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Authors:
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Authors:
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Authors:
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Authors:
Aarik, J
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Authors:
Aarik, J
Aidla, A
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Uustare, T
Citation: J. Aarik et al., Texture development in nanocrystalline hafnium dioxide thin films grown byatomic layer deposition, J CRYST GR, 220(1-2), 2000, pp. 105-113
Authors:
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Citation: M. Jansen et al., High performance laser diode bars with aluminum-free active regions, OPT EXPRESS, 4(1), 1999, pp. 3-11
Authors:
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Citation: V. Sammelselg et al., Composition and thickness determination of thin oxide films: comparison ofdifferent programs and methods, J ANAL ATOM, 14(3), 1999, pp. 523-527
Authors:
Aarik, J
Aidla, A
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Sammelselg, V
Citation: J. Aarik et al., Influence of substrate temperature on atomic layer growth and properties of HfO2 thin films, THIN SOL FI, 340(1-2), 1999, pp. 110-116
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