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Authors: GARRIDO B PEREZRODRIGUEZ A MORANTE JR ACHIQ A GOURBILLEAU F MADELON R RIZK R
Citation: B. Garrido et al., STRUCTURAL, OPTICAL, AND ELECTRICAL-PROPERTIES OF NANOCRYSTALLINE SILICON FILMS DEPOSITED BY HYDROGEN PLASMA SPUTTERING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1851-1859

Authors: PRESSEL K FRANZ M KRUGER D OSTEN HJ GARRIDO B MORANTE JR
Citation: K. Pressel et al., OXIDATION OF SI1-YCY ESS-THAN-OR-EQUAL-TO-Y-LESS-THAN-OR-EQUAL-TO-0.02) STRAINED LAYERS GROWN ON SI(001), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1757-1761

Authors: KAPPLER J BARSAN N WEIMAR U DIEGUEZ A ALAY JL ROMANORODRIGUEZ A MORANTE JR GOPEL W
Citation: J. Kappler et al., CORRELATION BETWEEN XPS, RAMAN AND TEM MEASUREMENTS AND THE GAS SENSITIVITY OF PT AND PD DOPED SNO2 BASED GAS SENSORS, Fresenius' journal of analytical chemistry, 361(2), 1998, pp. 110-114

Authors: SERRE C GOROSTIZA P PEREZRODRIGUEZ A SANZ F MORANTE JR
Citation: C. Serre et al., MEASUREMENT OF MICROMECHANICAL PROPERTIES OF POLYSILICON MICROSTRUCTURES WITH AN ATOMIC-FORCE MICROSCOPE, Sensors and actuators. A, Physical, 67(1-3), 1998, pp. 215-219

Authors: ALVAREZ AL CALLE F VALTUENA JF FAURA J SANCHEZ MA CALLEJA E MUNOZ E MORANTE JR GONZALEZ D ARAUJO D ROJA RG
Citation: Al. Alvarez et al., INFLUENCE OF INTERFACE DISLOCATIONS ON SURFACE KINETICS DURING EPITAXIAL-GROWTH OF INGAAS, Applied surface science, 123, 1998, pp. 303-307

Authors: CAMMACK DS MCGREGOR SM MCCHESNEY JJ CLARK SA DUNSTAN PR BURGESS SR WILKS SP PEIRO F FERRER JC CORNET A MORANTE JR KESTLE A WESTWOOD DI ELLIOTT M
Citation: Ds. Cammack et al., AN INVESTIGATION OF THE PROPERTIES OF INTIMATE IN-INXGA1-XAS(100) INTERFACES FORMED AT ROOM AND CRYOGENIC TEMPERATURES, Applied surface science, 123, 1998, pp. 501-507

Authors: FERRER JC PEIRO F CORNET A MORANTE JR UTZMEIER T ARMELLES G BRIONES F
Citation: Jc. Ferrer et al., MORPHOLOGY EVOLUTION OF INSB ISLAND GROWN ON INP SUBSTRATES BY ATOMICLAYER MOLECULAR-BEAM EPITAXY, Microelectronic engineering, 43-4, 1998, pp. 51-57

Authors: PEREZRODRIGUEZ A CORNET A MORANTE JR
Citation: A. Perezrodriguez et al., PHYSICAL TECHNIQUES FOR SILICON LAYER ANALYSIS, Microelectronic engineering, 40(3-4), 1998, pp. 223-237

Authors: PRIETO JA ARMELLES G UTZMEIER T BRIONES F FERRER JC PEIRO F CORNET A MORANTE JR
Citation: Ja. Prieto et al., STRAIN-INDUCED QUENCHING OF OPTICAL-TRANSITIONS IN CAPPED SELF-ASSEMBLED QUANTUM-DOT STRUCTURES, Physical review letters, 80(5), 1998, pp. 1094-1097

Authors: GALAYEV AA PARKHOMENKO YN CHTCHERBATCHEV KD PODGORNY DA BELOGOROHOV AI DIEGUEZ A ROMANORODRIGUEZ A PEREZRODRIGUEZ A MORANTE JR
Citation: Aa. Galayev et al., STRUCTURAL-ANALYSIS OF BURIED CONDUCTING COSI2 LAYERS FORMED IN SI BYHIGH-DOSE CO ION-IMPLANTATION, Journal of crystal growth, 187(3-4), 1998, pp. 435-443

Authors: PEIRO F CORNET A MORANTE JR BECK M PY MA
Citation: F. Peiro et al., SURFACE-ROUGHNESS IN INGAAS CHANNELS OF HIGH-ELECTRON-MOBILITY TRANSISTORS DEPENDING ON THE GROWTH TEMPERATURE - STRAIN-INDUCED OR DUE TO ALLOY DECOMPOSITION, Journal of applied physics, 83(12), 1998, pp. 7537-7541

Authors: COSTA J ROURA P MORANTE JR BERTRAN E
Citation: J. Costa et al., BLACKBODY EMISSION UNDER LASER EXCITATION OF SILICON NANOPOWDER PRODUCED BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 83(12), 1998, pp. 7879-7885

Authors: ACHIQ A RIZK R GOURBILLEAU F MADELON R GARRIDO B PEREZRODRIGUEZ A MORANTE JR
Citation: A. Achiq et al., EFFECTS OF PRIOR HYDROGENATION ON THE STRUCTURE AND PROPERTIES OF THERMALLY NANOCRYSTALLIZED SILICON LAYERS, Journal of applied physics, 83(11), 1998, pp. 5797-5803

Authors: ARTAMONOV VV KLYUI NI MELNIK VP ROMANYUK BN VALAKH MY VASILIK O SEMENOVICH VA PEREZRODRIGUEZ A MORANTE JR
Citation: Vv. Artamonov et al., MICRORAMAN AND MICROHARDNESS STUDY OF NITROGEN-IMPLANTED DIAMOND-LIKECARBON-FILMS, Carbon (New York), 36(5-6), 1998, pp. 791-794

Authors: BELOGOROKHOV AI BELOGOROKHOVA LI PEREZRODRIGUEZ A MORANTE JR GAVRILOV S
Citation: Ai. Belogorokhov et al., OPTICAL CHARACTERIZATION OF POROUS SILICON EMBEDDED WITH CDSE NANOPARTICLES, Applied physics letters, 73(19), 1998, pp. 2766-2768

Authors: BONAFOS C GARRIDO B LOPEZ M ROMANORODRIGUEZ A GONZALEZVARONA O PEREZRODRIGUEZ A MORANTE JR
Citation: C. Bonafos et al., ION-BEAM SYNTHESIS AND STRUCTURAL CHARACTERIZATION OF ZNS NANOCRYSTALS IN SIO2, Applied physics letters, 72(26), 1998, pp. 3488-3490

Authors: FERRER JC PEIRO F CORNET A MORANTE JR UTZMEIER T BRIONES F
Citation: Jc. Ferrer et al., MICROSTRUCTURE OF PYRAMIDAL DEFECTS IN INSB LAYERS GROWN BY ATOMIC LAYER MOLECULAR-BEAM EPITAXY ON INP SUBSTRATES, Journal de physique. III, 7(12), 1997, pp. 2317-2324

Authors: PEIRO F FERRER JC CORNET A MORANTE JR BECK M PY MA
Citation: F. Peiro et al., WELL SURFACE-ROUGHNESS AND FAULT DENSITY EFFECTS ON THE HALL-MOBILITYOF INXGA1-XAS INYAL1-YAS/INP HIGH-ELECTRON-MOBILITY TRANSISTORS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(5), 1997, pp. 1715-1723

Authors: DIEGUEZ A VILA A CORNET A CLARK SA WESTWOOD DI MORANTE JR
Citation: A. Dieguez et al., DEFECTS, SURFACE ROUGHENING, AND ANISOTROPY ON THE TENSILE INXGA1-XASINP(001) SYSTEM/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 687-695

Authors: MORANTE JR
Citation: Jr. Morante, THE 7TH EUROPEAN WORKSHOP ON MICROMECHANICS (MME96) - PREFACE, Journal of micromechanics and microengineering, 7(3), 1997, pp. 3-3

Authors: NAVARRO M LOPEZVILLEGAS JM SAMITIER J MORANTE JR BAUSELLS J MERLOS A
Citation: M. Navarro et al., ELECTROCHEMICAL ETCHING OF POROUS SILICON SACRIFICIAL LAYERS FOR MICROMACHINING APPLICATIONS, Journal of micromechanics and microengineering, 7(3), 1997, pp. 131-132

Authors: SANGALETTI T DEPERO LE DIEGUEZ A MARCA G MORANTE JR ROMANORODRIGUEZ A SBERVEGLIERI G
Citation: T. Sangaletti et al., MICROSTRUCTURE AND MORPHOLOGY OF TIN DIOXIDE MULTILAYER THIN-FILM GASSENSORS, Sensors and actuators. B, Chemical, 44(1-3), 1997, pp. 268-274

Authors: MORENO M DOMINGUEZ C MUNOZ J CALDERER J MORANTE JR
Citation: M. Moreno et al., PHOTOSENSOR AND OPTICAL-WAVE WIDE COUPLING IN SILICON TECHNOLOGY, Sensors and actuators. A, Physical, 62(1-3), 1997, pp. 524-528

Authors: NAVARRO M LOPEZVILLEGAS JM SAMITIER J MORANTE JR BAUSELLS J
Citation: M. Navarro et al., IMPROVEMENT OF THE POROUS SILICON SACRIFICIAL-LAYER ETCHING FOR MICROMACHINING APPLICATIONS, Sensors and actuators. A, Physical, 62(1-3), 1997, pp. 676-679

Authors: PEIRO F FERRER JC CORNET A MORANTE JR BECK M PY MA
Citation: F. Peiro et al., CORRELATION OF ELECTRICAL ANISOTROPIES OF HEMT DEVICES WITH DEFECT DISTRIBUTION AND INGAAS WELL ROUGHNESS, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 325-329
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