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Results: 1-25/30
Authors:
BADAWI KF
GOUDEAU P
DURAND N
Citation: Kf. Badawi et al., CONSISTENT INTERPRETATION OF NEGATIVE POI SSONS RATIO REPORTED IN METALLIC MULTILAYERS - ROLE OF STRESS-FREE LATTICE-PARAMETER, EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2(1), 1998, pp. 1-6
Authors:
MENEAU C
ANDREAZZA P
ANDREAZZAVIGNOLLE C
GOUDEAU P
VILLAIN JP
BOULMERLEBORGNE C
Citation: C. Meneau et al., LASER-SURFACE MODIFICATION - STRUCTURAL AND TRIBOLOGICAL STUDIES OF ALN COATINGS, Surface & coatings technology, 101(1-3), 1998, pp. 12-16
Authors:
RACINE B
BENLAHSEN M
ZELLAMA K
GOUDEAU P
ZARRABIAN M
TURBAN G
Citation: B. Racine et al., EFFECT OF THE HYDROGEN ON THE INTRINSIC STRESS IN HYDROGENATED AMORPHOUS-CARBON FILMS DEPOSITED FROM AN ELECTRON-CYCLOTRON-RESONANCE PLASMA, Applied physics letters, 73(22), 1998, pp. 3226-3228
Authors:
RENAULT PO
BADAWI KF
BIMBAULT L
GOUDEAU P
ELKAIM E
LAURIAT JP
Citation: Po. Renault et al., POISSONS RATIO MEASUREMENT IN TUNGSTEN THIN-FILMS COMBINING AN X-RAY DIFFRACTOMETER WITH IN-SITU TENSILE TESTER, Applied physics letters, 73(14), 1998, pp. 1952-1954
Authors:
AUZARY S
BADAWI KF
BIMBAULT L
RABIER J
GABORIAUD RJ
GOUDEAU P
Citation: S. Auzary et al., AN X-RAY-DIFFRACTION STUDY OF MICROSTRUCT URAL AND MECHANICAL STATE OF SUPERCONDUCTING YBCO THIN-FILM, Journal de physique. III, 7(1), 1997, pp. 35-46
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
MIMAULT J
PROUX O
Citation: L. Bimbault et al., STRUCTURAL-ANALYSIS OF AU-PT MULTILAYERS USING COMPLEMENTARY X-RAY TECHNIQUES, Journal de physique. IV, 6(C7), 1996, pp. 43-51
Authors:
EYMERY JP
KRISHNAN R
GOUDEAU P
Citation: Jp. Eymery et al., A STUDY OF INTERDIFFUSION PHENOMENA IN FE CO-NB-ZR MULTILAYERS/, Journal de physique. IV, 6(C7), 1996, pp. 173-176
Authors:
GOUDEAU P
BADAWI KF
NAUDON A
JAULIN M
DURAND N
BIMBAULT L
BRANGER V
Citation: P. Goudeau et al., NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS, Journal de physique. IV, 6(C4), 1996, pp. 187-196
Authors:
RAHMOUNE M
EYMERY JP
GOUDEAU P
DENANOT MF
Citation: M. Rahmoune et al., A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF INTERFACIAL REACTIONS IN THE FE GAAS SYSTEM/, Thin solid films, 289(1-2), 1996, pp. 261-266
Authors:
BRANGER V
PELOSIN V
BADAWI KF
GOUDEAU P
Citation: V. Branger et al., STUDY OF THE MECHANICAL AND MICROSTRUCTURAL STATE OF PLATINUM THIN-FILMS, Thin solid films, 275(1-2), 1996, pp. 22-24
Authors:
GOUDEAU P
MIMAULT J
GIRARDEAU T
REKLAOUI K
PROUX O
BRANGER V
Citation: P. Goudeau et al., RESIDUAL-STRESSES INFLUENCE ON THE STRUCTURAL EVOLUTION OF CU-MO SOLID-SOLUTIONS STUDIED BY X-RAY-DIFFRACTION, Thin solid films, 275(1-2), 1996, pp. 25-28
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
BRANGER V
DURAND N
Citation: L. Bimbault et al., PROFILE ANALYSIS OF THIN-FILM X-RAY-DIFFRACTION PEAKS, Thin solid films, 275(1-2), 1996, pp. 40-43
Authors:
DURAND N
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., INFLUENCE OF MICROSTRUCTURE ON RESIDUAL-STRESS IN TUNGSTEN THIN-FILMSANALYZED BY X-RAY-DIFFRACTION, Thin solid films, 275(1-2), 1996, pp. 168-171
Authors:
GOUDEAU P
BOUBEKER B
EYMERY JP
BRANGER V
Citation: P. Goudeau et al., X-RAY-DIFFRACTION STUDY OF THE SUBSTRUCTURE MODIFICATION INDUCED BY RESIDUAL-STRESSES DURING THE DEPOSITION PROCESS OF 304L STAINLESS-STEELFILMS, Thin solid films, 275(1-2), 1996, pp. 188-190
Authors:
DURAND N
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., RESIDUAL-STRESSES AND MICROSTRUCTURE IN TUNGSTEN THIN-FILMS ANALYZED BY X-RAY DIFFRACTION-EVOLUTION UNDER ION IRRADIATION, Journal of applied physics, 80(9), 1996, pp. 5021-5027
Authors:
MIMAULT J
GIRARDEAU T
GOUDEAU P
REKLAOUI K
Citation: J. Mimault et al., STRUCTURAL EVOLUTION OF METASTABLE SOLUTI ONS FORMED BY COEVAPORATIONOF THE ELEMENTS CU AND MO, Journal de physique. IV, 5(C3), 1995, pp. 279-284
Authors:
BOUBEKER B
EYMERY JP
GOUDEAU P
SAYOUTY ELH
Citation: B. Boubeker et al., MOSSBAUER-SPECTROSCOPY AND X-RAY-DIFFRACTION STUDY OF 304-L STAINLESS-STEEL THIN-FILMS, Applied radiation and isotopes, 46(6-7), 1995, pp. 725-726
Authors:
ZAYTOUNI M
RIVIERE JP
GOUDEAU P
Citation: M. Zaytouni et al., INFLUENCE OF TEMPERATURE ON THE STRUCTURE OF SIC COATINGS PREPARED BYDYNAMIC ION MIXING, DIAMOND AND RELATED MATERIALS, 4(12), 1995, pp. 1340-1345
Authors:
GOUDEAU P
NAUDON A
VEZIN V
HALIMAOUI A
BOMCHIL G
LAMBERT B
Citation: P. Goudeau et al., CORRELATION BETWEEN THE POROUS SILICON MORPHOLOGY AND THE PHOTOLUMINESCENCE EFFICIENCY - A SAXS STUDY, Physica status solidi. b, Basic research, 190(1), 1995, pp. 63-68
Authors:
PRANEVICIUS L
BADAWI KF
DURAND N
DELAFOND J
GOUDEAU P
Citation: L. Pranevicius et al., RELAXATION OF RESIDUAL-STRESSES IN HIGHLY STRESSED MULTILAYERS INITIATED BY ION IRRADIATION, Surface & coatings technology, 71(3), 1995, pp. 254-258
Authors:
DURAND N
BIMBAULT L
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., MICRODISTORTION MEASUREMENT IN AU TEXTURE D THIN-FILMS BY X-RAY-DIFFRACTION, Journal de physique. III, 4(6), 1994, pp. 1025-1032
Authors:
DURAND N
BADAWI KF
GOUDEAU P
NAUDON A
Citation: N. Durand et al., RESIDUAL-STRESS EVOLUTION IN TUNGSTEN THI N-FILMS UNDER IRRADIATION, Journal de physique. III, 4(1), 1994, pp. 25-34
Authors:
DURAND N
BADAWI KF
DECLEMY A
GOUDEAU P
Citation: N. Durand et al., ORIGIN OF RESIDUAL-STRESS IN A TEXTURED AU THIN-FILM ON A LIF SUBSTRATE, Applied surface science, 81(2), 1994, pp. 119-126
Authors:
BOUBEKER B
EYMERY JP
GOUDEAU P
BOUSLYKHANE K
VILLAIN JP
Citation: B. Boubeker et al., STRUCTURE AND WEAR BEHAVIOR OF BODY-CENTERED 304-L STEEL FILMS PREPARED BY ION-BEAM SPUTTERING, Annales de chimie, 19(7-8), 1994, pp. 377-382
Authors:
GLADYSZEWSKI G
PACAUD J
GOUDEAU P
JAOUEN C
NAUDON A
GRILHE J
Citation: G. Gladyszewski et al., INTERFACE OF THE CU-W MULTILAYERS, Vacuum, 45(2-3), 1994, pp. 285-287