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MAEDA S
YAMAGUCHI Y
KIM IJ
IWAMATSU T
IPPOSHI T
MIYAMOTO S
MAEGAWA S
UEDA K
NII K
MASHIKO K
INOUE Y
NISHIMURA T
MIYOSHI H
Citation: S. Maeda et al., ANALYSIS OF DELAY-TIME INSTABILITY ACCORDING TO THE OPERATING FREQUENCY IN-FIELD SHIELD ISOLATED SOI CIRCUITS, I.E.E.E. transactions on electron devices, 45(7), 1998, pp. 1479-1486
Authors:
EIMORI T
OASHI T
MORISHITA F
IWAMATSU T
YAMAGUCHI Y
OKUDA F
SHIMOMURA K
SHIMANO H
SAKASHITA N
ARIMOTO K
INOUE Y
KOMORI S
INUISHI M
NISHIMURA T
MIYOSHI H
Citation: T. Eimori et al., APPROACHES TO EXTRA LOW-VOLTAGE DRAM OPERATION BY SOI-DRAM, I.E.E.E. transactions on electron devices, 45(5), 1998, pp. 1000-1009
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YASUOKA A
IWAMATSU T
IPPOSHI T
MIYAMOTO S
YAMAGUCHI Y
INOUE Y
MIYOSHI H
Citation: A. Yasuoka et al., SUPPRESSION OF PARASITIC MOSFETS AT LOCOS EDGE REGION IN PARTIALLY DEPLETED SOI MOSFETS, JPN J A P 1, 36(3B), 1997, pp. 1631-1635
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IWAMATSU T
IPPOSHI T
YAMAGUCHI Y
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MAEGAWA S
TSUBOUCHI N
NISHIMURA T
Citation: T. Iwamatsu et al., THE INFLUENCE OF THE BURIED OXIDE DEFECTS ON THE GATE OXIDE RELIABILITY AND DRAIN LEAKAGE CURRENTS OF THE SILICON-ON-INSULATOR METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, JPN J A P 1, 36(12A), 1997, pp. 7104-7109
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IWAMATSU T
YAMAGUCHI Y
IPPOSHI T
MAEGAWA S
INOUE Y
NISHIMURA T
Citation: T. Iwamatsu et al., INVESTIGATION OF ANOMALOUS LEAKAGE CURRENT IN MESA-ISOLATED SOI MOSFETS, IEEE electron device letters, 18(10), 1997, pp. 499-502
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MATSUYAMA K
SATOH M
YUKAWA S
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Citation: T. Iwamatsu, ABBREVIATION OF THE 2ND MEIOTIC DIVISION BY PRECOCIOUS FERTILIZATION IN FISH OOCYTES, The Journal of experimental zoology, 277(6), 1997, pp. 450-459
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IWAMATSU T
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MIYASHITA F
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YAMAGUCHI Y
OASHI T
EIMORI T
IWAMATSU T
MIYAMOTO S
SUMA K
TSURUDA T
MORISHITA F
HIROSE M
HIDAKA H
ARIMOTO K
FUJISHIMA K
INOUE Y
NISHIMURA T
MIYOSHI H
Citation: Y. Yamaguchi et al., FEATURES OF SOI DRAMS AND THEIR POTENTIAL FOR LOW-VOLTAGE AND OR GIGA-BIT SCALE DRAMS/, IEICE transactions on electronics, E79C(6), 1996, pp. 772-780
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Citation: Y. Shibata et T. Iwamatsu, EVIDENCE FOR INVOLVEMENT OF THE EXUDATE RELEASED FROM THE EGG CORTEX IN THE CHANGE IN CHORION PROTEINS AT THE TIME OF EGG ACTIVATION IN ORYZIAS-LATIPES, Zoological science, 13(2), 1996, pp. 271-275
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TAKAHASHI J
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JOACHIM HO
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NISHIMURA T
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IWAMATSU T
YAMAGUCHI Y
INOUE Y
NISHIMURA T
TSUBOUCHI N
Citation: T. Iwamatsu et al., CAD-COMPATIBLE HIGH-SPEED CMOS SIMOX GATE ARRAY USING FIELD-SHIELD ISOLATION/, I.E.E.E. transactions on electron devices, 42(11), 1995, pp. 1934-1939
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Citation: S. Nakashima et T. Iwamatsu, ULTRASTRUCTURAL-CHANGES IN MICROPYLAR AND GRANULOSA-CELLS DURING IN-VITRO OOCYTE MATURATION IN THE MEDAKA, ORYZIAS-LATIPES, The Journal of experimental zoology, 270(6), 1994, pp. 547-556
Authors:
YAMAGUCHI Y
IWAMATSU T
JOACHIM HO
ODA H
INOUE Y
NISHIMURA T
TSUKAMOTO K
Citation: Y. Yamaguchi et al., SOURCE-TO-DRAIN BREAKDOWN VOLTAGE IMPROVEMENT IN ULTRATHIN-FILM SOI MOSFETS USING A GATE-OVERLAPPED LDD STRUCTURE, I.E.E.E. transactions on electron devices, 41(7), 1994, pp. 1222-1226
Authors:
SUMA K
TSURUDA T
HIDAKA H
EIMORI T
OASHI T
YAMAGUCHI Y
IWAMATSU T
HIROSE M
MORISHITA F
ARIMOTO K
FUJISHIMA K
INOUE Y
NISHIMURA T
YOSHIHARA T
Citation: K. Suma et al., AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1323-1329
Authors:
SUMA K
TSURUDA T
HIDAKA H
EIMORI T
OASHI T
YAMAGUCHI Y
IWAMATSU T
HIROSE M
MORISHITA F
ARIMOTO K
FUJISHIMA K
INOUE Y
NISHIMURA T
YOSHIHARA T
Citation: K. Suma et al., AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1323-1329