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MEREL P
TABBAL M
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MOISA S
MARGOT J
Citation: P. Merel et al., DIRECT EVALUATION OF THE SP(3) CONTENT IN DIAMOND-LIKE-CARBON FILMS BY XPS, Applied surface science, 136(1-2), 1998, pp. 105-110
Authors:
KIM TW
YOON YS
LEE JY
SHIN YD
YOO KH
KIM CO
Citation: Tw. Kim et al., STRUCTURAL-PROPERTIES AND INTERFACIAL LAYER FORMATION OF PD FILMS GROWN ON INP SUBSTRATES, Applied surface science, 136(1-2), 1998, pp. 117-122
Citation: S. Zangooie et al., MICROSTRUCTURAL CONTROL OF POROUS SILICON BY ELECTROCHEMICAL ETCHING IN MIXED HCL HF SOLUTIONS/, Applied surface science, 136(1-2), 1998, pp. 123-130
Authors:
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LINDROOS S
RESCH R
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Citation: Mp. Valkonen et al., GROWTH OF ZINC-SULFIDE THIN-FILMS ON (100)SI WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD STUDIED BY ATOMIC-FORCE MICROSCOPY, Applied surface science, 136(1-2), 1998, pp. 131-136
Citation: P. Martensson et al., ATOMIC LAYER EPITAXY OF COPPER - AN AB-INITIO INVESTIGATION OF THE CUCL H-2 PROCESS - I - ADSORPTION OF CUCL ON CU(111)/, Applied surface science, 136(1-2), 1998, pp. 137-146
Citation: Yl. Leung et al., X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF THE REDUCTION OF MOO3 THIN-FILMS BY NH3, Applied surface science, 136(1-2), 1998, pp. 147-158
Citation: J. Lozano et al., HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY EVIDENCE FOR ELECTRON-BEAM-INDUCED DECOMPOSITION OF TRIMETHYLSILANE ADSORBED ON SI(100), Applied surface science, 136(1-2), 1998, pp. 159-165
Citation: I. Apostol et al., PHOTOACOUSTIC EVIDENCE OF TARGET ABLATION FOR LPVD OF YBCO THIN-FILMS, Applied surface science, 136(1-2), 1998, pp. 166-171
Citation: Vm. Aroutiounian et Gs. Aghababian, SUB-LINEAR DEPENDENCIES OF THE SURFACE CONDUCTIVITY ON THE GAS-PRESSURE, Applied surface science, 135(1-4), 1998, pp. 1-7
Citation: L. Stobinski et L. Zommer, DETERMINATION OF THE SURFACE-AREA OF ANNEALED CONTINUOUS GOLD FILM AND PYREX GLASS IN-SITU BY THE BET ADSORPTION-ISOTHERM AND EX-SITU BY ATOMIC-FORCE MICROSCOPY IN AIR, Applied surface science, 135(1-4), 1998, pp. 8-14
Citation: B. Gelloz et A. Bsiesy, CARRIER TRANSPORT MECHANISMS IN POROUS SILICON IN CONTACT WITH A LIQUID-PHASE - A DIFFUSION PROCESS, Applied surface science, 135(1-4), 1998, pp. 15-22
Authors:
DAS A
BERA S
JOSEPH M
SIVAKUMAR N
PATNAIK A
Citation: A. Das et al., DEPOSITION AND CHARACTERIZATION OF LASER-ABLATED POLY(P-PHENYLENE SULFIDE) THIN-FILMS, Applied surface science, 135(1-4), 1998, pp. 37-45
Citation: Ma. Lovell et D. Roy, OPTICAL 2ND-HARMONIC GENERATION FROM A CATALYTICALLY ACTIVE MOLYBDENUM ELECTRODE, Applied surface science, 135(1-4), 1998, pp. 46-52
Authors:
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MUSSIG HJ
DABROWSKI J
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HINRICH S
Citation: W. Arabczyk et al., SEPARATION OF THE BULK AND SURFACE COMPONENTS IN AUGER-ELECTRON SPECTROSCOPY, Applied surface science, 135(1-4), 1998, pp. 59-64
Authors:
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DEBIEMMECHOUVY C
ETCHEBERRY A
Citation: A. Rothschild et al., STUDY OF THE INTERACTION AT REST POTENTIAL BETWEEN SILICOTUNGSTIC HETEROPOLYANION SOLUTION AND GAAS SURFACE, Applied surface science, 135(1-4), 1998, pp. 65-70
Citation: E. Atanassova et D. Spassov, X-RAY PHOTOELECTRON-SPECTROSCOPY OF THERMAL THIN TA2O5 FILMS ON SI, Applied surface science, 135(1-4), 1998, pp. 71-82
Authors:
LLAURO G
HERNANDEZ D
SIBIEUDE F
GINESTE JM
VERGES R
ANTOINE D
Citation: G. Llauro et al., IN-SITU CHARACTERIZATION OF SURFACES AT HIGH-TEMPERATURE BY USING SIMULTANEOUSLY A PYROREFLECTOMETER AND AN X-RAY DIFFRACTOMETER, Applied surface science, 135(1-4), 1998, pp. 91-96
Authors:
WANG GM
CHEN H
ZHANG H
YUAN CW
LU ZJ
WANG GM
YANG WY
Citation: Gm. Wang et al., TIO2 POLYPYRROLE DIODES PREPARED BY ELECTROCHEMICAL DEPOSITION OF POLYPYRROLE ON MICROPOROUS TIO2 FILM/, Applied surface science, 135(1-4), 1998, pp. 97-100
Citation: Ms. Kwon et Jy. Lee, O-2 PLASMA OXIDATION OF SPUTTER-DEPOSITED CU THIN-FILM DURING PHOTO RESIST ASHING, Applied surface science, 135(1-4), 1998, pp. 101-106