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Results: 1-12 |
Results: 12
Experimental studies of 90 degrees Bragg reflection from a sub-micron InxGa1-xAs single-crystal film deposited on a GaAs substrate
Authors: Nikulin, AY Tamasaku, K Usher, BF Ishikawa, T
Citation: Ay. Nikulin et al., Experimental studies of 90 degrees Bragg reflection from a sub-micron InxGa1-xAs single-crystal film deposited on a GaAs substrate, JPN J A P 1, 40(2A), 2001, pp. 898-903
Application of the phase-retrieval x-ray diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge
Authors: Nikulin, AY Siu, K Davis, JR Zaumseil, P Souvorov, AY Freund, A
Citation: Ay. Nikulin et al., Application of the phase-retrieval x-ray diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge, PHYS ST S-A, 184(1), 2001, pp. 145-155
Implementation of an analyser crystal method for x-ray diffraction tomography
Authors: Kewish, CM Davis, JR Nikulin, AY Benci, A Pavlov, KM Morgan, MJ Hester, J
Citation: Cm. Kewish et al., Implementation of an analyser crystal method for x-ray diffraction tomography, J PHYS D, 34(7), 2001, pp. 1059-1064
An application of phase retrieval x-ray diffiractometry to refraction/small-angle scattering data
Authors: Siu, K Nikulin, AY Tamasaku, K Ishikawa, T
Citation: K. Siu et al., An application of phase retrieval x-ray diffiractometry to refraction/small-angle scattering data, J PHYS D, 34(18), 2001, pp. 2912-2917
X-ray phase retrieval in high-resolution refraction data from amorphous materials
Authors: Siu, K Nikulin, AY Tamasaku, K Ishikawa, T
Citation: K. Siu et al., X-ray phase retrieval in high-resolution refraction data from amorphous materials, APPL PHYS L, 79(13), 2001, pp. 2112-2114
Experimental observation of X-ray diffraction from a thin crystalline filmat a 90 degrees Bragg reflection
Authors: Nikulin, AY Davis, JR Jones, NT Usher, BF Souvorov, AY Freund, A
Citation: Ay. Nikulin et al., Experimental observation of X-ray diffraction from a thin crystalline filmat a 90 degrees Bragg reflection, PHYS ST S-A, 179(1), 2000, pp. 103-108
On a possibility of high-resolution characterization of InGaAs/GaAs multilayers using phase-retrieval x-ray diffractometry technique
Authors: Nikulin, AY Siu, K Davis, JR Usher, BF
Citation: Ay. Nikulin et al., On a possibility of high-resolution characterization of InGaAs/GaAs multilayers using phase-retrieval x-ray diffractometry technique, J PHYS D, 33(20), 2000, pp. 2521-2526
Reply to "Comment on 'Uniqueness of the complex diffraction amplitude in x-ray Bragg diffraction'"
Authors: Nikulin, AY
Citation: Ay. Nikulin, Reply to "Comment on 'Uniqueness of the complex diffraction amplitude in x-ray Bragg diffraction'", PHYS REV B, 59(22), 1999, pp. 14784-14785
Phase-retrieval X-ray diffractometry in the case of high- or low-flux radiation source
Authors: Nikulin, AY Zaumseil, P
Citation: Ay. Nikulin et P. Zaumseil, Phase-retrieval X-ray diffractometry in the case of high- or low-flux radiation source, PHYS ST S-A, 172(2), 1999, pp. 291-301
A comment on 'The interpretation of x-ray rocking curves by the Fourier transform method'
Authors: Nikulin, AY
Citation: Ay. Nikulin, A comment on 'The interpretation of x-ray rocking curves by the Fourier transform method', J PHYS D, 31(22), 1998, pp. 3323-3324
X-ray phase-amplitude contrast mapping of single-crystal alloys near the absorption edge of the alloy impurity
Authors: Nikulin, AY Davis, JR Jones, NT Zaumseil, P
Citation: Ay. Nikulin et al., X-ray phase-amplitude contrast mapping of single-crystal alloys near the absorption edge of the alloy impurity, J APPL PHYS, 84(9), 1998, pp. 4815-4821
Phase-retrieval X-ray diffractometry: a tool for unambiguous characterization of crystalline materials
Authors: Nikulin, AY
Citation: Ay. Nikulin, Phase-retrieval X-ray diffractometry: a tool for unambiguous characterization of crystalline materials, RRD APP PHY, 1, 1998, pp. 1-21
Risultati: 1-12 |