Authors:
Godlewski, M
Goldys, EM
Butcher, KSA
Phillips, MR
Pakula, K
Baranowski, JM
Citation: M. Godlewski et al., Cathodoluminescence investigations of interfaces in InGaN/GaN/sapphire structures, PHYS ST S-B, 228(1), 2001, pp. 179-182
Authors:
Godlewski, M
Mackowski, S
Karczewski, G
Goldys, EM
Phillips, MR
Citation: M. Godlewski et al., Cathodoluminescence studies of self-organized CdTe/ZnTe quantum dot structure grown by MBE: in-plane and in-depth properties of the system, SEMIC SCI T, 16(6), 2001, pp. 493-496
Authors:
Godlewski, M
Goldys, EM
Phillips, MR
Pakula, K
Baranowski, JM
Citation: M. Godlewski et al., Cathodoluminescence and depth-profiling cathodoluminescence studies of interface properties in MOCVD-grown InGaN/GaN/sapphire structures: role of GaNbuffer layer, APPL SURF S, 177(1-2), 2001, pp. 22-31
Citation: Em. Goldys et M. Godlewski, Nonuniform defect distribution in GaN thin films examined by cathodoluminescence, APPL PHYS A, 70(3), 2000, pp. 329-331
Citation: M. Godlewski et al., Auger-type excitation and de-excitation processes in rare earth and transition metal doped semiconductors, J ALLOY COM, 300, 2000, pp. 23-31
Citation: M. Godlewski et al., Microwave-enhanced exciton delocalisation in low-dimensional CdTe/CdMnTe and CdMnTe/CdMgTe quantum well structures, B POL CHEM, 48(4), 2000, pp. 347-354
Authors:
Surkova, TP
Godlewski, M
Swiatek, K
Kaczor, P
Polimeni, A
Eaves, L
Giriat, W
Citation: Tp. Surkova et al., Intra-shell transitions of 3D metal ions (Fe, Co, Ni) in II-VI wide-gap semiconductor alloys, PHYSICA B, 274, 1999, pp. 848-851
Authors:
Szczerbakow, A
Dynowska, E
Swiatek, K
Godlewski, M
Citation: A. Szczerbakow et al., Monocrystalline films of sphalerite-type ZnSe grown by atomic layer epitaxy in a gas flow system, J CRYST GR, 207(1-2), 1999, pp. 148-149
Citation: Aj. Zakrzewski et M. Godlewski, Quantum yield of the Auger-type nonradiative transitions in low-dimensional systems, PHYS ST S-B, 210(2), 1998, pp. 707-710
Authors:
Godlewski, M
Goldys, EM
Phillips, MR
Langer, R
Barski, A
Citation: M. Godlewski et al., Influence of the surface morphology on the yellow and "edge" emissions in wurtzite GaN, APPL PHYS L, 73(25), 1998, pp. 3686-3688