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Results: 17
ACOUSTIC PHASE-VELOCITY MEASUREMENTS WITH NANOMETER RESOLUTION BY SCANNING ACOUSTIC FORCE MICROSCOPY
Authors:
CHILLA E
HESJEDAL T
FROHLICH HJ
Citation: E. Chilla et al., ACOUSTIC PHASE-VELOCITY MEASUREMENTS WITH NANOMETER RESOLUTION BY SCANNING ACOUSTIC FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 223-226
Authors:
HESJEDAL T
FROHLICH HJ
CHILLA E
Citation: T. Hesjedal et al., FORCE MICROSCOPY FOR THE INVESTIGATION OF HIGH-FREQUENCY SURFACE-ACOUSTIC-WAVE DEVICES, Applied physics A: Materials science & processing, 66, 1998, pp. 325-328
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., IMAGING OF SURFACE ATOMS REVOLVING ON ELLIPTIC TRAJECTORIES, Applied physics A: Materials science & processing, 66, 1998, pp. 353-355
Authors:
BEHME G
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: G. Behme et al., TRANSVERSE SURFACE-ACOUSTIC-WAVE DETECTION BY SCANNING ACOUSTIC FORCEMICROSCOPY, Applied physics letters, 73(7), 1998, pp. 882-884
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC TUNNELING MICROSCOPY AND SPECTROSCOPY - A PROBING TOOL FOR ACOUSTIC SURFACE OSCILLATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1569-1572
Authors:
ENDERLEIN J
BECHSTEIN S
SCHONBERG J
CHILLA E
FROHLICH HJ
Citation: J. Enderlein et al., 2-CHANNEL SAW SENSOR SIGNAL-TRANSMISSION SYSTEM, Sensors and actuators. A, Physical, 61(1-3), 1997, pp. 309-312
Authors:
JUNGNICKEL F
MAKAROV S
CHILLA E
FROHLICH HJ
Citation: F. Jungnickel et al., AL AS GAAS LAYERED STRUCTURES FOR SAW SENSORS, Sensors and actuators. A, Physical, 61(1-3), 1997, pp. 313-318
Authors:
CHILLA E
HESJEDAL T
FROHLICH HJ
Citation: E. Chilla et al., NANOSCALE DETERMINATION OF PHASE-VELOCITY BY SCANNING ACOUSTIC FORCE MICROSCOPY, Physical review. B, Condensed matter, 55(23), 1997, pp. 15852-15855
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC FORCE MICROSCOPE INVESTIGATIONS OF SURFACE ACOUSTIC-WAVES, Surface and interface analysis, 25(7-8), 1997, pp. 569
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., HIGH-RESOLUTION VISUALIZATION OF ACOUSTIC-WAVE FIELDS WITHIN SURFACE-ACOUSTIC-WAVE DEVICES, Applied physics letters, 70(11), 1997, pp. 1372-1374
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., DIRECT VISUALIZATION OF THE OSCILLATION OF AU(111) SURFACE ATOMS, Applied physics letters, 69(3), 1996, pp. 354-356
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC FORCE MICROSCOPE MEASUREMENTS ON GRATING-LIKE ELECTRODES, Applied physics A: Materials science & processing, 61(3), 1995, pp. 237-242
Authors:
ENDERLEIN J
MAKAROV S
CHILLA E
FROHLICH HJ
Citation: J. Enderlein et al., MASS SENSITIVITY OF TEMPERATURE-STABILIZED SURFACE-ACOUSTIC-WAVE DELAY-LINES ON GAAS, Sensors and actuators. B, Chemical, 24(1-3), 1995, pp. 65-68
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., PROBING OF OSCILLATING SURFACES BY A SCANNING ACOUSTIC TUNNELING MICROSCOPE, Thin solid films, 264(2), 1995, pp. 226-229
Authors:
MAKAROV S
CHILLA E
FROHLICH HJ
Citation: S. Makarov et al., DETERMINATION OF ELASTIC-CONSTANTS OF THIN-FILMS FROM PHASE-VELOCITY DISPERSION OF DIFFERENT SURFACE-ACOUSTIC-WAVE MODES, Journal of applied physics, 78(8), 1995, pp. 5028-5034
Authors:
CHILLA E
ROHRBECK W
FROHLICH HJ
KOCH R
RIEDER KH
Citation: E. Chilla et al., SCANNING-TUNNELING-MICROSCOPY OF RF OSCILLATING SURFACES, Annalen der Physik, 3(1), 1994, pp. 21-27
Authors:
ENDERLEIN J
CHILLA E
FROHLICH HJ
Citation: J. Enderlein et al., COMPARISON OF THE MASS SENSITIVITY OF LOVE AND RAYLEIGH-WAVES IN A 3-LAYER SYSTEM, Sensors and actuators. A, Physical, 42(1-3), 1994, pp. 472-475
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1-17
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