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Pavlidis, D
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Authors:
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Chini, A
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Citation: D. Buttari et al., Measurements of the InGaAs hole impact ionization coefficient in InAlAs/InGaAs pnp HBTs, IEEE ELEC D, 22(5), 2001, pp. 197-199
Authors:
Park, JW
Pavlidis, D
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Citation: Jw. Park et al., Improved emitter transit time using AlGaAs-GaInP composite emitter in GaInP/GaAs heterojunction bipolar transistors, IEEE DEVICE, 48(7), 2001, pp. 1297-1303
Authors:
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Hubbard, SM
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Pavlidis, D
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Citation: S. Mohammadi et al., Photo-luminescence and transmission electron microscope studies of low- and high-reliability AlGaAs/GaAs HBTs, SOL ST ELEC, 44(4), 2000, pp. 739-746
Citation: E. Alekseev et D. Pavlidis, DC and high-frequency performance of AlGaN/GaN Heterojunction Bipolar Transistors, SOL ST ELEC, 44(2), 2000, pp. 245-252
Authors:
Park, JW
Mohammadi, S
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Citation: Jw. Park et al., Monolithic broadband transimpedance amplifiers and their high frequency small and large signal characteristics using CBE-based GaInP/GaAs HBT technology, SOL ST ELEC, 44(11), 2000, pp. 2059-2067
Citation: Jw. Park et al., Impact of Ni/Ge/Au/Ti/Au and Ti/Pt/Au collector metal on GaInP/GaAs HBT characteristics, SOL ST ELEC, 44(10), 2000, pp. 1847-1852
Authors:
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Alekseev, E
Pavlidis, D
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Citation: T. Hashizume et al., Capacitance-voltage characterization of AlN/GaN metal-insulator-semiconductor structures grown on sapphire substrate by metalorganic chemical vapor deposition, J APPL PHYS, 88(4), 2000, pp. 1983-1986
Authors:
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Park, JW
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Citation: S. Mohammadi et al., Design optimization and characterization of high-gain GaInP/GaAs HBT distributed amplifiers for high-bit-rate telecommunication, IEEE MICR T, 48(6), 2000, pp. 1038-1044
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Citation: S. Mohammadi et al., Relation between low-frequency noise and long-term reliability of single AlGaAs/GaAs power HBT's, IEEE DEVICE, 47(4), 2000, pp. 677-686
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Authors:
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Tiginyanu, IM
Hildebrandt, R
Marowsky, G
Pavlidis, D
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Hartnagel, HL
Citation: Iv. Kravetsky et al., Nonlinear optical response of GaN layers on sapphire: The impact of fundamental beam interference, APPL PHYS L, 76(7), 2000, pp. 810-812
Authors:
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Citation: Iv. Kravetsky et al., Nonlinear optical response of GaN layers on sapphire: The impact of fundamental beam interference (vol 76, pg 810, 2000), APPL PHYS L, 76(11), 2000, pp. 1479-1479
Authors:
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Pavlidis, D
Citation: S. Krawczyk et al., New scanning photoluminescence technique for quantitative mapping the surface recombination velocity in InP and related materials, JPN J A P 1, 38(2B), 1999, pp. 992-995
Authors:
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Citation: H. Morkoc et al., Spontaneous polarization and piezoelectric field in nitride semiconductor heterostructures, J KOR PHYS, 34, 1999, pp. S224-S233
Authors:
Pavlidis, D
Ishibashi, T
Mizutani, T
Bayraktaroglu, B
Citation: D. Pavlidis et al., Special Issue - Proceedings of the Topical Workshop on Heterostructure Microelectronics - Shonan Village Center, Hayama-Machi, Kanagawa, Japan - 30thAugust-2nd September, 1998 - Preface to special issue, SOL ST ELEC, 43(8), 1999, pp. 1321-1321
Citation: Ssh. Hsu et al., Comparison of conventional and thermally-stable cascode (TSC) AlGaAs/GaAs HBTs for microwave power applications, SOL ST ELEC, 43(8), 1999, pp. 1429-1436