AAAAAA
Results: 1-25/59
Authors:
Park, S
Tenne, DA
Salvan, G
Kampen, TU
Zahn, DRT
Citation: S. Park et al., Optical spectroscopy during growth of PTCDA-C-60 complex thin films, J PHYS CH B, 105(48), 2001, pp. 12076-12081
Authors:
Paraian, AM
Rossow, U
Park, S
Salvan, G
Friedrich, M
Kampen, TU
Zahn, DRT
Citation: Am. Paraian et al., Optical anisotropy of organic layers on GaAs(001), J VAC SCI B, 19(4), 2001, pp. 1658-1661
Authors:
Tenne, DA
Haisler, VA
Bakarov, AK
Toropov, AI
Gutakovsky, AK
Shebanin, AP
Zahn, DRT
Citation: Da. Tenne et al., Self-assembled islands in the (Ga,Al)As/InAs heteroepitaxial system studied by Raman spectroscopy, PHYS ST S-B, 224(1), 2001, pp. 25-29
Authors:
Himcinschi, C
Friedrich, M
Murray, C
Streiter, I
Schulz, SE
Gessner, T
Zahn, DRT
Citation: C. Himcinschi et al., Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy, SEMIC SCI T, 16(9), 2001, pp. 806-811
Authors:
Thurzo, I
Zahn, DRT
Dua, AK
Citation: I. Thurzo et al., Charge deep-level transient spectroscopy of Al/intrinsic diamond/p(+)-Si Schottky diodes, SEMIC SCI T, 16(7), 2001, pp. 527-533
Authors:
Salvan, G
Tenne, DA
Kampen, TU
Scholz, R
Jungnickel, G
Frauenheim, T
Zahn, DRT
Citation: G. Salvan et al., Raman spectroscopy: a powerful tool for characterisation of Ag/3,4,9,10-perylene-tetracarboxylic-dianhydride/GaAs heterostructures, APPL SURF S, 179(1-4), 2001, pp. 113-117
Authors:
Kobitski, AY
Salvan, G
Wagner, HP
Zahn, DRT
Citation: Ay. Kobitski et al., Time-resolved photoluminescence characterisation of thin PTCDA films on Si(100), APPL SURF S, 179(1-4), 2001, pp. 209-212
Authors:
Park, S
Kampen, TU
Braun, W
Zahn, DRT
Citation: S. Park et al., Photoemission study of Mg/PTCDA/Se-GaAs Schottky contacts, APPL SURF S, 175, 2001, pp. 249-254
Authors:
Kampen, TU
Salvan, G
Tenne, D
Scholz, R
Zahn, DRT
Citation: Tu. Kampen et al., Growth of organic films on passivated semiconductor surfaces: gallium arsenide versus silicon, APPL SURF S, 175, 2001, pp. 326-331
Authors:
Salvan, G
Himcinschi, C
Kobitski, AY
Friedrich, M
Wagner, HP
Kampen, TU
Zahn, DRT
Citation: G. Salvan et al., Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements, APPL SURF S, 175, 2001, pp. 363-368
Authors:
Evans, DA
Steiner, HJ
Middleton, R
Jones, TS
Chen, CH
Horn, K
Park, S
Kampen, TU
Tenne, D
Zahn, DRT
Patchett, A
McGovern, IT
Citation: Da. Evans et al., In-situ monitoring of the growth of copper phthalocyanine films on InSb byorganic molecular beam deposition, APPL SURF S, 175, 2001, pp. 374-378
Authors:
Milekhin, A
Stepina, NP
Yakimov, AI
Nikiforov, AI
Schulze, S
Zahn, DRT
Citation: A. Milekhin et al., Raman scattering study of Ge dot superlattices, APPL SURF S, 175, 2001, pp. 629-635
Authors:
Himcinschi, C
Milekhin, A
Friedrich, M
Hiller, K
Wiemer, M
Gessner, T
Schulze, S
Zahn, DRT
Citation: C. Himcinschi et al., Silicon oxide in Si-Si bonded wafers, APPL SURF S, 175, 2001, pp. 715-720
Authors:
Kobitski, AY
Zhuravlev, KS
Wagner, HP
Zahn, DRT
Citation: Ay. Kobitski et al., Self-trapped exciton recombination in silicon nanocrystals - art. no. 115423, PHYS REV B, 6311(11), 2001, pp. 5423
Authors:
Zahn, DRT
Citation: Drt. Zahn, Raman studies of molecular thin films, PHYS ST S-A, 184(1), 2001, pp. 41-50
Authors:
Esser, N
Geurts, J
Rossow, U
Zahn, DRT
Citation: N. Esser et al., Papers dedicated to Professor Wolfgang Richter on the occasion of his 60thbirthday - Preface, PHYS ST S-A, 184(1), 2001, pp. VII-VIII
Authors:
Himcinschi, C
Milekhin, A
Friedrich, M
Hiller, K
Wiemer, M
Gessner, T
Schulze, S
Zahn, DRT
Citation: C. Himcinschi et al., Growth of buried silicon oxide in Si-Si bonded wafers upon annealing, J APPL PHYS, 89(3), 2001, pp. 1992-1994
Authors:
Milekhin, AG
Nikiforov, AI
Pchelyakov, OP
Schulze, S
Zahn, DRT
Citation: Ag. Milekhin et al., Phonons in Ge/Si superlattices with Ge quantum dots, JETP LETTER, 73(9), 2001, pp. 461-464
Authors:
Milekhin, A
Stepina, NP
Yakimov, AI
Nikiforov, AI
Schulze, S
Zahn, DRT
Citation: A. Milekhin et al., Raman scattering of Ge dot superlattices, EUR PHY J B, 16(2), 2000, pp. 355-359
Authors:
Kampen, TU
Rossow, U
Schumann, M
Park, S
Zahn, DRT
Citation: Tu. Kampen et al., Reflectance anisotropy spectroscopy of the growth of perylene-3,4,9,10-tetracarboxylic dianhydride on chalcogen passivated GaAs(001) surfaces, J VAC SCI B, 18(4), 2000, pp. 2077-2081
Authors:
Milekhin, A
Friedrich, M
Hiller, K
Wierner, M
Gessner, T
Zahn, DRT
Citation: A. Milekhin et al., Characterization of low-temperature wafer bonding by infrared spectroscopy, J VAC SCI B, 18(3), 2000, pp. 1392-1396
Authors:
Scholz, R
Kobitski, AY
Kampen, TU
Schreiber, M
Zahn, DRT
Jungnickel, G
Frauenheim, T
Citation: R. Scholz et al., Resonant Raman spectroscopy of organic semiconductors, PHYS ST S-B, 221(1), 2000, pp. 541-544
Authors:
Thurzo, I
Beyer, R
Zahn, DRT
Citation: I. Thurzo et al., Experimental evidence for complementary spatial sensitivities of capacitance and charge deep-level transient spectroscopies, SEMIC SCI T, 15(4), 2000, pp. 378-385
Authors:
McGovern, IT
Koebbel, A
Leslie, A
Dudzik, E
Mitchell, CEJ
McLean, AB
Patchett, A
Zahn, DRT
Evans, DA
Woodruff, DP
Cowie, BCC
Citation: It. Mcgovern et al., X-ray standing wave study of wet-etch sulphur-treated InP(100) surfaces, APPL SURF S, 166(1-4), 2000, pp. 196-200
Authors:
Park, S
Querner, T
Kampen, TU
Braun, W
Zahn, DRT
Citation: S. Park et al., The interface formation of PTCDA on Se-modified GaAs(100) surfaces, APPL SURF S, 166(1-4), 2000, pp. 376-379