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Results: 1-13 |
Results: 13
Software-controlled processor speed setting for low-power streaming multimedia
Authors: Acquaviva, A Benini, L Ricco, B
Citation: A. Acquaviva et al., Software-controlled processor speed setting for low-power streaming multimedia, IEEE COMP A, 20(11), 2001, pp. 1283-1292
Optimized programming of multilevel flash EEPROMs
Authors: Versari, R Esseni, D Falavigna, G Lanzoni, M Ricco, B
Citation: R. Versari et al., Optimized programming of multilevel flash EEPROMs, IEEE DEVICE, 48(8), 2001, pp. 1641-1646
Bandwidth optimization of flash memories with the RGP technique
Authors: Versari, R Esseni, D Falavigna, G Lanzoni, M Ricco, B
Citation: R. Versari et al., Bandwidth optimization of flash memories with the RGP technique, IEEE DEVICE, 48(8), 2001, pp. 1737-1740
Fast programming/erasing of thin-oxide EEPROMs
Authors: Versari, R Pieracci, A Ricco, B
Citation: R. Versari et al., Fast programming/erasing of thin-oxide EEPROMs, IEEE DEVICE, 48(4), 2001, pp. 817-819
Signal coding and CMOS gates for combinational functional blocks of very deep submicron self-checking circuits
Authors: Metra, C Favalli, M Ricco, B
Citation: C. Metra et al., Signal coding and CMOS gates for combinational functional blocks of very deep submicron self-checking circuits, VLSI DESIGN, 11(1), 2000, pp. 23-34
Fast tunneling programming of nonvolatile memories
Authors: Versari, R Pieracci, A Morigi, D Ricco, B
Citation: R. Versari et al., Fast tunneling programming of nonvolatile memories, IEEE DEVICE, 47(6), 2000, pp. 1297-1299
On the origin of the dispersion of erased threshold voltages in flash EEPROM memory cells
Authors: Esseni, D Ricco, B
Citation: D. Esseni et B. Ricco, On the origin of the dispersion of erased threshold voltages in flash EEPROM memory cells, IEEE DEVICE, 47(5), 2000, pp. 1120-1123
Trading-off programming speed and current absorption in flash memories with the ramped-gate programming technique
Authors: Esseni, D Villa, C Tassan, S Ricco, B
Citation: D. Esseni et al., Trading-off programming speed and current absorption in flash memories with the ramped-gate programming technique, IEEE DEVICE, 47(4), 2000, pp. 828-834
Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines
Authors: Metra, C Favalli, M Ricco, B
Citation: C. Metra et al., Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines, IEEE COMPUT, 49(6), 2000, pp. 560-574
Tunneling bursts for negligible SILC degradation
Authors: Ricco, B Pieracci, A
Citation: B. Ricco et A. Pieracci, Tunneling bursts for negligible SILC degradation, IEEE DEVICE, 46(7), 1999, pp. 1497-1500
MOSFET's negative transconductance at room temperature
Authors: Versari, R Ricco, B
Citation: R. Versari et B. Ricco, MOSFET's negative transconductance at room temperature, IEEE DEVICE, 46(6), 1999, pp. 1189-1195
A new and flexible scheme for hot-electron programming of nonvolatile memory cells
Authors: Esseni, D Della Strada, A Cappelletti, P Ricco, B
Citation: D. Esseni et al., A new and flexible scheme for hot-electron programming of nonvolatile memory cells, IEEE DEVICE, 46(1), 1999, pp. 125-133
Nonvolatile multilevel memories for digital applications
Authors: Ricco, B Torelli, G Lanzoni, M Manstretta, A Maes, HE Montanari, D Modelli, A
Citation: B. Ricco et al., Nonvolatile multilevel memories for digital applications, P IEEE, 86(12), 1998, pp. 2399-2421
Risultati: 1-13 |