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Results: 1-25/38
Authors:
BARRADAS NP
JEYNES C
HOMEWOOD KP
SEALY BJ
MILOSAVLJEVIC M
Citation: Np. Barradas et al., RBS SIMULATED ANNEALING ANALYSIS OF SILICIDE FORMATION IN FE/SI SYSTEMS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 235-238
Authors:
BARRADAS NP
JEYNES C
MIRONOV OA
PHILLIPS PJ
PARKER EHC
Citation: Np. Barradas et al., HIGH DEPTH RESOLUTION RUTHERFORD BACKSCATTERING ANALYSIS OF SI-SI0.78GE0.22 (001)SI SUPERLATTICES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 239-243
Authors:
NEJIM A
BARRADAS NP
JEYNES C
CRISTIANO F
WENDLER E
GARTNER K
SEALY BJ
Citation: A. Nejim et al., RESIDUAL POST ANNEAL DAMAGE OF GE-COIMPLANTATION AND C-COIMPLANTATIONOF SI DETERMINED BY QUANTITATIVE RBS-CHANNELING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 244-248
Authors:
BARRADAS NP
MARRIOTT PK
JEYNES C
WEBB RP
Citation: Np. Barradas et al., THE RBS DATA FURNACE - SIMULATED ANNEALING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1157-1162
Authors:
BARRADAS NP
JEYNES C
HARRY MA
Citation: Np. Barradas et al., RBS SIMULATED ANNEALING ANALYSIS OF IRON-COBALT SILICIDES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1163-1167
Authors:
BARRADAS NP
JEYNES C
JACKSON SM
Citation: Np. Barradas et al., RBS SIMULATED ANNEALING ANALYSIS OF BURIED SICOX LAYERS FORMED BY IMPLANTATION OF O INTO CUBIC SILICON-CARBIDE/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1168-1171
Authors:
JEYNES C
BARRADAS NP
BLEWETT MJ
WEBB RP
Citation: C. Jeynes et al., IMPROVED ION-BEAM ANALYSIS FACILITIES AT THE UNIVERSITY-OF-SURREY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1229-1234
Authors:
KOZANECKI A
JEYNES C
SEALY BJ
NEJIM A
Citation: A. Kozanecki et al., ION-BEAM ANALYSIS OF 6H SIC IMPLANTED WITH ERBIUM AND YTTERBIUM IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1272-1276
Authors:
SEALY B
GWILLIAM R
SHANNON J
JEYNES C
ANGELOV C
TSVETKOVA T
Citation: B. Sealy et al., SURFACE ELECTRICAL-CONDUCTIVITY OF CO-IMPLANTED A-SIC-H FILMS(), Vacuum, 51(2), 1998, pp. 281-284
Authors:
BIBIC N
MILOSAVLJEVIC M
PERUSKO D
JEYNES C
Citation: N. Bibic et al., INVESTIGATION OF ION-BEAM MIXING EFFECTS IN TA PD BILAYERS DEPOSITED ON SI/, Thin solid films, 317(1-2), 1998, pp. 274-277
Authors:
NEJIM A
KNIGHTS AP
JEYNES C
COLEMAN PG
PATEL CJ
Citation: A. Nejim et al., PROFILE BROADENING OF HIGH-DOSE GERMANIUM IMPLANTS INTO (100)SILICON AT ELEVATED-TEMPERATURES DUE TO CHANNELING, Journal of applied physics, 83(7), 1998, pp. 3565-3573
Authors:
KOZANECKI A
STEPIKHOVA M
LANZERSTORFER S
JANTSCH W
PALMETSHOFER L
SEALY BJ
JEYNES C
Citation: A. Kozanecki et al., EXCITATION OF ER3+ IONS IN SILICON DIOXIDE FILMS THERMALLY GROWN ON SILICON, Applied physics letters, 73(20), 1998, pp. 2929-2931
Authors:
OSASONA O
DJEBAH A
OJO IAO
ELERUJA MA
ADEDEJI AV
JEYNES C
AJAYI EOB
Citation: O. Osasona et al., PREPARATION AND CHARACTERIZATION OF MOCVD THIN-FILMS OF ZINC-SULFIDE, Optical materials, 7(3), 1997, pp. 109-115
Authors:
KOZANECKI N
JANTSCH W
HEIS W
PRECHTL G
SEALY BJ
JEYNES C
Citation: N. Kozanecki et al., INFRARED LUMINESCENCE IN ER AND ER+O IMPLANTED 6H SIC, Acta Physica Polonica. A, 92(5), 1997, pp. 879-882
Authors:
MURTAGH M
LYNCH SM
KELLY PV
HILDEBRANT S
HERBERT PAF
JEYNES C
CREAN GM
Citation: M. Murtagh et al., PHOTOREFLECTANCE CHARACTERIZATION OF AR+ ION ETCHED AND SICL4 REACTIVE ION ETCHED SILICON(100), Materials science and technology, 13(11), 1997, pp. 961-964
Authors:
DESOUZA RA
KILNER JA
JEYNES C
Citation: Ra. Desouza et al., THE APPLICATION OF SECONDARY-ION MASS-SPECTROMETRY (SIMS) TO THE STUDY OF HIGH-TEMPERATURE PROTON CONDUCTORS (HTPC), Solid state ionics, 97(1-4), 1997, pp. 409-419
Authors:
JEYNES C
JAFRI ZH
WEBB RP
KIMBER AC
ASHWIN MJ
Citation: C. Jeynes et al., ACCURATE RBS MEASUREMENTS OF THE INDIUM CONTENT OF INGAAS THIN-FILMS, Surface and interface analysis, 25(4), 1997, pp. 254-260
Authors:
MIRONOV OA
PHILLIPS PJ
PARKER EHC
DOWSETT MG
BARRADAS NP
JEYNES C
MIRONOV M
GNEZDILOV VP
USHAKOV V
EREMENKO VV
Citation: Oa. Mironov et al., STRUCTURAL AND OPTICAL CHARACTERIZATION OF UNDOPED SI-SI0.78GE0.22 SI(001) SUPERLATTICES GROWN BY MBE/, Thin solid films, 306(2), 1997, pp. 307-312
Authors:
BARRADAS NP
JEYNES C
WEBB RP
Citation: Np. Barradas et al., SIMULATED ANNEALING ANALYSIS OF RUTHERFORD BACKSCATTERING DATA, Applied physics letters, 71(2), 1997, pp. 291-293
Authors:
LI YP
KILNER JA
TATE TJ
CHATER RJ
JEYNES C
JAFRI ZH
Citation: Yp. Li et al., SIMS, RBS, AND ION CHANNELING STUDIES OF H-2(-18(+) IRRADIATED LAALO3, (100) SINGLE-CRYSTAL() OR O), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 133-138
Authors:
JEYNES C
PUTTICK KE
WHITMORE LC
GARTNER K
GEE AE
MILLEN DK
WEBB RP
PEEL RMA
SEALY BJ
Citation: C. Jeynes et al., LATERALLY RESOLVED CRYSTALLINE DAMAGE IN SINGLE-POINT-DIAMOND-TURNED SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 431-436
Authors:
STOJANOVIC M
JEYNES C
BIBIC N
MILOSAVLJEVIC M
VASIC A
MILOSEVIC Z
Citation: M. Stojanovic et al., FREQUENCY NOISE-LEVEL OF AS ION-IMPLANTED TIN-TI-SI STRUCTURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 115(1-4), 1996, pp. 554-556
Authors:
STOJANOVIC M
VASIC A
JEYNES C
Citation: M. Stojanovic et al., ION-IMPLANTED SILICIDES STUDIES BY FREQUENCY NOISE-LEVEL MEASUREMENTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 192-195
Authors:
WILSON IH
CHEN YJ
XU JB
DEVINE RAB
JEYNES C
Citation: Ih. Wilson et al., ION IMPACTS AND NANOSTRUCTURES ON GE(111), IN0.22GA0.78AS GAAS(100) AND ALPHA-QUARTZ SURFACES OBSERVED BY ATOMIC-FORCE MICROSCOPY/, Surface and interface analysis, 24(13), 1996, pp. 881-886
Authors:
LI YP
KILNER JA
THOMAS J
LACEY D
COHEN LF
CAPLIN AD
LI YH
SABA FM
QUINCEY PG
SOMEKH RE
JEYNES C
JAFRI ZH
Citation: Yp. Li et al., CHARACTERIZATION OF YBA2CU3O7-DELTA THIN-FILMS DEPOSITED BY DC MAGNETRON SPUTTERING, Journal of Materials Science, 31(23), 1996, pp. 6137-6144