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Results: 1-23 |
Results: 23

Authors: Weima, JA Fahrner, WR Job, R
Citation: Ja. Weima et al., Experimental investigation of the parameter dependency of the removal rateof thermochemically polished CVD diamond films, J SOL ST EL, 5(2), 2001, pp. 112-118

Authors: Job, R Ulyashin, AG Fahrner, WR
Citation: R. Job et al., The evolution of hydrogen molecule formation in hydrogen-plasma-treated Czochralski silicon, MAT SC S PR, 4(1-3), 2001, pp. 257-260

Authors: Ulyashin, AG Job, R Fahrner, WR Mudryi, AV Patuk, AI Shakin, IA
Citation: Ag. Ulyashin et al., Low-temperature photoluminescence characterization of hydrogen- and helium-implanted silicon, MAT SC S PR, 4(1-3), 2001, pp. 297-299

Authors: Job, R Ulyashin, AG Fahrner, WR Ivanov, AI Palmetshofer, L
Citation: R. Job et al., Oxygen and hydrogen accumulation at buried implantation-damage layers in hydrogen- and helium-implanted Czochralski silicon, APPL PHYS A, 72(3), 2001, pp. 325-332

Authors: Hussein, R Borchert, D Grabosch, G Fahrner, WR
Citation: R. Hussein et al., Dark I-V-T measurements and characteristics of (n) a-Si/(p) c-Si heterojunction solar cells, SOL EN MAT, 69(2), 2001, pp. 123-129

Authors: Fahrner, WR Werner, MR
Citation: Wr. Fahrner et Mr. Werner, Guest editorial - Special section on microsensors and microsystems in harsh environments, IEEE IND E, 48(2), 2001, pp. 247-248

Authors: Werner, MR Fahrner, WR
Citation: Mr. Werner et Wr. Fahrner, Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications, IEEE IND E, 48(2), 2001, pp. 249-257

Authors: Schutze, J Ilgen, H Fahrner, WR
Citation: J. Schutze et al., An integrated micro cooling system for electronic circuits, IEEE IND E, 48(2), 2001, pp. 281-285

Authors: Lorenzen, D Bonhaus, J Fahrner, WR Kaulfersch, E Worner, E Koidl, P Unger, K Muller, D Rolke, S Schmidt, H Grellmann, M
Citation: D. Lorenzen et al., Micro thermal management of high-power diode laser bars, IEEE IND E, 48(2), 2001, pp. 286-297

Authors: Melnikov, A Rusetsky, M Varichenko, V Skuratov, V Zaitsev, A Fahrner, WR Partyka, J Wegierek, P
Citation: A. Melnikov et al., The influence of high energy krypton ion irradiation on optical and electronic properties of diamond, VACUUM, 63(4), 2001, pp. 725-730

Authors: Zaitsev, AM Burchard, M Meijer, J Stephan, A Burchard, B Fahrner, WR Maresch, W
Citation: Am. Zaitsev et al., Diamond pressure and temperature sensors for high-pressure high-temperature applications, PHYS ST S-A, 185(1), 2001, pp. 59-64

Authors: Weima, JA Job, R Fahrner, WR Kosaca, GC Muller, N Fries, T
Citation: Ja. Weima et al., Surface analysis of ultraprecise polished chemical vapor deposited diamondfilms using spectroscopic and microscopic techniques, J APPL PHYS, 89(4), 2001, pp. 2434-2440

Authors: Weima, JA von Borany, J Kreissig, U Fahrner, WR
Citation: Ja. Weima et al., Quantitative analysis of carbon distribution in steel used for thermochemical polishing of diamond films, J ELCHEM SO, 148(11), 2001, pp. G607-G610

Authors: Weima, JA Zaitsev, AM Job, R Kosaca, G Blum, F Grabosch, G Fahrner, WR Knopp, J
Citation: Ja. Weima et al., Investigation of non-diamond carbon phases and optical centers in thermochemically polished polycrystalline CVD diamond films, J SOL ST EL, 4(8), 2000, pp. 425-434

Authors: Markevich, VP Murin, LI Lindstrom, JL Ulyashin, AG Job, R Fahrner, WR Raiko, V
Citation: Vp. Markevich et al., Hydrogen-plasma-enhanced oxygen precipitation in silicon, J PHYS-COND, 12(49), 2000, pp. 10145-10152

Authors: Ulyashin, AG Ivanov, AI Job, R Fahrner, WR Frantskevich, AV Komarov, FF Kamyshan, AC
Citation: Ag. Ulyashin et al., The hydrogen gettering at post-implantation hydrogen plasma treatments of helium- and hydrogen implanted Czochralski silicon, MAT SCI E B, 73(1-3), 2000, pp. 64-68

Authors: Ulyashin, AG Khorunzhii, IA Job, R Fahrner, WR
Citation: Ag. Ulyashin et al., Characterization of the oxygen distribution in Czochralski silicon using hydrogen-enhanced thermal donor formation, MAT SCI E B, 73(1-3), 2000, pp. 124-129

Authors: Job, R Fahrner, WR Ulyashin, AG
Citation: R. Job et al., Electronic device fabrication by simple hydrogen enhanced thermal donor formation processes in p-type Cz-silicon, MAT SCI E B, 73(1-3), 2000, pp. 197-202

Authors: Weima, JA Job, R Fahrner, WR Zaitsev, AM
Citation: Ja. Weima et al., Low energy carbonaceous and graphite phases on the surfaces of thermochemically polished chemical vapor deposited diamond films, J APPL PHYS, 87(9), 2000, pp. 4553-4557

Authors: Fahrner, WR Grabosch, G Borchert, D Chan, Y Kwong, S Man, K
Citation: Wr. Fahrner et al., Temperature dependency of the intrinsic carrier density of hydrogenated amorphous silicon in MOS structures, J SOL ST EL, 3(5), 1999, pp. 245-250

Authors: Novikov, NV Podoba, AP Shmegera, SV Witek, A Zaitsev, AM Denisenko, AB Fahrner, WR Werner, M
Citation: Nv. Novikov et al., Influence of isotopic content on diamond thermal conductivity, DIAM RELAT, 8(8-9), 1999, pp. 1602-1606

Authors: Ulyashin, AG Ivanov, AI Khorunzhii, IA Job, R Fahrner, WR Komarov, FF Kamyshan, AC
Citation: Ag. Ulyashin et al., Hydrogen redistribution and enhanced thermal donor formation at post implantation annealing of p-type hydrogen implanted Czochralski silicon, MAT SCI E B, 58(1-2), 1999, pp. 91-94

Authors: Fahrner, WR
Citation: Wr. Fahrner, An overview of radiation-matter interactions, INSTABILITIES IN SILICON DEVICES, VOL 3, 1999, pp. 553-637
Risultati: 1-23 |