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Results: 1-25 | 26-50 | 51-75 | 76-77
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Authors: CERRINA F
Citation: F. Cerrina, X-RAY PHOTO-ELECTRON SPECTROMICROSCOPY, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 9-19

Authors: GOZZO F BERGER H COLLINS IR MARGARITONDO G NG W RAYCHAUDHURI AK LIANG S SINGH S CERRINA F
Citation: F. Gozzo et al., MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE GASE-GE HETEROJUNCTION ENERGY LINEUP, Physical review. B, Condensed matter, 51(8), 1995, pp. 5024-5027

Authors: TAN ZQ MACDOWELL AA LAFONTAINE B BJORKHOLM JE TENNANT D TAYLOR D HIMEL M FREEMAN RR WASKIEWICZ WK WINDT DL SPECTOR S RAYCHAUDHURI AK STULEN RH NG W CERRINA F
Citation: Zq. Tan et al., AT-WAVELENGTH METROLOGY OF 13-NM LITHOGRAPHY IMAGING OPTICS, Review of scientific instruments, 66(2), 1995, pp. 2241-2243

Authors: WELNAK J DONG Z SOLAK H WALLACE J CERRINA F BERTOLO M BIANCO A DIFONZO S FONTANA S JARK W MAZZOLINI F ROSEI R SAVOIA A UNDERWOOD JH MARGARITONDO G
Citation: J. Welnak et al., SUPERMAXIMUM - A SCHWARZSCHILD-BASED, SPECTROMICROSCOPE FOR ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 2273-2276

Authors: LAI B YUN W XIAO Y YANG L LEGNINI D CAI Z KRASNOPEROVA A CERRINA F DIFABRIZIO E GRELLA L GENTILI M
Citation: B. Lai et al., DEVELOPMENT OF A HARD X-RAY-IMAGING MICROSCOPE, Review of scientific instruments, 66(2), 1995, pp. 2287-2289

Authors: WELLS GM ANDERSON PD LEONARD QJ CERRINA F WALDO WG YAMAZAKI K
Citation: Gm. Wells et al., EVALUATION OF A SOLID-STATE DETECTOR FOR X-RAY-LITHOGRAPHY DOSIMETRY, JPN J A P 1, 33(12B), 1994, pp. 6905-6907

Authors: KRASNOPEROVA AA BELL T RHYNER S TAYLOR JW DEPABLO J CERRINA F
Citation: Aa. Krasnoperova et al., DISSOLUTION STUDY OF A NOVOLAK-BASED PHOTORESIST BASED ON A DEVELOPERDIFFUSION-MODEL, JPN J A P 1, 33(12B), 1994, pp. 7012-7016

Authors: KRASNOPEROVA AA KHAN M RHYNER S TAYLOR JW ZHU Y CERRINA F
Citation: Aa. Krasnoperova et al., MODELING AND SIMULATIONS OF A POSITIVE CHEMICALLY AMPLIFIED PHOTORESIST FOR X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3900-3904

Authors: KHAN M MOHAMMAD L XIAO J OCOLA L CERRINA F
Citation: M. Khan et al., UPDATED SYSTEM MODEL FOR X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3930-3935

Authors: GENTILI M DIFABRIZIO E GRELLA L BACIOCCHI M MASTROGIACOMO L MAGGIORA R XIAO J CERRINA F
Citation: M. Gentili et al., FABRICATION OF CONTROLLED SLOPE ATTENUATED PHASE-SHIFT X-RAY MASKS FOR 250 NM SYNCHROTRON LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3954-3958

Authors: CHEN HTH ENGELSTAD RL CERRINA F
Citation: Hth. Chen et al., NOVEL TECHNIQUE FOR THE SEPARATION OF MECHANICAL-PROPERTIES AND INTRINSIC STRESS OF PRE-IRRADIATED AND POST-IRRADIATED MEMBRANES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3975-3978

Authors: DIFABRIZIO E GENTILI M GRELLA L BACIOCCHI M KRASNOPEROVA A CERRINA F YUN W LAI B GLUSKIN E
Citation: E. Difabrizio et al., HIGH-PERFORMANCE MULTILEVEL BLAZED X-RAY MICROSCOPY FRESNEL ZONE PLATES - FABRICATED USING X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3979-3985

Authors: OCOLA LE CERRINA F
Citation: Le. Ocola et F. Cerrina, PARAMETRIC MODELING AT RESIST-SUBSTRATE INTERFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3986-3989

Authors: SHOKI T OHKUBO R KOSUGA H YAMAGUCHI Y ANNAKA N WELLS GM YAMAZAKI K CERRINA F
Citation: T. Shoki et al., ACCELERATED RADIATION-DAMAGE STUDIES OF ANTIREFLECTION MATERIALS ON SIC X-RAY MASK MEMBRANE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3995-4000

Authors: CHEN G YAMAZAKI K WALDO W WELNAK J WELLS GM CERRINA F
Citation: G. Chen et al., SYNCHROTRON-RADIATION X-RAY-LITHOGRAPHY BEAMLINE OPTICS ALIGNMENT USING THE HARTMANN METHOD, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 4013-4017

Authors: XIAO JB CERRINA F RIPPSTEIN RP
Citation: Jb. Xiao et al., NOVEL SINGLE MIRROR CONDENSER FOR X-RAY-LITHOGRAPHY BEAM LINES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 4018-4023

Authors: XIAO JB KHAN M NACHMAN R WALLACE J CHEN Z CERRINA F
Citation: Jb. Xiao et al., MODELING IMAGE-FORMATION - APPLICATION TO MASK OPTIMIZATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 4038-4043

Authors: PAN SW REILLY MT DIFABRIZIO E LEONARD Q TAYLOR JW CERRINA F
Citation: Sw. Pan et al., AN OPTIMIZATION DESIGN METHOD FOR CHEMICALLY AMPLIFIED RESIST PROCESS-CONTROL, IEEE transactions on semiconductor manufacturing, 7(3), 1994, pp. 325-332

Authors: XIAO JB CERRINA F
Citation: Jb. Xiao et F. Cerrina, DESIGN OF ASPHERIC MIRROR FOR SYNCHROTRON-RADIATION X-RAY-LITHOGRAPHYBEAMLINE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 231-237

Authors: CHEN GJ GUO JZY CERRINA F
Citation: Gj. Chen et al., APPLICATIONS OF FACETED MIRRORS TO X-RAY-LITHOGRAPHY BEAMLINES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 238-243

Authors: DELRIO MS FERRERO C CHEN GJ CERRINA F
Citation: Ms. Delrio et al., MODELING PERFECT CRYSTALS IN TRANSMISSION GEOMETRY FOR SYNCHROTRON-RADIATION MONOCHROMATOR DESIGN, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 338-343

Authors: WELNAK C CHEN GJ CERRINA F
Citation: C. Welnak et al., SHADOW - A SYNCHROTRON-RADIATION AND X-RAY OPTICS SIMULATION TOOL, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 344-347

Authors: RAYCHAUDHURI AK NG W LIANG S CERRINA F
Citation: Ak. Raychaudhuri et al., SOFT-X-RAY FOUCAULT TEST - A PATH TO DIFFRACTION-LIMITED IMAGING, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 364-371

Authors: WELNAK J RAYCHAUDHURI AK NG W CERRINA F
Citation: J. Welnak et al., DOUBLE-MOMENT KIRKPATRICK-BAEZ CONDENSING MIRRORS - IN-SITU ALIGNMENT, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 372-375

Authors: CHEN GJ CERRINA F VOSS KF KIM KH BROWN FC
Citation: Gj. Chen et al., RAY-TRACING OF X-RAY FOCUSING CAPILLARIES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 407-411
Risultati: 1-25 | 26-50 | 51-75 | 76-77