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Results: 1-23 |
Results: 23
SELF-ASSEMBLED GE DOTS - GROWTH, CHARACTERIZATION, ORDERING, AND APPLICATIONS
Authors: SCHITTENHELM P ENGEL C FINDEIS F ABSTREITER G DARHUBER AA BAUER G KOSOGOV AO WERNER P
Citation: P. Schittenhelm et al., SELF-ASSEMBLED GE DOTS - GROWTH, CHARACTERIZATION, ORDERING, AND APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1575-1581
X-RAY REFLECTIVITY INVESTIGATIONS OF THE INTERFACE MORPHOLOGY IN STRAINED SIGE SI MULTILAYERS/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL J ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY INVESTIGATIONS OF THE INTERFACE MORPHOLOGY IN STRAINED SIGE SI MULTILAYERS/, Semiconductor science and technology, 13(6), 1998, pp. 590-598
ELASTIC RELAXATION OF DRY-ETCHED SI SIGE QUANTUM DOTS/
Authors: DARHUBER AA GRILL T STANGL J BAUER G LOCKWOOD DJ NOEL JP WANG PD TORRES CMS
Citation: Aa. Darhuber et al., ELASTIC RELAXATION OF DRY-ETCHED SI SIGE QUANTUM DOTS/, Physical review. B, Condensed matter, 58(8), 1998, pp. 4825-4831
COPLANAR AND GRAZING-INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM-DOT MULTILAYERS
Authors: HOLY V DARHUBER AA STANGL J ZERLAUTH S SCHAFFLER F BAUER G DAROWSKI N LUBBERT D PIETSCH U VAVRA I
Citation: V. Holy et al., COPLANAR AND GRAZING-INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM-DOT MULTILAYERS, Physical review. B, Condensed matter, 58(12), 1998, pp. 7934-7943
OBLIQUE ROUGHNESS REPLICATION IN STRAINED SIGE SI MULTILAYERS/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL J ABSTREITER G
Citation: V. Holy et al., OBLIQUE ROUGHNESS REPLICATION IN STRAINED SIGE SI MULTILAYERS/, Physical review. B, Condensed matter, 57(19), 1998, pp. 12435-12442
HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF SHORT-PERIOD CDTE MNTE-SUPERLATTICES/
Authors: STANGL J DARHUBER AA HOLY V DENAUROIS M FERREIRA S FASCHINGER W BAUER G
Citation: J. Stangl et al., HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF SHORT-PERIOD CDTE MNTE-SUPERLATTICES/, Journal of crystal growth, 185, 1998, pp. 105-108
SHEAR STRAINS IN DRY-ETCHED GAAS ALAS WIRES STUDIED BY HIGH-RESOLUTION X-RAY RECIPROCAL SPACE MAPPING/
Authors: DARHUBER AA BAUER G WANG PD TORRES CMS
Citation: Aa. Darhuber et al., SHEAR STRAINS IN DRY-ETCHED GAAS ALAS WIRES STUDIED BY HIGH-RESOLUTION X-RAY RECIPROCAL SPACE MAPPING/, Journal of applied physics, 83(1), 1998, pp. 126-131
HIGHLY REGULAR SELF-ORGANIZATION OF STEP BUNCHES DURING GROWTH OF SIGE ON SI(113)
Authors: DARHUBER AA ZHU J HOLY V STANGL J MIKULIK P BRUNNER K ABSTREITER G BAUER G
Citation: Aa. Darhuber et al., HIGHLY REGULAR SELF-ORGANIZATION OF STEP BUNCHES DURING GROWTH OF SIGE ON SI(113), Applied physics letters, 73(11), 1998, pp. 1535-1537
HIGH-RESOLUTION X-RAY-DIFFRACTION AND REFLECTIVITY STUDIES OF VERTICAL AND LATERAL ORDERING IN MULTIPLE SELF-ORGANIZED INGAAS QUANTUM DOTS
Authors: DARHUBER AA HOLY V STANGL J BAUER G KROST A GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., HIGH-RESOLUTION X-RAY-DIFFRACTION AND REFLECTIVITY STUDIES OF VERTICAL AND LATERAL ORDERING IN MULTIPLE SELF-ORGANIZED INGAAS QUANTUM DOTS, JPN J A P 1, 36(6B), 1997, pp. 4084-4087
X-RAY REFLECTIVITY RECIPROCAL SPACE MAPPING OF STRAINED SIGE SI SUPERLATTICES/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL JF ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY RECIPROCAL SPACE MAPPING OF STRAINED SIGE SI SUPERLATTICES/, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 419-428
HIGH-RESOLUTION X-RAY-DIFFRACTION FROM MULTILAYERED SELF-ASSEMBLED GEDOTS
Authors: DARHUBER AA SCHITTENHELM P HOLY V STANGL J BAUER G ABSTREITER G
Citation: Aa. Darhuber et al., HIGH-RESOLUTION X-RAY-DIFFRACTION FROM MULTILAYERED SELF-ASSEMBLED GEDOTS, Physical review. B, Condensed matter, 55(23), 1997, pp. 15652-15663
STRUCTURAL CHARACTERIZATION OF SELF-ASSEMBLED QUANTUM-DOT STRUCTURES BY X-RAY-DIFFRACTION TECHNIQUES
Authors: DARHUBER AA STANGL J HOLY V BAUER G KROST A GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., STRUCTURAL CHARACTERIZATION OF SELF-ASSEMBLED QUANTUM-DOT STRUCTURES BY X-RAY-DIFFRACTION TECHNIQUES, Thin solid films, 306(2), 1997, pp. 198-204
X-RAY-DIFFRACTION AND REFLECTION FROM SELF-ASSEMBLED GE DOTS
Authors: DARHUBER AA STANGL J BAUER G SCHITTENHELM P ABSTREITER G
Citation: Aa. Darhuber et al., X-RAY-DIFFRACTION AND REFLECTION FROM SELF-ASSEMBLED GE DOTS, Thin solid films, 294(1-2), 1997, pp. 296-299
MBE GROWTH AND STRUCTURAL CHARACTERIZATION OF SI1-YCY SI1-XGEX SUPERLATTICES/
Authors: ZERLAUTH S STANGL J DARHUBER AA HOLY V BAUER G SCHAFFLER F
Citation: S. Zerlauth et al., MBE GROWTH AND STRUCTURAL CHARACTERIZATION OF SI1-YCY SI1-XGEX SUPERLATTICES/, Journal of crystal growth, 175, 1997, pp. 459-464
LATERAL AND VERTICAL ORDERING IN MULTILAYERED SELF-ORGANIZED INGAAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION
Authors: DARHUBER AA HOLY V STANGL J BAUER G KROST A HEINRICHSDORFF F GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., LATERAL AND VERTICAL ORDERING IN MULTILAYERED SELF-ORGANIZED INGAAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION, Applied physics letters, 70(8), 1997, pp. 955-957
QUANTITATIVE-ANALYSIS OF ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS/
Authors: DARHUBER AA HOLY V BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: Aa. Darhuber et al., QUANTITATIVE-ANALYSIS OF ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS/, Physica. B, Condensed matter, 227(1-4), 1996, pp. 11-16
ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION/
Authors: HOLY V DARHUBER AA BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: V. Holy et al., ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION/, Solid-state electronics, 40(1-8), 1996, pp. 373-377
CRYSTALLINE AND QUASI-CRYSTALLINE PATTERNS IN X-RAY-DIFFRACTION FROM PERIODIC ARRAYS OF QUANTUM DOTS
Authors: DARHUBER AA HOLY V BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: Aa. Darhuber et al., CRYSTALLINE AND QUASI-CRYSTALLINE PATTERNS IN X-RAY-DIFFRACTION FROM PERIODIC ARRAYS OF QUANTUM DOTS, Europhysics letters, 32(2), 1995, pp. 131-136
ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION/
Authors: HOLY V DARHUBER AA BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: V. Holy et al., ELASTIC STRAINS IN GAAS ALAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION/, Physical review. B, Condensed matter, 52(11), 1995, pp. 8348-8357
STRUCTURAL INVESTIGATIONS OF GAAS ALAS QUANTUM WIRES AND QUANTUM DOTSBY X-RAY RECIPROCAL SPACE MAPPING/
Authors: DARHUBER AA KOPPENSTEINER E BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: Aa. Darhuber et al., STRUCTURAL INVESTIGATIONS OF GAAS ALAS QUANTUM WIRES AND QUANTUM DOTSBY X-RAY RECIPROCAL SPACE MAPPING/, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 195-199
STRUCTURAL INVESTIGATION OF II-VI COMPOUND SEMICONDUCTOR QUANTUM WIRES USING TRIPLE-AXIS X-RAY-DIFFRACTOMETRY
Authors: DARHUBER AA STRAUB H FERREIRA S FASCHINGER W KOPPENSTEINER E BRUNTHALER G BAUER G
Citation: Aa. Darhuber et al., STRUCTURAL INVESTIGATION OF II-VI COMPOUND SEMICONDUCTOR QUANTUM WIRES USING TRIPLE-AXIS X-RAY-DIFFRACTOMETRY, Journal of crystal growth, 150(1-4), 1995, pp. 775-778
X-RAY RECIPROCAL SPACE MAPPING OF GAAS ALAS QUANTUM WIRES AND QUANTUMDOTS/
Authors: DARHUBER AA KOPPENSTEINER E BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC
Citation: Aa. Darhuber et al., X-RAY RECIPROCAL SPACE MAPPING OF GAAS ALAS QUANTUM WIRES AND QUANTUMDOTS/, Applied physics letters, 66(8), 1995, pp. 947-949
TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS
Authors: DARHUBER AA KOPPENSTEINER E STRAUB H BRUNTHALER G FASCHINGER W BAUER G
Citation: Aa. Darhuber et al., TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS, Journal of applied physics, 76(12), 1994, pp. 7816-7823
Risultati: 1-23 |