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Charbonnier, M
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Citation: M. Charbonnier et al., Surface plasma functionalization of polycarbonate: Application to electroless nickel and copper plating, J APPL ELEC, 31(1), 2001, pp. 57-63
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Vermorel, F
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Citation: F. Vermorel et al., Emission characterization and X-ray diffraction analysis of flow-acceleration corrosion of steels in secondary circuits of pressurized water reactors, J PHYS IV, 10(P10), 2000, pp. 313-322
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Esrom, H
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Authors:
Crunteanu, A
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Citation: A. Crunteanu et al., Synthesis and characterization of carbon nitride thin films obtained by laser induced chemical vapour deposition, SURF COAT, 125(1-3), 2000, pp. 301-307
Authors:
Crunteanu, A
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Citation: A. Crunteanu et al., Structural and vibrational characterization of hydrogenated carbon nitridethin films obtained by laser-induced CVD, APPL SURF S, 168(1-4), 2000, pp. 44-47
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Citation: Jp. Joly et al., Temperature-programmed desorption (TPD) of water from iron, chromium, nickel and 304L stainless steel, VACUUM, 59(4), 2000, pp. 854-867
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Citation: F. Gaillard et al., FT-IR and temperature-programmed desorption (TPD) study of the adsorption of probe molecules used to model epoxy resin adhesion to chromium, iron andstainless steel substrates, J ADHESION, 72(3-4), 2000, pp. 317-334
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Crunteanu, A
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Romand, M
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Citation: A. Crunteanu et al., Synthesis and characterization of CN thin films by IR laser deposition in a flow reactor, J PHYS IV, 9(P8), 1999, pp. 419-424
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Citation: I. Linossier et al., A spectroscopic technique for studies of water transport along the interface and hydrolytic stability of polymer/substrate systems, J ADHESION, 70(3-4), 1999, pp. 221-239
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Love, BJ
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Romand, M
Citation: Bj. Love et al., Surface chemical characterization of copper oxide and its relationship to adhesion in formed epoxy/copper interfaces, J ADHESION, 69(1-2), 1999, pp. 165-179
Citation: N. Bahlawane et al., Impact of X-ray fluorescence spectrometry and low-energy electron-induced X-ray spectrometry on the analysis of plasma-assisted chemical vapor deposition of silica on steel, J PHYS IV, 8(P5), 1998, pp. 271-278
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