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Results:
1-21
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Results: 21
Authors:
STRBIK V
CHROMIK S
JERGEL M
MACHAJDIK D
BENACKA S
KOBZEV AP
Citation: V. Strbik et al., FLUX-CREEP MECHANISM OF CRITICAL-CURRENT LIMITATION IN TL-BASED THIN-FILM MICROSTRIPS, Journal of superconductivity, 11(1), 1998, pp. 65-66
Authors:
POPOV YP
SEDYSHEV PV
GUNDORIN NA
SEDYSHEVA MV
KOBZEV AP
PARZHITSKY SS
Citation: Yp. Popov et al., ANALYSIS OF NEUTRON-SPECTRA IN THE 2-100 KEV ENERGY-RANGE BY GAMMA-SPECTROMETRY OF HIGH HIGH-CLASS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(5), 1998, pp. 882-886
Authors:
HOTOVY I
HURAN J
JANIK J
KOBZEV AP
Citation: I. Hotovy et al., DEPOSITION AND PROPERTIES OF NICKEL-OXIDE FILMS PRODUCED BY DC REACTIVE MAGNETRON SPUTTERING, Vacuum, 51(2), 1998, pp. 157-160
Authors:
SAFRANKOVA J
HURAN J
HOTOVY I
KOBZEV AP
KORENEV SA
Citation: J. Safrankova et al., CHARACTERIZATION OF NITROGEN-DOPED AMORPHOUS-SILICON CARBIDE THIN-FILMS, Vacuum, 51(2), 1998, pp. 165-167
Authors:
HURAN J
SAFRANKOVA J
KOBZEV AP
Citation: J. Huran et al., PREPARATION OF HYDROGENATED AMORPHOUS-SILICON CARBIDE THIN-FILMS BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, Vacuum, 50(1-2), 1998, pp. 103-105
Authors:
TRETYAKOVA SP
MIKHEEV VL
KOBZEV AP
GOLOVCHENKO AN
PONOMARENKO VA
TIMOFEEVA OV
SHIGIN VA
HUSSONNOIS M
Citation: Sp. Tretyakova et al., EFFECT OF HIGH ALPHA-PARTICLE FLUENCES ON PHOSPHATE-GLASS DETECTORS, Instruments and experimental techniques, 41(4), 1998, pp. 493-495
Authors:
SADOWSKI M
SZYDLOWSKI A
JASKOLA M
CZYZEWSKI T
KOBZEV AP
Citation: M. Sadowski et al., COMPARISON OF RESPONSES OF CR-39, PM-355, AND CN TRACK DETECTORS TO ENERGETIC HYDROGEN-IONS, HELIUM-IONS, NITROGEN-IONS, AND OXYGEN-IONS, Radiation measurements, 28(1-6), 1997, pp. 207-210
Authors:
LALINSKY T
OSVALD J
MACHAJDIK D
MOZOLOVA Z
SISOLAK J
CONSTANTINIDIS G
KOBZEV AP
Citation: T. Lalinsky et al., HIGH-TEMPERATURE STABLE IR-AL N-GAAS SCHOTTKY DIODES - EFFECT OF THE BARRIER HEIGHT CONTROLLING/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 657-661
Authors:
ZAVODCHIKOV VM
KOBZEV AP
KRYUCHKOV YY
PICHUGIN VF
SOKHOREVA VV
FRANGULYAN TS
Citation: Vm. Zavodchikov et al., DETERMINATION OF THE COMPOSITION OF ION-I MPLANTED MGO SURFACE-LAYERSBY THE RUTHERFORD AND RESONANCE ION BACKSCATTERING METHOD, Pis'ma v Zurnal tehniceskoj fiziki, 22(1), 1996, pp. 7-11
Authors:
CZYZEWSKI T
GLOWACKA L
JASKOLA M
BRAZIEWICZ J
PAJEK M
SEMANIAK J
HALLER M
KARSCHNICK R
KRETSCHMER W
KOBZEV AP
TRAUTMANN D
Citation: T. Czyzewski et al., M-SHELL X-RAY-PRODUCTION BY C, N AND O IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 52-58
Authors:
HURAN J
HRUBCIN L
KOBZEV AP
LIDAY J
Citation: J. Huran et al., PROPERTIES OF AMORPHOUS-SILICON CARBIDE FILMS PREPARED BY PECVD, Vacuum, 47(10), 1996, pp. 1223-1225
Authors:
FROHLICH K
SOUC J
MACHAJDIK D
KOBZEV AP
WEISS F
SENATEUR JP
DAHMEN KH
Citation: K. Frohlich et al., PROPERTIES OF THIN EPITAXIAL AEROSOL MOCVD CEO2 FILMS GROWN ON (1102)SAPPHIRE, Journal de physique. IV, 5(C5), 1995, pp. 533-540
Authors:
FROHLICH K
SOUC J
MACHAJDIK D
KOBZEV AP
WEISS F
SENATEUR JP
DAHMEN KH
Citation: K. Frohlich et al., PROPERTIES OF THIN EPITAXIAL AEROSOL MOCVD CEO2 FILMS GROWN ON (1(1)OVER-BAR-02)SAPPHIRE, Journal de physique. IV, 5(C5), 1995, pp. 533-540
Authors:
SEMANIAK J
BRAZIEWICZ J
CZYZEWSKI T
GLOWACKA L
HALLER M
JASKOLA M
KARSCHNICK R
KOBZEV AP
PAJEK M
KRETSCHMER W
TRAUTMANN D
Citation: J. Semaniak et al., L-SUBSHELL IONIZATION BY N-14 IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 86(1-2), 1994, pp. 185-189
Authors:
HRUBCIN L
HURAN J
SANDRIK R
KOBZEV AP
SHIROKOV DM
Citation: L. Hrubcin et al., APPLICATION OF THE ERD METHOD FOR HYDROGEN DETERMINATION IN SILICON (OXY)NITRIDE THIN-FILMS PREPARED BY ECR PLASMA DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 60-62
Authors:
DUVANOV SM
KOBZEV AP
TOLOPA AM
SHIROKOV DM
Citation: Sm. Duvanov et al., INVESTIGATION OF THE ELEMENTS DEPTH PROFILES IN SURFACE-LAYERS OF GLASS MODIFIED BY ION-BEAM-ASSISTED DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 264-267
Authors:
CHERNENKO LP
KOBZEV AP
KORNEEV DA
SHIROKOV DM
Citation: Lp. Chernenko et al., CHANGES IN-DEPTH PROFILES OF OXYGEN AND COPPER IN Y-BA-CU-O FILM UNDER ANNEALING, Mikrochimica acta, 114, 1994, pp. 239-245
Authors:
CHERNENKO LP
KOBZEV AP
KORNEEV DA
SHIROKOV DM
Citation: Lp. Chernenko et al., DAMAGE IN Y-BA-CU-O FILMS PRODUCED BY HE-4 IONS, Mikrochimica acta, 114, 1994, pp. 247-254
Authors:
SEMANIAK J
BRAZIEWICZ J
PAJEK M
KOBZEV AP
TRAUTMANN D
Citation: J. Semaniak et al., L-SUBSHELL IONIZATION OF HEAVY-ELEMENTS BY HE-3 AND HE-4 IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 63-67
Authors:
SANDRIK R
KOBZEV AP
SHIROKOV DM
KLIMENT V
Citation: R. Sandrik et al., APPLICATION OF PIXE AND RBS METHODS IN THE ANALYSIS OF THIN-FILMS OF HIGH-TC SUPERCONDUCTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 392-396
Authors:
VERBITSKAYA EM
EREMIN VK
KOBZEV AP
KONNIKOV SG
STROKAN NB
SHIROKOV DM
Citation: Em. Verbitskaya et al., ANALYSIS OF DEFECT DISTRIBUTION IN YBA2CU 307 EPITAXIAL-FILMS BY THE ION CHANNELING METHOD, Zurnal tehniceskoj fiziki, 63(5), 1993, pp. 111-116
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