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Results: 1-21 |
Results: 21
IMPACT OF AGING ON RADIATION HARDNESS
Authors: SHANEYFELT MR WINOKUR PS FLEETWOOD DM HASH GL SCHWANK JR SEXTON FW PEASE RL
Citation: Mr. Shaneyfelt et al., IMPACT OF AGING ON RADIATION HARDNESS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2040-2047
ROLE OF THERMAL AND FISSION NEUTRONS IN REACTOR NEUTRON-INDUCED UPSETS IN COMMERCIAL SRAMS
Authors: GRIFFIN PJ LUERA TF SEXTON FW COOPER PJ KARR SG HASH GL FULLER E
Citation: Pj. Griffin et al., ROLE OF THERMAL AND FISSION NEUTRONS IN REACTOR NEUTRON-INDUCED UPSETS IN COMMERCIAL SRAMS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2079-2086
CHARGE COLLECTION AND SEU FROM ANGLED ION STRIKES
Authors: DODD PE SHANEYFELT MR SEXTON FW
Citation: Pe. Dodd et al., CHARGE COLLECTION AND SEU FROM ANGLED ION STRIKES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2256-2265
SINGLE EVENT GATE RUPTURE IN THIN GATE OXIDES
Authors: SEXTON FW FLEETWOOD DM SHANEYFELT MR DODD PE HASH GL
Citation: Fw. Sexton et al., SINGLE EVENT GATE RUPTURE IN THIN GATE OXIDES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2345-2352
IMPACT OF TECHNOLOGY TRENDS ON SEU IN CMOS SRAMS
Authors: DODD PE SEXTON FW HASH GL SHANEYFELT MR DRAPER BL FARINO AJ FLORES RS
Citation: Pe. Dodd et al., IMPACT OF TECHNOLOGY TRENDS ON SEU IN CMOS SRAMS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2797-2804
MODELING THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET WITH TRACK STRUCTURE EFFECTS - THE HIC-UP-TS MODEL
Authors: CONNELL LW SEXTON FW MCDANIEL PJ PRINJA AK
Citation: Lw. Connell et al., MODELING THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET WITH TRACK STRUCTURE EFFECTS - THE HIC-UP-TS MODEL, IEEE transactions on nuclear science, 43(6), 1996, pp. 2814-2819
MICROBEAM STUDIES OF SINGLE-EVENT EFFECTS
Authors: SEXTON FW
Citation: Fw. Sexton, MICROBEAM STUDIES OF SINGLE-EVENT EFFECTS, IEEE transactions on nuclear science, 43(2), 1996, pp. 687-695
OPTIMIZATION OF ION-BEAM-INDUCED CHARGE MICROSCOPY FOR THE ANALYSIS OF INTEGRATED-CIRCUITS
Authors: BREESE MBH SAINT A SEXTON FW HOM KM SCHONE H DOYLE BL LAIRD JS LEGGE GJF
Citation: Mbh. Breese et al., OPTIMIZATION OF ION-BEAM-INDUCED CHARGE MICROSCOPY FOR THE ANALYSIS OF INTEGRATED-CIRCUITS, Journal of applied physics, 77(8), 1995, pp. 3734-3741
CHARGE COLLECTION IN GAAS-MESFETS FABRICATED IN SEMIINSULATING SUBSTRATES
Authors: SCHWANK JR SEXTON FW WEATHERFORD TR MCMORROW D KNUDSON AR MELINGER JS
Citation: Jr. Schwank et al., CHARGE COLLECTION IN GAAS-MESFETS FABRICATED IN SEMIINSULATING SUBSTRATES, IEEE transactions on nuclear science, 42(6), 1995, pp. 1585-1591
CRITICAL CHARGE CONCEPTS FOR CMOS SRAMS
Authors: DODD PE SEXTON FW
Citation: Pe. Dodd et Fw. Sexton, CRITICAL CHARGE CONCEPTS FOR CMOS SRAMS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1764-1771
EFFECTS OF ION DAMAGE ON IBICC AND SEU IMAGING
Authors: SEXTON FW HORN KM DOYLE BL SHANEYFELT MR MEISENHEIMER TL
Citation: Fw. Sexton et al., EFFECTS OF ION DAMAGE ON IBICC AND SEU IMAGING, IEEE transactions on nuclear science, 42(6), 1995, pp. 1940-1947
FURTHER DEVELOPMENT OF THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET - MODEL (HICUP)
Authors: CONNELL LW SEXTON FW PRINJA AK
Citation: Lw. Connell et al., FURTHER DEVELOPMENT OF THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET - MODEL (HICUP), IEEE transactions on nuclear science, 42(6), 1995, pp. 2026-2034
MODELING THE HEAVY-ION UPSET CROSS-SECTION
Authors: CONNELL LW MCDANIEL PJ PRINJA AK SEXTON FW
Citation: Lw. Connell et al., MODELING THE HEAVY-ION UPSET CROSS-SECTION, IEEE transactions on nuclear science, 42(2), 1995, pp. 73-82
RADIATION-HARDENED MICROELECTRONICS FOR SPACE APPLICATIONS
Authors: WINOKUR PS FLEETWOOD DM SEXTON FW
Citation: Ps. Winokur et al., RADIATION-HARDENED MICROELECTRONICS FOR SPACE APPLICATIONS, Radiation physics and chemistry, 43(1-2), 1994, pp. 175-190
CHARACTERIZATION OF MONOCLONAL-ANTIBODIES AGAINST NAJA-NAJA-OXIANA NEUROTOXIN-I
Authors: STILES BG SEXTON FW GUEST SB OLSON MA HACK DC
Citation: Bg. Stiles et al., CHARACTERIZATION OF MONOCLONAL-ANTIBODIES AGAINST NAJA-NAJA-OXIANA NEUROTOXIN-I, Biochemical journal, 303, 1994, pp. 163-170
3-DIMENSIONAL SIMULATION OF CHARGE COLLECTION AND MULTIPLE-BIT UPSET IN SI DEVICES
Authors: DODD PE SEXTON FW WINOKUR PS
Citation: Pe. Dodd et al., 3-DIMENSIONAL SIMULATION OF CHARGE COLLECTION AND MULTIPLE-BIT UPSET IN SI DEVICES, IEEE transactions on nuclear science, 41(6), 1994, pp. 2005-2017
PROTON IRRADIATION EFFECTS ON ADVANCED DIGITAL AND MICROWAVE III-V COMPONENTS
Authors: HASH GL SCHWANK JR SHANEYFELT MR SANDOVAL CE CONNORS MP SHERIDAN TJ SEXTON FW SLAYTON EM HEISE JA FOSTER CC
Citation: Gl. Hash et al., PROTON IRRADIATION EFFECTS ON ADVANCED DIGITAL AND MICROWAVE III-V COMPONENTS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2259-2266
HARDNESS VARIABILITY IN COMMERCIAL TECHNOLOGIES
Authors: SHANEYFELT MR WINOKUR PS MEISENHEIMER TL SEXTON FW ROESKE SB KNOLL MG
Citation: Mr. Shaneyfelt et al., HARDNESS VARIABILITY IN COMMERCIAL TECHNOLOGIES, IEEE transactions on nuclear science, 41(6), 1994, pp. 2536-2543
ION-BEAM-INDUCED CHARGE-COLLECTION IMAGING OF CMOS ICS
Authors: SEXTON FW HORN KM DOYLE BL LAIRD JS CHOLEWA M SAINT A LEGGE GJF
Citation: Fw. Sexton et al., ION-BEAM-INDUCED CHARGE-COLLECTION IMAGING OF CMOS ICS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 436-442
ION-BEAM-INDUCED CHARGE COLLECTION (IBICC) MICROSCOPY OF ICS - RELATION TO SINGLE EVENT UPSETS (SEU)
Authors: HORN KM DOYLE BL SEXTON FW LAIRD JS SAINT A CHOLEWA M LEGGE GJF
Citation: Km. Horn et al., ION-BEAM-INDUCED CHARGE COLLECTION (IBICC) MICROSCOPY OF ICS - RELATION TO SINGLE EVENT UPSETS (SEU), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 355-361
RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS
Authors: SEXTON FW HORN KM DOYLE BL LAIRD JS CHOLEWA M SAINT A LEGGE GJF
Citation: Fw. Sexton et al., RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1787-1794
Risultati: 1-21 |