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Results: 51-75/78
Authors:
BODE M
PASCAL R
WIESENDANGER R
Citation: M. Bode et al., IMAGING AND TUNNELING SPECTROSCOPY OF INDIVIDUAL IRON ADSORBATES AT ROOM-TEMPERATURE, Zeitschrift fur Physik. B, Condensed matter, 99(2), 1996, pp. 143-144
Authors:
LOHNDORF M
WADAS A
LUTJERING G
WEISS D
WIESENDANGER R
Citation: M. Lohndorf et al., MICROMAGNETIC PROPERTIES AND MAGNETIZATION SWITCHING OF SINGLE-DOMAINCO DOTS STUDIED BY MAGNETIC FORCE MICROSCOPY, Zeitschrift fur Physik. B, Condensed matter, 101(1), 1996, pp. 1-2
Authors:
BODE M
PASCAL R
WIESENDANGER R
Citation: M. Bode et al., DISTANCE-DEPENDENT STM-STUDY OF THE W(110) C-R(15X3) SURFACE/, Zeitschrift fur Physik. B, Condensed matter, 101(1), 1996, pp. 103-107
Authors:
HOLSCHER H
SCHWARZ UD
WIESENDANGER R
Citation: H. Holscher et al., SIMULATION OF A SCANNED TIP ON A NAF(001) SURFACE IN FRICTION FORCE MICROSCOPY, Europhysics letters, 36(1), 1996, pp. 19-24
Authors:
BODE M
PASCAL R
DREYER M
WIESENDANGER R
Citation: M. Bode et al., NANOSTRUCTURAL AND LOCAL ELECTRONIC-PROPERTIES OF FE W(110) CORRELATED BY SCANNING TUNNELING SPECTROSCOPY/, Physical review. B, Condensed matter, 54(12), 1996, pp. 8385-8388
Authors:
SEIDER M
SCHWARZ UD
WIESENDANGER R
Citation: M. Seider et al., LOAD-DEPENDENT TOPOGRAPHIC AND FRICTION STUDIES OF INDIVIDUAL ION TRACKS IN LAYERED MATERIALS BY SCANNING FORCE MICROSCOPY AND LATERAL FORCE MICROSCOPY, Physical review. B, Condensed matter, 53(24), 1996, pp. 16180-16183
Authors:
SCHWARZ UD
KOSTER P
WIESENDANGER R
Citation: Ud. Schwarz et al., QUANTITATIVE-ANALYSIS OF LATERAL FORCE MICROSCOPY EXPERIMENTS, Review of scientific instruments, 67(7), 1996, pp. 2560-2567
Authors:
LOHNDORF M
WADAS A
VANDENBERG HAM
WIESENDANGER R
Citation: M. Lohndorf et al., STRUCTURE OF CROSS-TIE WALL IN THIN CO FILMS RESOLVED BY MAGNETIC FORCE MICROSCOPY, Applied physics letters, 68(25), 1996, pp. 3635-3637
Authors:
WIESENDANGER R
Citation: R. Wiesendanger, RECENT ADVANCES IN NANOSTRUCTURAL INVESTIGATIONS AND MODIFICATIONS OFSOLID-SURFACES BY SCANNING PROBE METHODS, JPN J A P 1, 34(6B), 1995, pp. 3388-3395
Authors:
DREYER M
WIESENDANGER R
Citation: M. Dreyer et R. Wiesendanger, SCANNING CAPACITANCE MICROSCOPY AND SPECTROSCOPY APPLIED TO LOCAL CHARGE MODIFICATIONS AND CHARACTERIZATION OF NITRIDE-OXIDE-SILICON HETEROSTRUCTURES, Applied physics A: Materials science & processing, 61(4), 1995, pp. 357-362
Authors:
LOHNDORF M
WIESENDANGER R
Citation: M. Lohndorf et R. Wiesendanger, MAGNETIC FORCE MICROSCOPY STUDY OF MAGNETIC STRAY-FIELD EFFECTS DUE TO MECHANICAL SURFACE MODIFICATIONS OF PATTERNED PERMALLOY THIN-FILMS, Applied physics A: Materials science & processing, 61(1), 1995, pp. 93-97
Authors:
NEPIJKO SA
WIESENDANGER R
Citation: Sa. Nepijko et R. Wiesendanger, SIZE DEPENDENCE OF THE CURIE-TEMPERATURE OF SEPARATE NICKEL PARTICLESSTUDIED BY INTERFERENCE ELECTRON-MICROSCOPY, Europhysics letters, 31(9), 1995, pp. 567-572
Authors:
SCHWARZ UD
ALLERS W
GENSTERBLUM G
PIREAUX JJ
WIESENDANGER R
Citation: Ud. Schwarz et al., GROWTH OF C-60 THIN-FILMS ON GES(001) STUDIED BY SCANNING FORCE MICROSCOPY, Physical review. B, Condensed matter, 52(8), 1995, pp. 5967-5976
Authors:
SCHWARZ UD
ALLERS W
GENSTERBLUM G
WIESENDANGER R
Citation: Ud. Schwarz et al., LOW-LOAD FRICTION BEHAVIOR OF EPITAXIAL C-60 MONOLAYERS UNDER HERTZIAN CONTACT, Physical review. B, Condensed matter, 52(20), 1995, pp. 14976-14984
Authors:
SCHWARZ A
SCHWARZ UD
BLUHM H
WIESENDANGER R
Citation: A. Schwarz et al., DETERMINATION OF MILLER INDEXES OF SIDE FACES OF SMALL CRYSTALLITES FROM SCANNING FORCE MICROSCOPY ANGLE MEASUREMENTS, Surface and interface analysis, 23(6), 1995, pp. 409-415
Authors:
BODE M
PASCAL R
WIESENDANGER R
Citation: M. Bode et al., STM STUDY OF CARBON-INDUCED RECONSTRUCTIONS ON W(110) - STRONG EVIDENCE FOR A SURFACE LATTICE DEFORMATION, Surface science, 344(3), 1995, pp. 185-191
Authors:
WASAS A
WIESENDANGER R
NOVOTNY P
Citation: A. Wasas et al., BUBBLE DOMAINS IN GARNET-FILMS STUDIED BY MAGNETIC FORCE MICROSCOPY, Journal of applied physics, 78(10), 1995, pp. 6324-6326
Authors:
WIESENDANGER R
SHVETS IV
COEY JMD
Citation: R. Wiesendanger et al., WIGNER GLASS ON THE MAGNETITE (001) SURFACE OBSERVED BY SCANNING-TUNNELING-MICROSCOPY WITH A FERROMAGNETIC TIP, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2118-2121
Authors:
LANG HP
WIESENDANGER R
THOMMENGEISER V
HOFER R
GUNTHERODT HJ
Citation: Hp. Lang et al., LOCAL TRANSFORMATION OF C(60) FULLERITE INTO A NEW AMORPHOUS PHASE OFCARBON USING A SCANNING TUNNELING MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2136-2139
Authors:
WIESENDANGER R
Citation: R. Wiesendanger, CONTRIBUTIONS OF SCANNING PROBE MICROSCOPY AND SPECTROSCOPY TO THE INVESTIGATION AND FABRICATION OF NANOMETER-SCALE STRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 515-529
Authors:
WIESENDANGER R
Citation: R. Wiesendanger, SCANNING PROBE METHODS IN MATERIALS SCIENCE .2., Applied physics. A, Solids and surfaces, 59(2), 1994, pp. 87-87
Authors:
WIESENDANGER R
Citation: R. Wiesendanger, SCANNING PROBE METHODS IN MATERIALS SCIENCE .1., Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 1-1
Authors:
ALLERS W
SCHWARZ UD
GENSTERBLUM G
WIESENDANGER R
Citation: W. Allers et al., SCANNING AND FRICTION-FORCE MICROSCOPY OF THIN C-60 FILMS ON GES(001), Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 11-15
Authors:
LOHNDORF M
GOERKE F
MERKT U
WIESENDANGER R
Citation: M. Lohndorf et al., GROWTH-STAGES OF YSZ-BUFFER LAYERS AND YBA2CU3O7-X THIN-FILMS ON SILICON SUBSTRATES STUDIED BY SCANNING PROBE MICROSCOPY, Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 57-62
Authors:
WIESENDANGER R
Citation: R. Wiesendanger, RECENT DEVELOPMENTS IN SCANNING-TUNNELING-MICROSCOPY, Acta Physica Polonica. A, 84(3), 1993, pp. 419-421