AAAAAA
Results:
1-17
|
Results: 17
Authors:
FUJISHIMA M
AMAKAWA S
HOH K
Citation: M. Fujishima et al., CIRCUIT SIMULATORS AIMING AT SINGLE-ELECTRON INTEGRATION, JPN J A P 1, 37(3B), 1998, pp. 1478-1482
Authors:
AMAKAWA S
MAJIMA H
FUKUI H
FUJISHIMA M
HOH K
Citation: S. Amakawa et al., SINGLE-ELECTRON CIRCUIT SIMULATION, IEICE transactions on electronics, E81C(1), 1998, pp. 21-29
Authors:
IRITA T
TSUJITA T
FUJISHIMA M
HOH K
Citation: T. Irita et al., A SIMPLE CHAOS-GENERATOR FOR NEURON ELEMENT UTILIZING CAPACITANCE-NPN-TRANSISTOR PAIR, Computers & electrical engineering, 24(1-2), 1998, pp. 43-61
Authors:
FUKUI H
FUJISHIMA M
HOH K
Citation: H. Fukui et al., SINGLE-ELECTRON TRANSISTOR IN SILICON-ON-INSULATOR WITH SCHOTTKY-CONTACT TUNNEL BARRIERS, JPN J A P 1, 36(6B), 1997, pp. 4147-4150
Authors:
AMAKAWA S
FUJISHIMA M
HOH K
Citation: S. Amakawa et al., CORRELATED ELECTRON-HOLE TRANSPORT IN CAPACITIVELY-COUPLED ONE-DIMENSIONAL TUNNEL JUNCTION ARRAYS, JPN J A P 1, 36(6B), 1997, pp. 4166-4171
Authors:
FUJISHIMA M
FUKUI H
AMAKAWA S
HOH K
Citation: M. Fujishima et al., PROPOSAL OF A SCHOTTKY-BARRIER SET AIMING AT A FUTURE INTEGRATED DEVICE, IEICE transactions on electronics, E80C(7), 1997, pp. 881-885
Authors:
AMAKAWA S
FUKUI H
FUJISHIMA M
HOH K
Citation: S. Amakawa et al., ESTIMATION OF COTUNNELING IN SINGLE-ELECTRON LOGIC AND ITS SUPPRESSION, JPN J A P 1, 35(2B), 1996, pp. 1146-1150
Authors:
MAYER EA
MUNAKATA J
MANDELKERN M
HOH K
KODNER A
NALIBOFF B
SILVERMAN DHS
Citation: Ea. Mayer et al., CORRELATION OF CORTICAL AND SUBCORTICAL BRAIN ACTIVATION WITH AUTONOMIC RESPONSES TO RECTAL STIMULI IN HUMANS, Gastroenterology, 110(4), 1996, pp. 715-715
Authors:
FUKUI H
FUJISHIMA M
HOH K
Citation: H. Fukui et al., SIMPLE AND STABLE SINGLE-ELECTRON LOGIC UTILIZING TUNNEL-JUNCTION LOAD, JPN J A P 1, 34(2B), 1995, pp. 1345-1350
Authors:
IRITA T
TSUJITA T
FUJISHIMA R
HOH K
Citation: T. Irita et al., PHYSICAL-MECHANISM OF CHAOS IN THYRISTORS AND COUPLED-TRANSISTOR STRUCTURES, JPN J A P 1, 34(2B), 1995, pp. 1409-1412
Authors:
YASUDA Y
HOH K
Citation: Y. Yasuda et K. Hoh, A UNIFIED FIRST RETURN MAP MODEL FOR VARIOUS TYPES OF CHAOS OBSERVED IN THE THYRISTOR, IEICE transactions on fundamentals of electronics, communications and computer science, E78A(5), 1995, pp. 550-552
Authors:
HOH K
KAKIMOTO N
TOYODA T
HANEJI N
Citation: K. Hoh et al., ENHANCED THERMAL-OXIDATION OF SILICON BY OXYGEN JET, Denki Kagaku Oyobi Kogyo Butsuri Kagaku, 63(6), 1995, pp. 460-465
Authors:
DU CH
FUJISHIMA M
HOH K
Citation: Ch. Du et al., CURRENT-INDUCED UNIDIRECTIONAL MIGRATION OF SI AT AL SI CONTACT/, Electronics Letters, 31(24), 1995, pp. 2125-2127
Authors:
HOH K
YASUDA Y
Citation: K. Hoh et Y. Yasuda, ELECTRONIC CHAOS IN SILICON THYRISTOR, JPN J A P 1, 33(1B), 1994, pp. 594-598
Authors:
YASUDA Y
HOH K
Citation: Y. Yasuda et K. Hoh, PERIOD-ADDING CHAOS IN THE SI THYRISTOR, Electronics and communications in Japan. Part 3, Fundamental electronic science, 77(6), 1994, pp. 107-115
Authors:
HONG CF
TOGO M
HOH K
Citation: Cf. Hong et al., REPAIR OF ELECTROMIGRATION-INDUCED VOIDS IN ALUMINUM INTERCONNECTION BY CURRENT REVERSAL, JPN J A P 2, 32(4B), 1993, pp. 624-627
Authors:
YASUDA Y
HOH K
Citation: Y. Yasuda et K. Hoh, INTERMITTENT CHAOS IN THE THYRISTOR, IEICE transactions on fundamentals of electronics, communications and computer science, E76A(7), 1993, pp. 1126-1128
Risultati:
1-17
|