Citation: Mg. Clark, CURRENT STATUS AND FUTURE-PROSPECTS OF POLY-SI DEVICES, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 3-8
Authors:
STROH RJ
PLAIS F
KRETZ T
LEGAGNEUX P
HUET O
MAGIS M
PRIBAT D
JIANG N
HUGON MC
AGIUS B
Citation: Rj. Stroh et al., LOW-TEMPERATURE (LESS-THAN-OR-EQUAL-TO-600-DEGREES-C) POLYSILICON THIN-FILM TRANSISTORS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 9-13
Authors:
DYER TE
MARSHALL JM
PICKIN W
HEPBURN AR
DAVIES JF
Citation: Te. Dyer et al., OPTOELECTRONIC AND STRUCTURAL-PROPERTIES OF POLYSILICON PRODUCED BY EXCIMER-LASER AND FURNACE CRYSTALLIZATION OF HYDROGENATED AMORPHOUS-SILICON (A-SI-H), IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 15-18
Authors:
SARRET M
LIBA A
BONNAUD O
LEBIHAN F
FORTIN B
PICHON L
RAOULT F
Citation: M. Sarret et al., IN-SITU PHOSPHORUS-DOPED VLPCVD POLYSILICON LAYERS FOR POLYSILICON THIN-FILM TRANSISTORS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 19-22
Authors:
WU Y
MONTGOMERY JH
REFSUM A
MITCHELL SJN
ARMSTRONG BM
GAMBLE HS
Citation: Y. Wu et al., LARGE-AREA SHOWER IMPLANTER FOR THIN-FILM TRANSISTORS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 23-26
Authors:
PECORA A
TALLARIDA G
FORTUNATO G
MARIUCCI L
REITA C
MIGLIORATO P
Citation: A. Pecora et al., HOT-HOLE-INDUCED DEGRADATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS - EXPERIMENTAL AND THEORETICAL-ANALYSIS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 33-37
Citation: Jr. Ayres et Nd. Young, HOT-CARRIER EFFECTS IN DEVICES AND CIRCUITS FORMED FROM POLY-SI, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 38-44
Authors:
QUINN M
MIGLIORATO P
REITA C
PECORA A
TALLARIDA G
FORTUNATO G
Citation: M. Quinn et al., HIGH-FIELD EFFECTS IN POLYSILICON THIN-FILM TRANSISTORS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 45-49
Citation: Mj. Edwards, NMOS AND CMOS POLYSILICON DRIVE CIRCUITS FOR LIQUID-CRYSTAL DISPLAYS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 50-55
Citation: Sm. Fluxman, DESIGN AND PERFORMANCE OF DIGITAL POLYSILICON THIN-FILM-TRANSISTOR CIRCUITS ON GLASS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 56-59
Citation: C. Reita et S. Fluxman, DESIGN AND OPERATION OF POLY-SI ANALOG CIRCUITS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 60-64
Citation: S. Pennathur et Hhl. Kwok, EQUIVALENT-CIRCUIT FOR A GAAS CCD, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 377-382
Authors:
MOHAN S
MAZUMDER P
HADDAD GI
MAINS RK
SUN JP
Citation: S. Mohan et al., LOGIC DESIGN BASED ON NEGATIVE DIFFERENTIAL RESISTANCE CHARACTERISTICS OF QUANTUM ELECTRONIC DEVICES, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 383-391
Citation: Gw. Taylor et Pa. Kiely, THEORETICAL AND EXPERIMENTAL RESULTS FOR THE INVERSION CHANNEL HETEROSTRUCTURE FIELD-EFFECT TRANSISTOR, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 392-400
Citation: R. Perfetti, ASYMPTOTIC STABILITY OF EQUILIBRIUM POINTS IN DYNAMICAL NEURAL NETWORKS, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 401-405
Citation: Dr. Frey, LOG-DOMAIN FILTERING - AN APPROACH TO CURRENT-MODE FILTERING, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 406-416
Citation: Pk. Ojala et Kk. Kaski, ANALYTICALLY EXTRACTED ZTC POINT FOR GAAS-MESFET, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 424-430
Citation: E. Simoen et C. Claeys, LIQUID-HELIUM TEMPERATURE HOT-CARRIER DEGRADATION OF SI P-CHANNEL MOSTS, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 431-436
Citation: Hc. Tang et Mc. Shiau, POWER DISSIPATION MODELS AND PERFORMANCE IMPROVEMENT TECHNIQUES FOR CMOS INVERTERS WITH RC LINE AND TREE INTERCONNECTIONS, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 437-443
Citation: N. Tan et S. Eriksson, NEW MULTIBIT DELTA-SIGMA MODULATOR STRUCTURE WITH REDUCED SENSITIVITYTO THE D-A CONVERSION ERROR, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 444-448
Citation: X. Zhang et K. Ding, CAPACITANCE TIME TRANSIENT CHARACTERISTICS OF PULSED MOS CAPACITOR APPLICATION IN MEASUREMENT OF SEMICONDUCTOR PARAMETERS, IEE proceedings. Part G. Circuits, devices and systems, 140(6), 1993, pp. 449-452