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Results: 1-25/30
Authors:
Kang, DJ
Speaks, R
Peng, NH
Webb, R
Jeynes, C
Booij, WE
Tarte, EJ
Moore, DF
Blamire, MG
Citation: Dj. Kang et al., Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta, IEEE APPL S, 11(1), 2001, pp. 780-783
Authors:
Kahlmann, F
Booij, WE
Blamire, MG
McBrien, PF
Peng, NH
Jeynes, C
Romans, EJ
Pegrum, CM
Tarte, EJ
Citation: F. Kahlmann et al., Performance of high-T-c dc SQUID magnetometers with resistively shunted inductances compared to "unshunted" devices, IEEE APPL S, 11(1), 2001, pp. 916-919
Authors:
Jeynes, C
Citation: C. Jeynes, ... and against ..., PHYS WORLD, 14(8), 2001, pp. 19-19
Authors:
Breese, MBH
de Kerckhove, DG
Jeynes, C
Peel, RMA
Murray, CW
Citation: Mbh. Breese et al., An electrostatic beam rocking system on the Surrey nuclear microprobe, NUCL INST B, 181, 2001, pp. 54-59
Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films
Authors:
Peng, NH
Jeynes, C
Webb, RP
Chakarov, IR
Blamire, MG
Citation: Nh. Peng et al., Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films, NUCL INST B, 178, 2001, pp. 242-246
Authors:
Milosavljevic, M
Shao, G
Gwilliam, RM
Jeynes, C
McKinty, CN
Homewood, KP
Citation: M. Milosavljevic et al., Properties of beta-FeSi2 grown by combined ion irradiation and annealing of Fe/Si bilayers, NUCL INST B, 175, 2001, pp. 309-313
Authors:
Vieira, A
Barradas, NP
Jeynes, C
Citation: A. Vieira et al., Error performance analysis of artificial neural networks applied to Rutherford backscattering, SURF INT AN, 31(1), 2001, pp. 35-38
Authors:
Ross, GJ
Barradas, NP
Hill, MP
Jeynes, C
Morrissey, P
Watts, JF
Citation: Gj. Ross et al., Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride), J MATER SCI, 36(19), 2001, pp. 4731-4738
Authors:
Surkova, T
Patane, A
Eaves, L
Main, PC
Henini, M
Polimeni, A
Knights, AP
Jeynes, C
Citation: T. Surkova et al., Indium interdiffusion in annealed and implanted InAs/(AlGa)As self-assembled quantum dots, J APPL PHYS, 89(11), 2001, pp. 6044-6047
Authors:
Milosavljevic, M
Shao, G
Bibic, N
McKinty, CN
Jeynes, C
Homewood, KP
Citation: M. Milosavljevic et al., Amorphous-iron disilicide: A promising semiconductor, APPL PHYS L, 79(10), 2001, pp. 1438-1440
Authors:
Peaker, AR
Evans-Freeman, JH
Kan, PYY
Hawkins, ID
Terry, J
Jeynes, C
Rubaldo, L
Citation: Ar. Peaker et al., Vacancy-related defects in ion implanted and electron irradiated silicon, MAT SCI E B, 71, 2000, pp. 143-147
Authors:
Peng, NH
Chakarov, I
Jeynes, C
Webb, R
Booij, W
Blamire, M
Kelly, M
Citation: Nh. Peng et al., 2D Monte Carlo simulation of proton implantation of superconducting YBa2Cu3O7-delta thin films through high aspect ratio Nb masks, NUCL INST B, 164, 2000, pp. 979-985
Authors:
Jeynes, C
Barradas, NP
Wilde, JR
Greer, AL
Citation: C. Jeynes et al., Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data, NUCL INST B, 161, 2000, pp. 287-292
Authors:
Emerson, NG
Gwilliam, RM
Shannon, JM
Jeynes, C
Sealy, BJ
Tsvetkova, T
Tzenov, N
Tzolov, M
Dimova-Malinovska, D
Citation: Ng. Emerson et al., Electrical and optical properties of Co+ ion implanted a-Si1-xCx : H alloys, NUCL INST B, 160(4), 2000, pp. 505-509
Authors:
Jeynes, C
Barradas, NP
Rafla-Yuan, H
Hichwa, BP
Close, R
Citation: C. Jeynes et al., Accurate depth profiling of complex optical coatings, SURF INT AN, 30(1), 2000, pp. 237-242
Authors:
Kahlmann, F
Booij, WE
Blamire, MG
McBrien, PF
Tarte, EJ
Peng, NH
Jeynes, C
Romans, EJ
Pegrum, CM
Citation: F. Kahlmann et al., Transfer function and noise properties of YBa2Cu3O7-delta direct-current superconducting-quantum-interference-device magnetometers with resistively shunted inductances, APPL PHYS L, 77(4), 2000, pp. 567-569
Authors:
Booij, WE
Elwell, CA
Tarte, EJ
McBrien, PF
Kahlmann, F
Moore, DF
Blamire, MG
Peng, NH
Jeynes, C
Citation: We. Booij et al., Electrical properties of electron and ion beam irradiated YBa2Cu3O7-delta, IEEE APPL S, 9(2), 1999, pp. 2886-2889
Authors:
Taylor, JW
Saleh, AS
Rice-Evans, PC
Knights, AP
Jeynes, C
Citation: Jw. Taylor et al., Depth profiling of defects in nitrogen implanted silicon using a slow positron beam, APPL SURF S, 149(1-4), 1999, pp. 175-180
Authors:
Toal, SJ
Reehal, HS
Barradas, NP
Jeynes, C
Citation: Sj. Toal et al., Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD, APPL SURF S, 139, 1999, pp. 424-428
Authors:
Barradas, NP
Jeynes, C
Webb, RP
Kreissig, U
Grotzschel, R
Citation: Np. Barradas et al., Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing, NUCL INST B, 149(1-2), 1999, pp. 233-237
Authors:
Way, AS
Jeynes, C
Webb, RP
Citation: As. Way et al., Measurement of lateral stress in argon implanted thin gold films using quartz resonator techniques, NUCL INST B, 148(1-4), 1999, pp. 238-241
Authors:
Barradas, NP
Almeida, SA
Jeynes, C
Knights, AP
Silva, SRP
Sealy, BJ
Citation: Np. Barradas et al., RES and ERDA study of ion beam synthesised amorphous gallium nitride, NUCL INST B, 148(1-4), 1999, pp. 463-467
Authors:
Kozanecki, A
Jeynes, C
Barradas, NP
Sealy, BJ
Jantsch, W
Citation: A. Kozanecki et al., The influence of implantation and annealing conditions on optical activityof Er3+ ions in 6H SiC, NUCL INST B, 148(1-4), 1999, pp. 512-516
Authors:
Riley, LS
Hall, S
Harris, J
Fernandez, J
Gallas, B
Evans, AGR
Clarke, JF
Humphrey, J
Murray, RT
Jeynes, C
Citation: Ls. Riley et al., SiGe nMOSFETs with gate oxide grown by low temperature plasma anodisation, MICROEL ENG, 48(1-4), 1999, pp. 227-230
Authors:
Barradas, NP
Knights, AP
Jeynes, C
Mironov, OA
Grasby, TJ
Parker, EHC
Citation: Np. Barradas et al., High-depth-resolution Rutherford backscattering data and error analysis ofSiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms, PHYS REV B, 59(7), 1999, pp. 5097-5105