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Results: 1-24 |
Results: 24
SYNTHESIS OF INDIVIDUAL SINGLE-WALLED CARBON NANOTUBES ON PATTERNED SILICON-WAFERS
Authors: KONG J SOH HT CASSELL AM QUATE CF DAI HJ
Citation: J. Kong et al., SYNTHESIS OF INDIVIDUAL SINGLE-WALLED CARBON NANOTUBES ON PATTERNED SILICON-WAFERS, Nature, 395(6705), 1998, pp. 878-881
ANALYSIS AND DESIGN OF AN INTERDIGITAL CANTILEVER AS A DISPLACEMENT SENSOR
Authors: YARALIOGLU GG ATALAR A MANALIS SR QUATE CF
Citation: Gg. Yaralioglu et al., ANALYSIS AND DESIGN OF AN INTERDIGITAL CANTILEVER AS A DISPLACEMENT SENSOR, Journal of applied physics, 83(12), 1998, pp. 7405-7415
NONCONTACT NANOLITHOGRAPHY USING THE ATOMIC-FORCE MICROSCOPE
Authors: WILDER K QUATE CF ADDERTON D BERNSTEIN R ELINGS V
Citation: K. Wilder et al., NONCONTACT NANOLITHOGRAPHY USING THE ATOMIC-FORCE MICROSCOPE, Applied physics letters, 73(17), 1998, pp. 2527-2529
CENTIMETER SCALE ATOMIC-FORCE MICROSCOPE IMAGING AND LITHOGRAPHY
Authors: MINNE SC ADAMS JD YARALIOGLU G MANALIS SR ATALAR A QUATE CF
Citation: Sc. Minne et al., CENTIMETER SCALE ATOMIC-FORCE MICROSCOPE IMAGING AND LITHOGRAPHY, Applied physics letters, 73(12), 1998, pp. 1742-1744
AUTOMATED PARALLEL HIGH-SPEED ATOMIC-FORCE MICROSCOPY
Authors: MINNE SC YARALIOGLU G MANALIS SR ADAMS JD ZESCH J ATALAR A QUATE CF
Citation: Sc. Minne et al., AUTOMATED PARALLEL HIGH-SPEED ATOMIC-FORCE MICROSCOPY, Applied physics letters, 72(18), 1998, pp. 2340-2342
HYBRID ATOMIC-FORCE SCANNING TUNNELING LITHOGRAPHY
Authors: WILDER K SOH HT ATALAR A QUATE CF
Citation: K. Wilder et al., HYBRID ATOMIC-FORCE SCANNING TUNNELING LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(5), 1997, pp. 1811-1817
SCANNING PROBES AS A LITHOGRAPHY TOOL FOR NANOSTRUCTURES
Authors: QUATE CF
Citation: Cf. Quate, SCANNING PROBES AS A LITHOGRAPHY TOOL FOR NANOSTRUCTURES, Surface science, 386(1-3), 1997, pp. 259-264
2-DIMENSIONAL MICROMECHANICAL BIMORPH ARRAYS FOR DETECTION OF THERMAL-RADIATION
Authors: MANALIS SR MINNE SC QUATE CF YARALIOGLU GG ATALAR A
Citation: Sr. Manalis et al., 2-DIMENSIONAL MICROMECHANICAL BIMORPH ARRAYS FOR DETECTION OF THERMAL-RADIATION, Applied physics letters, 70(24), 1997, pp. 3311-3313
ATOMIC-FORCE MICROSCOPY FOR CROSS-SECTION INSPECTION AND METROLOGY
Authors: WILDER K QUATE CF SINGH B ALVIS R ARNOLD WH
Citation: K. Wilder et al., ATOMIC-FORCE MICROSCOPY FOR CROSS-SECTION INSPECTION AND METROLOGY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 4004-4008
INDEPENDENT PARALLEL LITHOGRAPHY USING THE ATOMIC-FORCE MICROSCOPE
Authors: MINNE SC MANALIS SR ATALAR A QUATE CF
Citation: Sc. Minne et al., INDEPENDENT PARALLEL LITHOGRAPHY USING THE ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2456-2461
HIGH-SPEED ATOMIC-FORCE MICROSCOPY USING AN INTEGRATED ACTUATOR AND OPTICAL-LEVER DETECTION
Authors: MANALIS SR MINNE SC ATALAR A QUATE CF
Citation: Sr. Manalis et al., HIGH-SPEED ATOMIC-FORCE MICROSCOPY USING AN INTEGRATED ACTUATOR AND OPTICAL-LEVER DETECTION, Review of scientific instruments, 67(9), 1996, pp. 3294-3297
INTERDIGITAL CANTILEVERS FOR ATOMIC-FORCE MICROSCOPY
Authors: MANALIS SR MINNE SC ATALAR A QUATE CF
Citation: Sr. Manalis et al., INTERDIGITAL CANTILEVERS FOR ATOMIC-FORCE MICROSCOPY, Applied physics letters, 69(25), 1996, pp. 3944-3946
SILICON MICROMACHINED ULTRASONIC IMMERSION TRANSDUCERS
Authors: SOH HT LADABAUM I ATALAR A QUATE CF KHURIYAKUB BT
Citation: Ht. Soh et al., SILICON MICROMACHINED ULTRASONIC IMMERSION TRANSDUCERS, Applied physics letters, 69(24), 1996, pp. 3674-3676
ATOMIC-FORCE MICROSCOPY FOR HIGH-SPEED IMAGING USING CANTILEVERS WITHAN INTEGRATED ACTUATOR AND SENSOR
Authors: MANALIS SR MINNE SC QUATE CF
Citation: Sr. Manalis et al., ATOMIC-FORCE MICROSCOPY FOR HIGH-SPEED IMAGING USING CANTILEVERS WITHAN INTEGRATED ACTUATOR AND SENSOR, Applied physics letters, 68(6), 1996, pp. 871-873
CONTACT IMAGING IN THE ATOMIC-FORCE MICROSCOPE USING A HIGHER-ORDER FLEXURAL MODE COMBINED WITH A NEW SENSOR
Authors: MINNE SC MANALIS SR ATALAR A QUATE CF
Citation: Sc. Minne et al., CONTACT IMAGING IN THE ATOMIC-FORCE MICROSCOPE USING A HIGHER-ORDER FLEXURAL MODE COMBINED WITH A NEW SENSOR, Applied physics letters, 68(10), 1996, pp. 1427-1429
ATOMIC-FORCE MICROSCOPE LITHOGRAPHY USING AMORPHOUS-SILICON AS A RESIST AND ADVANCES IN PARALLEL OPERATION
Authors: MINNE SC FLUECKIGER P SOH HT QUATE CF
Citation: Sc. Minne et al., ATOMIC-FORCE MICROSCOPE LITHOGRAPHY USING AMORPHOUS-SILICON AS A RESIST AND ADVANCES IN PARALLEL OPERATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1380-1385
THE LOCAL LABORATORY
Authors: QUATE CF
Citation: Cf. Quate, THE LOCAL LABORATORY, Optoelectronics, 10(2), 1995, pp. 286-290
PARALLEL ATOMIC-FORCE MICROSCOPY USING CANTILEVERS WITH INTEGRATED PIEZORESISTIVE SENSORS AND INTEGRATED PIEZOELECTRIC ACTUATORS
Authors: MINNE SC MANALIS SR QUATE CF
Citation: Sc. Minne et al., PARALLEL ATOMIC-FORCE MICROSCOPY USING CANTILEVERS WITH INTEGRATED PIEZORESISTIVE SENSORS AND INTEGRATED PIEZOELECTRIC ACTUATORS, Applied physics letters, 67(26), 1995, pp. 3918-3920
NANOMETER-SCALE LITHOGRAPHY AT HIGH SCANNING SPEEDS WITH THE ATOMIC-FORCE MICROSCOPE USING SPIN ON GLASS
Authors: PARK SW SOH HT QUATE CF PARK SI
Citation: Sw. Park et al., NANOMETER-SCALE LITHOGRAPHY AT HIGH SCANNING SPEEDS WITH THE ATOMIC-FORCE MICROSCOPE USING SPIN ON GLASS, Applied physics letters, 67(16), 1995, pp. 2415-2417
FABRICATION OF 0.1-MU-M METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS WITH THE ATOMIC-FORCE MICROSCOPE
Authors: MINNE SC SOH HT FLUECKIGER P QUATE CF
Citation: Sc. Minne et al., FABRICATION OF 0.1-MU-M METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS WITH THE ATOMIC-FORCE MICROSCOPE, Applied physics letters, 66(6), 1995, pp. 703-705
BEHAVIOR OF TELLURIUM ON SILICON(100)
Authors: YOSHIKAWA SA NOGAMI J QUATE CF PIANETTA P
Citation: Sa. Yoshikawa et al., BEHAVIOR OF TELLURIUM ON SILICON(100), Surface science, 321(3), 1994, pp. 183-188
THE AFM AS A TOOL FOR SURFACE IMAGING
Authors: QUATE CF
Citation: Cf. Quate, THE AFM AS A TOOL FOR SURFACE IMAGING, Surface science, 300(1-3), 1994, pp. 980-995
BI ON SI(111) - 2 PHASES OF THE ROOT-3X-ROOT-3 SURFACE RECONSTRUCTION
Authors: SHIODA R KAWAZU A BASKI AA QUATE CF NOGAMI J
Citation: R. Shioda et al., BI ON SI(111) - 2 PHASES OF THE ROOT-3X-ROOT-3 SURFACE RECONSTRUCTION, Physical review. B, Condensed matter, 48(7), 1993, pp. 4895-4898
ADSORPTION-SITE DETERMINATION OF ORDERED YB ON SI(111) SURFACES
Authors: WIGREN C ANDERSEN JN NYHOLM R KARLSSON UO NOGAMI J BASKI AA QUATE CF
Citation: C. Wigren et al., ADSORPTION-SITE DETERMINATION OF ORDERED YB ON SI(111) SURFACES, Physical review. B, Condensed matter, 47(15), 1993, pp. 9663-9668
Risultati: 1-24 |