Authors:
Nikulin, AY
Tamasaku, K
Usher, BF
Ishikawa, T
Citation: Ay. Nikulin et al., Experimental studies of 90 degrees Bragg reflection from a sub-micron InxGa1-xAs single-crystal film deposited on a GaAs substrate, JPN J A P 1, 40(2A), 2001, pp. 898-903
Authors:
Nikulin, AY
Siu, K
Davis, JR
Zaumseil, P
Souvorov, AY
Freund, A
Citation: Ay. Nikulin et al., Application of the phase-retrieval x-ray diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge, PHYS ST S-A, 184(1), 2001, pp. 145-155
Authors:
Siu, K
Nikulin, AY
Tamasaku, K
Ishikawa, T
Citation: K. Siu et al., An application of phase retrieval x-ray diffiractometry to refraction/small-angle scattering data, J PHYS D, 34(18), 2001, pp. 2912-2917
Authors:
Nikulin, AY
Davis, JR
Jones, NT
Usher, BF
Souvorov, AY
Freund, A
Citation: Ay. Nikulin et al., Experimental observation of X-ray diffraction from a thin crystalline filmat a 90 degrees Bragg reflection, PHYS ST S-A, 179(1), 2000, pp. 103-108
Citation: Ay. Nikulin et al., On a possibility of high-resolution characterization of InGaAs/GaAs multilayers using phase-retrieval x-ray diffractometry technique, J PHYS D, 33(20), 2000, pp. 2521-2526
Citation: Ay. Nikulin, Reply to "Comment on 'Uniqueness of the complex diffraction amplitude in x-ray Bragg diffraction'", PHYS REV B, 59(22), 1999, pp. 14784-14785
Citation: Ay. Nikulin et P. Zaumseil, Phase-retrieval X-ray diffractometry in the case of high- or low-flux radiation source, PHYS ST S-A, 172(2), 1999, pp. 291-301
Citation: Ay. Nikulin, A comment on 'The interpretation of x-ray rocking curves by the Fourier transform method', J PHYS D, 31(22), 1998, pp. 3323-3324
Authors:
Nikulin, AY
Davis, JR
Jones, NT
Zaumseil, P
Citation: Ay. Nikulin et al., X-ray phase-amplitude contrast mapping of single-crystal alloys near the absorption edge of the alloy impurity, J APPL PHYS, 84(9), 1998, pp. 4815-4821