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Citation: B. Desalvo et al., CHARACTERIZATION OF SILC IN THIN OXIDES BY USING MOSFET SUBSTRATE CURRENT, Microelectronics and reliability, 38(6-8), 1998, pp. 1075-1080
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Citation: A. Meinertzhagen et al., EFFECT OF THE DISCHARGING AND RECHARGING OF THE STRESS GENERATED OXIDE CHARGE IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS ON THE LOW-FIELD LEAKAGE CURRENT, Microelectronics and reliability, 38(2), 1998, pp. 221-225
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MONDON F
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Citation: P. Candelier et al., SIMPLIFIED 0.35-MU-M FLASH EEPROM PROCESS USING HIGH-TEMPERATURE OXIDE (HTO) DEPOSITED BY LPCVD AS INTERPOLY DIELECTRICS AND PERIPHERAL TRANSISTORS GATE OXIDE, IEEE electron device letters, 18(7), 1997, pp. 306-308
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CANDELIER P
GUILLAUMOT B
MONDON F
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Citation: P. Candelier et al., HIGH-TEMPERATURE OXIDE (HTO) FOR NON VOLATILE MEMORIES APPLICATIONS, Microelectronic engineering, 36(1-4), 1997, pp. 87-90
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Citation: D. Goguenheim et al., A COUPLED I(V) AND CHARGE-PUMPING ANALYSIS OF STRESS-INDUCED LEAKAGE CURRENTS IN 5NM-THICK GATE OXIDES, Microelectronic engineering, 36(1-4), 1997, pp. 141-144
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CANDELIER P
MONDON F
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Citation: P. Candelier et al., HOLE TRAPPING IN FLASH EEPROM GATE OXIDE AND DAMAGES INDUCED BY GATE TO SOURCE ERASING, Journal of non-crystalline solids, 216, 1997, pp. 162-167
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MONDON F
Citation: G. Yard et al., COMPARISON OF THE CHARGES GENERATED BY FOWLER-NORDHEIM TUNNELING INJECTION IN DIFFERENT OXIDES OF METAL-OXIDE-SEMICONDUCTOR CAPACITORS, Journal of non-crystalline solids, 216, 1997, pp. 174-179
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ROBERT B
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MONDON F
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FERRE F
DINHXUAN AT
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KACEMI A
MONDON F
FOURNIER T
FERRE F
Citation: Fc. Cavaille et al., CONTRACTILE PROTEINS IN HUMAN FETOPLACENTAL VESSELS, American journal of obstetrics and gynecology, 173(6), 1995, pp. 1793-1799
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Citation: F. Ferre et al., ENDOTHELIN-1 BINDING-SITES AND IMMUNOREACTIVITY IN THE CULTURED HUMANPLACENTAL TROPHOBLAST - EVIDENCE FOR AN AUTOCRINE AND PARACRINE ROLE FOR ENDOTHELIN-1, Journal of cardiovascular pharmacology, 22, 1993, pp. 190000214-190000218
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ROBAUT C
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BANDET J
TANGUY G
ROSTENE W
CAVERO I
FERRE F
Citation: F. Mondon et al., BIOCHEMICAL-CHARACTERIZATION AND AUTORADIOGRAPHIC LOCALIZATION OF [I-125] ENDOTHELIN-1 BINDING-SITES ON TROPHOBLAST AND BLOOD-VESSELS OF HUMAN PLACENTA, The Journal of clinical endocrinology and metabolism, 76(1), 1993, pp. 237-244
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Citation: Jf. Daviet et al., ELECTROSTATIC CLAMPING APPLIED TO SEMICONDUCTOR PLASMA PROCESSING .2.EXPERIMENTAL RESULTS, Journal of the Electrochemical Society, 140(11), 1993, pp. 3256-3261