Citation: K. Ensslin, Globalization vs. nationalization - National interests as a problematic element in space exploration, INT POLITIK, 56(7), 2001, pp. 12-18
Authors:
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Citation: T. Heinzel et al., Electronic properties of nanostructures defined in Ga[Al]As heterostructures by local oxidation, PHYSICA E, 9(1), 2001, pp. 84-93
Authors:
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Citation: H. Sigg et al., Valence band intersubband electro luminescence from Si/SiGe quantum cascade structures, PHYSICA E, 11(2-3), 2001, pp. 240-244
Authors:
Senz, V
Heinzel, T
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Held, R
Ensslin, K
Wegscheider, W
Bichler, M
Citation: V. Senz et al., Analysis of the temperature-dependent quantum point contact conductance inrelation to the metal-insulator transition in two dimensions, J PHYS-COND, 13(17), 2001, pp. 3831-3837
Authors:
Muller, HO
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Heinzel, T
Ensslin, K
Citation: Ho. Muller et al., Modelling background charge rearrangements near single-electron transistors as a Poisson process, EUROPH LETT, 55(2), 2001, pp. 253-259
Authors:
Jaggi, RD
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Studerus, P
Ensslin, K
Citation: Rd. Jaggi et al., Detailed analysis of forces influencing lateral resolution for Q-control and tapping mode, APPL PHYS L, 79(1), 2001, pp. 135-137
Authors:
Furlan, M
Heinzel, T
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Ensslin, K
Citation: M. Furlan et al., Non-Gaussian distribution of nearest-neighbour Coulomb peak spacings in metallic single-electron transistors, EUROPH LETT, 49(3), 2000, pp. 369-375
Authors:
Heinzel, T
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Held, R
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Ensslin, K
Wegscheider, W
Bichler, M
Citation: T. Heinzel et al., Shifting a quantum wire through a disordered crystal: Observation of conductance fluctuations in real space, PHYS REV B, 61(20), 2000, pp. R13353-R13356
Authors:
Dehlinger, G
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Grutzmacher, D
Ihn, T
Muller, E
Ensslin, K
Citation: G. Dehlinger et al., Investigation of the emitter structure in SiGe/Si resonant tunneling structures, THIN SOL FI, 369(1-2), 2000, pp. 390-393
Authors:
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Ensslin, K
Hug, HJ
van Schendel, PJA
Guntherodt, HJ
Citation: J. Rychen et al., Operation characteristics of piezoelectric quartz tuning forks in high magnetic fields at liquid helium temperatures, REV SCI INS, 71(4), 2000, pp. 1695-1697
Authors:
Senz, V
Ihn, T
Heinzel, T
Ensslin, K
Dehlinger, G
Grutzmacher, D
Gennser, U
Citation: V. Senz et al., Analysis of the metallic phase of two-dimensional holes in SiGe in terms of temperature dependent screening, PHYS REV L, 85(20), 2000, pp. 4357-4360