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Results: 1-25 | 26-49
Results: 1-25/49
Model of low frequency noise in polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Kamarinos, G Brini, J
Citation: Ca. Dimitriadis et al., Model of low frequency noise in polycrystalline silicon thin-film transistors, IEEE ELEC D, 22(8), 2001, pp. 381-383
Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Dimitriadis, CA
Citation: Fv. Farmakis et al., Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors, IEEE ELEC D, 22(2), 2001, pp. 74-76
Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors
Authors: Farmakis, FV Dimitriadis, CA Brini, J Kamarinos, G
Citation: Fv. Farmakis et al., Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors, IEEE ELEC D, 22(2), 2001, pp. 83-85
Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface
Authors: Hastas, NA Dimitriadis, CA Logothetidis, S Angelis, CT Konofaos, N Evangelou, EK
Citation: Na. Hastas et al., Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface, SEMIC SCI T, 16(6), 2001, pp. 474-477
Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs)
Authors: Farmakis, FV Tsamados, DM Brini, J Kamarinos, G Dimitriadis, CA Miyasaka, M
Citation: Fv. Farmakis et al., Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs), THIN SOL FI, 383(1-2), 2001, pp. 151-153
Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Kamarinos, G Brini, J
Citation: Ca. Dimitriadis et al., Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors, SOL ST ELEC, 45(2), 2001, pp. 365-368
Time-dependent-dielectric-breakdown of hydrogen implanted polyoxides
Authors: Gueorguiev, VK Ivanov, TE Dimitriadis, CA Andreev, SK Popova, LI
Citation: Vk. Gueorguiev et al., Time-dependent-dielectric-breakdown of hydrogen implanted polyoxides, MICROELEC J, 32(4), 2001, pp. 301-304
Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions
Authors: Hastas, NA Dimitriadis, CA Patsalas, P Panayiotatos, Y Tassis, DH Logothetidis, S
Citation: Na. Hastas et al., Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions, J APPL PHYS, 89(5), 2001, pp. 2832-2838
Microstructure and its effect on the conductivity of magnetron sputtered carbon thin films
Authors: Dimitriadis, CA Hastas, NA Vouroutzis, N Logothetidis, S Panayiotatos, Y
Citation: Ca. Dimitriadis et al., Microstructure and its effect on the conductivity of magnetron sputtered carbon thin films, J APPL PHYS, 89(12), 2001, pp. 7954-7959
On-current modeling of large-grain polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Angelis, CT Dimitriadis, CA Miyasaka, M
Citation: Fv. Farmakis et al., On-current modeling of large-grain polycrystalline silicon thin-film transistors, IEEE DEVICE, 48(4), 2001, pp. 701-706
Electrical characterization of nanocrystalline carbon-silicon heterojunctions
Authors: Hastas, NA Dimitriadis, CA Tassis, DH Logothetidis, S
Citation: Na. Hastas et al., Electrical characterization of nanocrystalline carbon-silicon heterojunctions, APPL PHYS L, 79(5), 2001, pp. 638-640
Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure
Authors: Hastas, NA Dimitriadis, CA Tassis, DH Panayiotatos, Y Logothetidis, S Papadimitriou, D
Citation: Na. Hastas et al., Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure, APPL PHYS L, 79(20), 2001, pp. 3269-3271
Charge carrier response time in sputtered a-C/n-Si heterojunctions
Authors: Konofaos, N Angelis, CT Evangelou, EK Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Charge carrier response time in sputtered a-C/n-Si heterojunctions, APPL PHYS L, 79(15), 2001, pp. 2381-2383
Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature
Authors: Konofaos, N Angelis, CT Evangelou, EK Panayiotatos, Y Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature, APPL PHYS L, 78(12), 2001, pp. 1682-1684
Performance enhancement of offset gated polysilicon thin-film transistors
Authors: Dimitriadis, CA Miyasaka, M
Citation: Ca. Dimitriadis et M. Miyasaka, Performance enhancement of offset gated polysilicon thin-film transistors, IEEE ELEC D, 21(12), 2000, pp. 584-586
Low frequency noise spectroscopy for Schottky contacts
Authors: Lee, JI Han, IK Heo, DC Brini, J Chovet, A Dimitriadis, CA Jeong, JC
Citation: Ji. Lee et al., Low frequency noise spectroscopy for Schottky contacts, J KOR PHYS, 37(6), 2000, pp. 966-970
Electrical and low frequency noise properties of Gd and GdCo silicide contacts on n-type Si
Authors: Dozsa, L Horvath, ZJ Molnar, GL Peto, G Dimitriadis, CA Papadimitriou, L Brini, J Kamarinos, G
Citation: L. Dozsa et al., Electrical and low frequency noise properties of Gd and GdCo silicide contacts on n-type Si, SEMIC SCI T, 15(7), 2000, pp. 653-657
Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors
Authors: Farmakis, FV Brini, J Kamarinos, G Angelis, CT Dimitriadis, CA Miyasaka, M Ouisse, T
Citation: Fv. Farmakis et al., Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors, SOL ST ELEC, 44(6), 2000, pp. 913-916
Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors
Authors: Angelis, CT Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G Miyasaka, M Stoemenos, I
Citation: Ct. Angelis et al., Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors, SOL ST ELEC, 44(6), 2000, pp. 1081-1087
Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors
Authors: Dimitriadis, CA Kimura, M Miyasaka, M Inoue, S Farmakis, FV Brini, J Kamarinos, G
Citation: Ca. Dimitriadis et al., Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors, SOL ST ELEC, 44(11), 2000, pp. 2045-2051
Oxide field enhancement corrected time dependent dielectric breakdown of polyoxides
Authors: Gueorguiev, VK Ivanov, TE Dimitriadis, CA Andreev, SK Popova, LI
Citation: Vk. Gueorguiev et al., Oxide field enhancement corrected time dependent dielectric breakdown of polyoxides, MICROELEC J, 31(8), 2000, pp. 663-666
Electron trapping probabilities in hydrogen ion implanted silicon dioxide films thermally grown on polycrystalline silicon
Authors: Gueorguiev, VK Ivanov, TE Dimitriadis, CA Popova, LI Andreev, SK
Citation: Vk. Gueorguiev et al., Electron trapping probabilities in hydrogen ion implanted silicon dioxide films thermally grown on polycrystalline silicon, MICROELEC J, 31(3), 2000, pp. 207-211
Noise characterization of sputtered amorphous carbon films
Authors: Hastas, NA Dimitriadis, CA Panayiotatos, Y Tassis, DH Patsalas, P Logothetidis, S
Citation: Na. Hastas et al., Noise characterization of sputtered amorphous carbon films, J APPL PHYS, 88(9), 2000, pp. 5482-5484
Gate bias instability in hydrogenated polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA
Citation: Ca. Dimitriadis, Gate bias instability in hydrogenated polycrystalline silicon thin-film transistors, J APPL PHYS, 88(6), 2000, pp. 3624-3628
Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors
Authors: Dimitriadis, CA Farmakis, FV Brini, J Kamarinos, G
Citation: Ca. Dimitriadis et al., Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors, J APPL PHYS, 88(5), 2000, pp. 2648-2651
Risultati: 1-25 | 26-49