Hata, K Shigekawa, H
Citation: Jk. Park et al., Adsorption and growth of Xe adlayers on the Cu(111) surface, PHYS REV B, 60(24), 1999, pp. 16934-16940
Surface alloy formation of Fe on Cr(100) studied by scanning tunneling microscopy
Authors: Choi, YJ Jeong, IC Park, JY Kahng, SJ Lee, J Kuk, Y
Citation: Yj. Choi et al., Surface alloy formation of Fe on Cr(100) studied by scanning tunneling microscopy, PHYS REV B, 59(16), 1999, pp. 10918-10922
Kinetic processes in the growth and decomposition of a two-dimensional binary alloy
Authors: Kahng, SJ Park, JY Kuk, Y
Citation: Sj. Kahng et al., Kinetic processes in the growth and decomposition of a two-dimensional binary alloy, SURF SCI, 442(3), 1999, pp. 379-384
Surface reconstructions of the Si(100)-Ge system
Authors: Kahng, SJ Park, JY Kuk, Y
Citation: Sj. Kahng et al., Surface reconstructions of the Si(100)-Ge system, SURF SCI, 440(3), 1999, pp. 351-356
Low-energy electron point source microscope with position-sensitive electron energy analyzer
Authors: Park, JY Kim, SH Suh, YD Park, WG Kuk, Y
Citation: Jy. Park et al., Low-energy electron point source microscope with position-sensitive electron energy analyzer, REV SCI INS, 70(11), 1999, pp. 4304-4307
Local charge trapping and detection of trapped charge by scanning capacitance microscope in the SiO2/Si system
Authors: Hong, JW Shin, SM Kang, CJ Kuk, Y Khim, ZG Park, SI
Citation: Jw. Hong et al., Local charge trapping and detection of trapped charge by scanning capacitance microscope in the SiO2/Si system, APPL PHYS L, 75(12), 1999, pp. 1760-1762
Phase separation in a two-dimensional Co-Cr alloy
Authors: Kahng, SJ Choi, YJ Park, JY Kuk, Y
Citation: Sj. Kahng et al., Phase separation in a two-dimensional Co-Cr alloy, APPL PHYS L, 74(8), 1999, pp. 1087-1089
Charge trap dynamics in a SiO2 layer on Si by scanning capacitance microscopy
Authors: Kang, CJ Buh, GH Lee, S Kim, CK Mang, KM Im, C Kuk, Y
Citation: Cj. Kang et al., Charge trap dynamics in a SiO2 layer on Si by scanning capacitance microscopy, APPL PHYS L, 74(13), 1999, pp. 1815-1817
Risultati: 1-21 |