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Results:
1-14
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Results: 14
Authors:
Iwamoto, Y
Shigyo, N
Kitsuki, H
Tenzou, H
Ishimoto, S
Maehata, K
Ishibashi, K
Nakamoto, T
Numajiri, M
Meigo, S
Takada, H
Citation: Y. Iwamoto et al., Measurement of neutron-production double-differential cross sections for intermediate energy pion incident reaction, J NUC SCI T, 38(6), 2001, pp. 363-369
Authors:
Kitsuki, H
Ishibashi, K
Shigyo, N
Kunieda, S
Citation: H. Kitsuki et al., Parameterization of proton-induced neutron production double differential cross section up to 3 GeV in terms of moving source model, J NUC SCI T, 38(1), 2001, pp. 1-7
Authors:
Satoh, D
Shigyo, N
Iwamoto, Y
Kitsuki, H
Ishibashi, K
Citation: D. Satoh et al., Study of neutron detection efficiencies for liquid organic scintillator upto 3 GeV, IEEE NUCL S, 48(4), 2001, pp. 1165-1167
Authors:
Miura-Mattausch, M
Suetake, M
Mattausch, HJ
Kumashiro, S
Shigyo, N
Odanaka, S
Nakayama, N
Citation: M. Miura-mattausch et al., Physical modeling of the reverse-short-channel effect for circuit simulation, IEEE DEVICE, 48(10), 2001, pp. 2449-2452
Authors:
Masuda, H
Shigyo, N
Citation: H. Masuda et N. Shigyo, Special section on statistical metrology, IEEE SEMIC, 13(4), 2000, pp. 393-394
Authors:
Shigyo, N
Wakita, N
Morishita, T
Sugawara, K
Asahi, Y
Citation: N. Shigyo et al., Technology CAD based statistical simulation of MOSFETs, SOL ST ELEC, 44(6), 2000, pp. 1001-1007
Authors:
Wakita, N
Shigyo, N
Citation: N. Wakita et N. Shigyo, Verification of overlap and fringing capacitance models for MOSFETs, SOL ST ELEC, 44(6), 2000, pp. 1105-1109
Authors:
Shigyo, N
Citation: N. Shigyo, An analysis of process fluctuation induced propagation delay variation using analytical model, SOL ST ELEC, 44(12), 2000, pp. 2183-2191
Authors:
Shigyo, N
Tanimoto, H
Enda, T
Citation: N. Shigyo et al., Mesh related problems in device simulation: Treatments of meshing noise and leakage current, SOL ST ELEC, 44(1), 2000, pp. 11-16
Authors:
Iga, K
Ishibashi, K
Shigyo, N
Maehata, K
Matsufuji, N
Nakamoto, T
Numajiri, M
Meigo, S
Takada, H
Chiba, S
Citation: K. Iga et al., Measurement of gamma-ray production double-differential cross sections for1.5 GeV pi(+) meson incidence on iron, J NUC SCI T, 37(3), 2000, pp. 211-214
Authors:
Shigyo, N
Citation: N. Shigyo, Tradeoff between interconnect capacitance and RC delay variations induced by process fluctuations, IEEE DEVICE, 47(9), 2000, pp. 1740-1744
Authors:
Shigyo, N
Tanimoto, H
Citation: N. Shigyo et H. Tanimoto, A new quantum effect model for practical device simulation, IEEE DEVICE, 47(5), 2000, pp. 1010-1012
Authors:
Meigo, S
Takada, H
Chiba, S
Nakamoto, T
Ishibashi, K
Matsufuji, N
Maehata, K
Shigyo, N
Watanabe, Y
Numajiri, M
Citation: S. Meigo et al., Measurements of neutron spectra produced from a thick lead target bombarded with 0.5-and 1.5-GeV protons, NUCL INST A, 431(3), 1999, pp. 521-530
Authors:
Shigyo, N
Hiraoka, T
Citation: N. Shigyo et T. Hiraoka, A review of narrow-channel effects for STI MOSFET's: A difference between surface- and buried-channel cases, SOL ST ELEC, 43(11), 1999, pp. 2061-2066
Risultati:
1-14
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