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Results: 1-25 | 26-40
Results: 1-25/40
ANALYSIS OF THE TRANSPORT-PROPERTIES OF EPITAXIAL FE AND CR FILMS
Authors: SCHAD R BELIEN P VERBANCK G MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: R. Schad et al., ANALYSIS OF THE TRANSPORT-PROPERTIES OF EPITAXIAL FE AND CR FILMS, Journal of physics. Condensed matter, 10(30), 1998, pp. 6643-6650
QUANTITATIVE-ANALYSIS OF SCANNING TUNNELING MICROSCOPE IMAGES OF FE GROWN EPITAXIALLY ON MGO(001) USING LENGTH-DEPENDENT VARIANCE MEASUREMENTS
Authors: JORDAN SM SCHAD R LAWLER JF HERRMANN DJL VANKEMPEN H
Citation: Sm. Jordan et al., QUANTITATIVE-ANALYSIS OF SCANNING TUNNELING MICROSCOPE IMAGES OF FE GROWN EPITAXIALLY ON MGO(001) USING LENGTH-DEPENDENT VARIANCE MEASUREMENTS, Journal of physics. Condensed matter, 10(21), 1998, pp. 355-358
STRUCTURAL-ANALYSIS OF FE CR SUPERLATTICES AND THEIR COMPONENTS/
Authors: SCHAD R BAHR D FALTA J BELIEN P BRUYNSERAEDE Y
Citation: R. Schad et al., STRUCTURAL-ANALYSIS OF FE CR SUPERLATTICES AND THEIR COMPONENTS/, Journal of physics. Condensed matter, 10(1), 1998, pp. 61-66
QUANTITATIVE INTERFACE ROUGHNESS ANALYSIS OF FE CR SUPERLATTICES/
Authors: SCHAD R BELIEN P VERBANCK G TEMST K MOSHCHALKOV VV BRUYNSERAEDE Y FISCHER H LEFEBVRE S BESSIERE M BAHR D FALTA J DEKOSTER J LANGOUCHE G
Citation: R. Schad et al., QUANTITATIVE INTERFACE ROUGHNESS ANALYSIS OF FE CR SUPERLATTICES/, Superlattices and microstructures, 24(3), 1998, pp. 239-247
APPLICATIONS OF SCANNING-TUNNELING-MICROSCOPY TO SOLID-STATE PHYSICS
Authors: VANKEMPEN H BOON EJG VANDERWIELEN MCMM WILDOER JWG PRINS MWJ JANSEN R SCHAD R
Citation: H. Vankempen et al., APPLICATIONS OF SCANNING-TUNNELING-MICROSCOPY TO SOLID-STATE PHYSICS, Acta Physica Polonica. A, 93(2), 1998, pp. 323-331
BLUFFING SIMULATORS - REPLY
Authors: SCHAD R
Citation: R. Schad, BLUFFING SIMULATORS - REPLY, Chemical engineering progress, 94(3), 1998, pp. 9-9
ELECTRIC TRANSPORT-PROPERTIES OF EPITAXIAL FE AND CR FILMS WITH VERY-LOW INTRALAYER SCATTERING
Authors: SCHAD R BELIEN P VERBANCK G POTTER CD TEMST K MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: R. Schad et al., ELECTRIC TRANSPORT-PROPERTIES OF EPITAXIAL FE AND CR FILMS WITH VERY-LOW INTRALAYER SCATTERING, Journal of magnetism and magnetic materials, 182(1-2), 1998, pp. 65-70
GIANT MAGNETORESISTANCE IN FE CR SUPERLATTICES WITHOUT BULK SCATTERING/
Authors: SCHAD R BELIEN P VERBANCK G TEMST K MOSHCHALKOV VV BRUYNSERAEDE Y BAHR D FALTA J DEKOSTER J LANGOUCHE G
Citation: R. Schad et al., GIANT MAGNETORESISTANCE IN FE CR SUPERLATTICES WITHOUT BULK SCATTERING/, Europhysics letters (Print), 44(3), 1998, pp. 379-385
QUANTITATIVE STUDY OF THE INTERDEPENDENCE OF INTERFACE STRUCTURE AND GIANT MAGNETORESISTANCE IN POLYCRYSTALLINE FE CR SUPERLATTICES/
Authors: SCHAD R BELIEN P VERBANCK G POTTER CD FISCHER H LEFEBVRE S BESSIERE M MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: R. Schad et al., QUANTITATIVE STUDY OF THE INTERDEPENDENCE OF INTERFACE STRUCTURE AND GIANT MAGNETORESISTANCE IN POLYCRYSTALLINE FE CR SUPERLATTICES/, Physical review. B, Condensed matter, 57(21), 1998, pp. 13692-13697
COUPLING PHENOMENA IN SUPERCONDUCTING NB FE MULTILAYERS/
Authors: VERBANCK G POTTER CD METLUSHKO V SCHAD R MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: G. Verbanck et al., COUPLING PHENOMENA IN SUPERCONDUCTING NB FE MULTILAYERS/, Physical review. B, Condensed matter, 57(10), 1998, pp. 6029-6035
GROWTH TEMPERATURE-DEPENDENCE OF THE MAGNETIC AND STRUCTURAL-PROPERTIES OF EPITAXIAL FE LAYERS ON MGO(001)
Authors: JORDAN SM LAWLER JF SCHAD R VANKEMPEN H
Citation: Sm. Jordan et al., GROWTH TEMPERATURE-DEPENDENCE OF THE MAGNETIC AND STRUCTURAL-PROPERTIES OF EPITAXIAL FE LAYERS ON MGO(001), Journal of applied physics, 84(3), 1998, pp. 1499-1503
WAVELENGTH DEPENDENCE OF THE MAGNETIC RESOLUTION OF THE MAGNETOOPTICAL NEAR-FIELD SCANNING TUNNELING MICROSCOPE
Authors: SCHAD R JORDAN SM STOELINGA MJP PRINS MWJ GROENEVELD RHM VANKEMPEN H VANKESTEREN HW
Citation: R. Schad et al., WAVELENGTH DEPENDENCE OF THE MAGNETIC RESOLUTION OF THE MAGNETOOPTICAL NEAR-FIELD SCANNING TUNNELING MICROSCOPE, Applied physics letters, 73(18), 1998, pp. 2669-2671
MULTISEGMENT MAGNETORESISTIVE SENSOR-BASED ON THE GMR EFFECT
Authors: LOBOTKA P KRIVOSIK P VAVRA I DUREC M SCHAD R VERBANCK G BRUYNSERAEDE Y
Citation: P. Lobotka et al., MULTISEGMENT MAGNETORESISTIVE SENSOR-BASED ON THE GMR EFFECT, Sensors and actuators. A, Physical, 61(1-3), 1997, pp. 323-326
STRUCTURAL AND MAGNETIC-PROPERTIES OF FE CR AND FE/AG MULTILAYERS/
Authors: TEMST K VERBANCK G SCHAD R GLADYSZEWSKI G HENNION M
Citation: K. Temst et al., STRUCTURAL AND MAGNETIC-PROPERTIES OF FE CR AND FE/AG MULTILAYERS/, Physica. B, Condensed matter, 234, 1997, pp. 467-469
STRUCTURE OF EPITAXIAL FE FILMS ON MGO(100)
Authors: LAWLER JF SCHAD R JORDAN S VANKEMPEN H
Citation: Jf. Lawler et al., STRUCTURE OF EPITAXIAL FE FILMS ON MGO(100), Journal of magnetism and magnetic materials, 165(1-3), 1997, pp. 224-226
GROWTH OF CR ON AG(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY
Authors: QUINN AJ LAWLER JF SCHAD R VANKEMPEN H
Citation: Aj. Quinn et al., GROWTH OF CR ON AG(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 385(2-3), 1997, pp. 395-401
ELECTRICAL-RESISTIVITY BEHAVIOR OF FE CR MULTILAYERS DEPOSITED BY DIFFERENT TECHNIQUES (MOLECULAR-BEAM EPITAXY, SPUTTERING), ON DIFFERENT SUBSTRATES (MGO,SI)/
Authors: ALMEIDA BG AMARAL VS SOUSA JB COLINO J SCHULLER IK SCHAD R MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: Bg. Almeida et al., ELECTRICAL-RESISTIVITY BEHAVIOR OF FE CR MULTILAYERS DEPOSITED BY DIFFERENT TECHNIQUES (MOLECULAR-BEAM EPITAXY, SPUTTERING), ON DIFFERENT SUBSTRATES (MGO,SI)/, Journal of applied physics, 81(8), 1997, pp. 5194-5196
LARGE POSITIVE MAGNETORESISTANCE IN CR AG/CR TRILAYERS/
Authors: VERBANCK G TEMST K MAE K SCHAD R VANBAEL MJ MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: G. Verbanck et al., LARGE POSITIVE MAGNETORESISTANCE IN CR AG/CR TRILAYERS/, Applied physics letters, 70(11), 1997, pp. 1477-1479
SCANNING TUNNELING MICROSCOPE FOR MAGNETOOPTICAL IMAGING
Authors: PRINS MWJ GROENEVELD RHM ABRAHAM DL SCHAD R VANKEMPEN H VANKESTEREN HW
Citation: Mwj. Prins et al., SCANNING TUNNELING MICROSCOPE FOR MAGNETOOPTICAL IMAGING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1206-1209
PHONON-ASSISTED SD ELECTRON-SCATTERING IN FE CR MULTILAYERS/
Authors: ALMEIDA BG SOUSA JB SCHAD R MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: Bg. Almeida et al., PHONON-ASSISTED SD ELECTRON-SCATTERING IN FE CR MULTILAYERS/, Journal of magnetism and magnetic materials, 158, 1996, pp. 730-732
EFFECT OF ANNEALING ON THE ROUGHNESS AND GMR OF FE CR MULTILAYERS/
Authors: LAIDLER H HICKEY BJ HASE TPA TANNER BK SCHAD R BRUYNSERAEDE Y
Citation: H. Laidler et al., EFFECT OF ANNEALING ON THE ROUGHNESS AND GMR OF FE CR MULTILAYERS/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 332-334
INFLUENCE OF DIFFERENT KINDS OF INTERFACE ROUGHNESS ON THE GIANT MAGNETORESISTANCE IN FE CR SUPERLATTICES/
Authors: SCHAD R BARNAS J BELIEN P VERBANCK G POTTER CD FISCHER H LEFEBVRE S BESSIERE M MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: R. Schad et al., INFLUENCE OF DIFFERENT KINDS OF INTERFACE ROUGHNESS ON THE GIANT MAGNETORESISTANCE IN FE CR SUPERLATTICES/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 339-340
ON THE FE THICKNESS DEPENDENCE OF THE GIANT MAGNETORESISTANCE IN EPITAXIAL FE CR SUPERLATTICES/
Authors: SCHAD R BELIEN P BARNAS J VERBANCK G POTTER CD GLADYSZEWSKI G MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: R. Schad et al., ON THE FE THICKNESS DEPENDENCE OF THE GIANT MAGNETORESISTANCE IN EPITAXIAL FE CR SUPERLATTICES/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 341-342
MODIFICATION OF STRUCTURE, ELECTRIC AND MAGNETIC-PROPERTIES OF EPITAXIALLY GROWN AG(001) FE(001) SUPERLATTICES/
Authors: GLADYSZEWSKI G BARNAS J TEMST K VERBANCK G SCHAD R BELIEN P KUNNEN E BODART F BRUYNSERAEDE Y
Citation: G. Gladyszewski et al., MODIFICATION OF STRUCTURE, ELECTRIC AND MAGNETIC-PROPERTIES OF EPITAXIALLY GROWN AG(001) FE(001) SUPERLATTICES/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 381-382
S-D ELECTRON-SCATTERING AS A SENSITIVE PROBE TO STUDY FE CR MULTILAYER STRUCTURAL DIFFERENCES (MBE/SPUTTERED SAMPLES)/
Authors: ALMEIDA BG SOUSA JB COLINO J SCHULLER Y SCHAD R MOSHCHALKOV VV BRUYNSERAEDE Y
Citation: Bg. Almeida et al., S-D ELECTRON-SCATTERING AS A SENSITIVE PROBE TO STUDY FE CR MULTILAYER STRUCTURAL DIFFERENCES (MBE/SPUTTERED SAMPLES)/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 399-401
Risultati: 1-25 | 26-40