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Authors:
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Citation: Ia. Artioukov et al., The prospects of reflectometry and ellipsometry with Colorado State University tabletop XUV laser, J PHYS IV, 11(PR2), 2001, pp. 451-457
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Vinogradov, AV
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Citation: Jj. Rocca et al., Applications of high repetition rate tabletop soft X-ray lasers become a reality in several fields, J PHYS IV, 11(PR2), 2001, pp. 459-468
Citation: Rm. Fechtchenko et Av. Vinogradov, Polarization elements for controlling of a beam of the compact discharge X-ray laser, J PHYS IV, 11(PR2), 2001, pp. 523-526
Authors:
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Citation: Av. Andreev et al., X-ray microscopy of track membranes and biological objects in the soft- and hard-wavelength ranges, CRYSTALLO R, 46(4), 2001, pp. 596-600
Authors:
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Citation: Br. Benware et al., Generation and application of a high-average-power polarized soft-x-ray laser beam, J OPT SOC B, 18(7), 2001, pp. 1041-1045
Authors:
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Citation: Vn. Skokov et al., Self-organized criticality and 1/f-noise at interacting nonequilibrium phase transitions, PHYSICA A, 293(1-2), 2001, pp. 1-12
Authors:
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Citation: Ls. Pinchuk et al., Polarization model of strengthening of thermoplastic materials containing ultradisperse inorganic fillers, TECH PHYS, 45(2), 2000, pp. 179-183
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Citation: Ia. Artyukov et al., Focusing the beam of a compact, repetitively pulsed x-ray laser to study the interaction of radiation with metallic targets and x-ray reflectometry, QUANTUM EL, 30(4), 2000, pp. 328-332
Authors:
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Vinogradov, AV
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Citation: Ia. Artyukov et al., Imaging of filtration channels in track membranes by the Schwarzschild X-ray microscope, DOKL PHYS, 45(6), 2000, pp. 248-251
Citation: Lm. Postnikov et Av. Vinogradov, The kinetics of chemiluminescence decay in the post photooxidation of a polyamide, independence on the presence of benzophenone used as photoinitiator, POLYM SCI A, 42(5), 2000, pp. 493-496
Authors:
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Pirshin, IV
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Foster, E
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Citation: Yi. Nesterets et al., Application of the statistical dynamical theory of X-ray diffraction to calculation of the HOPG echelon-monochromator parameters, PHYS ST S-A, 179(2), 2000, pp. 311-317
Authors:
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Citation: Ia. Artioukov et al., Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser, IEEE S T QU, 5(6), 1999, pp. 1495-1501
Authors:
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Citation: Ve. Asadchikov et al., Focusing of hard X-ray radiation by layer zone plate, CRYSTALLO R, 44(4), 1999, pp. 546-553
Authors:
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Agureikin, VA
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Citation: Ia. Balagansky et al., Acceleration device based on high explosive charge which contains high modular ceramic tube, INT J IMPAC, 22(8), 1999, pp. 813-823
Citation: Lm. Postnikov et Av. Vinogradov, Recombination chemiluminescence in the post-effect of long-wavelength and short-wavelength light exposure of aliphatic polyamides, VYSO SOED, 41(4), 1999, pp. 706-710