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Results: 1-25/33
Authors:
SEAH MP
BROWN MT
Citation: Mp. Seah et Mt. Brown, VALIDATION AND ACCURACY OF SOFTWARE FOR PEAK SYNTHESIS IN XPS, Journal of electron spectroscopy and related phenomena, 95(1), 1998, pp. 71-93
Authors:
SEAH MP
GILMORE IS
SPENCER SJ
Citation: Mp. Seah et al., XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 4 - ASSESSMENT OF EFFECTS FOR DIFFERENT X-RAY SOURCES, ANALYZER RESOLUTIONS, ANGLES OF EMISSION AND OVERALL UNCERTAINTIES, Surface and interface analysis, 26(9), 1998, pp. 617-641
Authors:
SEAH MP
GILMORE LS
BEAMSON G
Citation: Mp. Seah et al., XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 5 - REEVALUATION OF THE REFERENCE ENERGIES, Surface and interface analysis, 26(9), 1998, pp. 642-649
Authors:
SEAH MP
GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES - VIII - ANALYSIS OF AUGER-ELECTRON INTENSITIES FROMELEMENTAL DATA IN A DIGITAL AUGER DATABASE, Surface and interface analysis, 26(12), 1998, pp. 908-929
Authors:
SEAH MP
GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES-VII - THE IONIZATION CROSS-SECTION IN AES, Surface and interface analysis, 26(11), 1998, pp. 815-824
Authors:
SEAH MP
GILMORE IS
BISHOP HE
LORANG G
Citation: Mp. Seah et al., QUANTITATIVE AES - V - PRACTICAL ANALYSIS OF INTENSITIES WITH DETAILED EXAMPLES OF METALS AND THEIR OXIDES, Surface and interface analysis, 26(10), 1998, pp. 701-722
Authors:
SEAH MP
GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES - VI - BACKSCATTERING AND BACKGROUNDS - AN ANALYSIS OF ELEMENTAL SYSTEMATICS AND CORRECTIONS OF ABSOLUTE INTENSITY, Surface and interface analysis, 26(10), 1998, pp. 723-735
Authors:
SEAH MP
Citation: Mp. Seah, SURFACE CHEMICAL-ANALYSIS - COMPARING AND EXCHANGING DATA, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 485-492
Authors:
SEAH MP
SPENCER SJ
BODINO F
PIREAUX JJ
Citation: Mp. Seah et al., THE ALIGNMENT OF SPECTROMETERS AND QUANTITATIVE MEASUREMENTS IN X-RAYPHOTOELECTRON-SPECTROSCOPY, Journal of electron spectroscopy and related phenomena, 87(2), 1997, pp. 159-167
Authors:
SEAH MP
GILMORE IS
Citation: Mp. Seah et Is. Gilmore, AES - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .3. GENERAL CALIBRATION, Journal of electron spectroscopy and related phenomena, 83(2-3), 1997, pp. 197-208
Authors:
CUMPSON PJ
SEAH MP
Citation: Pj. Cumpson et Mp. Seah, ELASTIC-SCATTERING CORRECTIONS IN AES AND XPS .2. ESTIMATING ATTENUATION LENGTHS AND CONDITIONS REQUIRED FOR THEIR VALID USE IN OVERLAYER SUBSTRATE EXPERIMENTS/, Surface and interface analysis, 25(6), 1997, pp. 430-446
Authors:
SEAH MP
Citation: Mp. Seah, STANDARDS FOR SURFACE-ANALYSIS - A CLASH BETWEEN BUREAUCRACY AND SCIENCE, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 354(1719), 1996, pp. 2765-2780
Authors:
SEAH MP
GILMORE IS
Citation: Mp. Seah et Is. Gilmore, HIGH-RESOLUTION DIGITAL AUGER DATABASE OF TRUE SPECTRA FOR AUGER-ELECTRON SPECTROSCOPY INTENSITIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1401-1407
Authors:
GILMORE IS
SEAH MP
Citation: Is. Gilmore et Mp. Seah, SAVITZKY AND GOLAY DIFFERENTIATION IN AES, Applied surface science, 93(3), 1996, pp. 273-280
Authors:
SEAH MP
Citation: Mp. Seah, QUANTITATIVE AES .4. ACCURACY OF THE NUMERICAL EVALUATION OF PEAK AREAS IN AES USING THE UNIVERSAL TOUGAARD BACKGROUND SUBTRACTION METHOD, Surface and interface analysis, 24(12), 1996, pp. 830-838
Authors:
GILMORE IS
SEAH MP
Citation: Is. Gilmore et Mp. Seah, STATIC SIMS - A STUDY OF DAMAGE USING POLYMERS, Surface and interface analysis, 24(11), 1996, pp. 746-762
Authors:
CUMPSON PJ
SEAH MP
SPENCER SJ
Citation: Pj. Cumpson et al., SIMPLE PROCEDURE FOR PRECISE PEAK MAXIMUM ESTIMATION FOR ENERGY CALIBRATION IN AES AND XPS, Surface and interface analysis, 24(10), 1996, pp. 687-694
Authors:
CUMPSON PJ
SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .4. GROWTH OF CARBONACEOUS CONTAMINATION ON PLATINUM-IRIDIUM ALLOY SURFACES, AND CLEANING BY UV OZONE TREATMENT/, Metrologia, 33(6), 1996, pp. 507-532
Authors:
SEAH MP
Citation: Mp. Seah, A SYSTEM FOR THE INTENSITY CALIBRATION OF ELECTRON SPECTROMETERS, Journal of electron spectroscopy and related phenomena, 71(3), 1995, pp. 191-204
Authors:
GILMORE IS
SEAH MP
Citation: Is. Gilmore et Mp. Seah, STATIC SIMS - SURFACE-CHARGE STABILIZATION OF INSULATORS FOR HIGHLY REPEATABLE SPECTRA WHEN USING A QUADRUPOLE MASS-SPECTROMETER, Surface and interface analysis, 23(4), 1995, pp. 191-203
Authors:
GILMORE IS
SEAH MP
Citation: Is. Gilmore et Mp. Seah, FLUENCE, FLUX, CURRENT AND CURRENT-DENSITY MEASUREMENT IN FARADAY CUPS FOR SURFACE-ANALYSIS, Surface and interface analysis, 23(4), 1995, pp. 248-258
Authors:
SEAH MP
Citation: Mp. Seah, EFFECTIVE DEAD-TIME IN PULSE COUNTING SYSTEMS, Surface and interface analysis, 23(10), 1995, pp. 729-732
Authors:
CUMPSON PJ
SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .3. MECHANISM AND LONG-TERM EFFECTS OF MERCURY CONTAMINATION ON PLATINUM-IRIDIUM MASS STANDARDS, Metrologia, 31(5), 1995, pp. 375-388
OPTIMIZATION AND SPECIFICATION OF AUGER-ELECTRON SPECTROMETERS FOR SIGNAL-TO-NOISE RATIO PERFORMANCE
Authors:
SEAH MP
HUNT CP
Citation: Mp. Seah et Cp. Hunt, OPTIMIZATION AND SPECIFICATION OF AUGER-ELECTRON SPECTROMETERS FOR SIGNAL-TO-NOISE RATIO PERFORMANCE, Journal of electron spectroscopy and related phenomena, 67(1), 1994, pp. 151-157
Authors:
SEAH MP
Citation: Mp. Seah, NEGLECTED AND HIDDEN ERRORS IN THE QUANTIFICATION OF AUGER-ELECTRON SPECTROSCOPY - COMMENT, Surface and interface analysis, 21(8), 1994, pp. 587-589