Citation: M. Baleva et al., Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements, J MATER SCI, 34(4), 1999, pp. 795-799
Citation: E. Mateeva et P. Sutter, Influence of the substrate bias on epitaxial growth of Si films by dc-discharge plasma chemical vapour deposition, SEMIC SCI T, 13(12), 1998, pp. 1426-1430
Authors:
Sutter, P
Mateeva, E
Sullivan, JS
Lagally, MG
Citation: P. Sutter et al., Low-energy electron microscopy of nanoscale three-dimensional SiGe islandson Si(100), THIN SOL FI, 336(1-2), 1998, pp. 262-270