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Results: 1-25 | 26-46
Results: 1-25/46

Authors: Singh, R Arora, SK Kanjilal, D
Citation: R. Singh et al., Swift heavy ion irradiation induced modification of electrical characteristics of Au/n-Si Schottky barrier diode, MAT SC S PR, 4(5), 2001, pp. 425-432

Authors: Padiyan, DP Muthukrishnan, C Ethilton, SJ Mohanlal, SK Dhanuskodi, S Kanjilal, D Asokan, K
Citation: Dp. Padiyan et al., Effect of heavy ion irradiation in RbKBrCl quaternary system: EPR study ofradiation induced defects, RADIAT EFF, 154(2), 2001, pp. 141-149

Authors: Singh, R Arora, SK Singh, JP Tyagi, R Agarwal, SK Kanjilal, D
Citation: R. Singh et al., Experimental investigation of 200 MeV Ag-107(14+) ion induced modifications in n-GaAs epitaxial layer by in situ resistivity and Hall measurements, MAT SCI E B, 86(3), 2001, pp. 228-231

Authors: Singh, JP Singh, R Mishra, NC Ganesan, V Kanjilal, D
Citation: Jp. Singh et al., Nanoscale defect formation on InP surface by swift gold ion impact, NUCL INST B, 179(1), 2001, pp. 37-41

Authors: Narayanan, KL Yamaguchi, M Dharmarasu, N Kojima, N Kanjilal, D
Citation: Kl. Narayanan et al., Low energy ion implantation and high energy heavy ion irradiation in C-60 films, NUCL INST B, 178, 2001, pp. 301-304

Authors: Tripathi, A Singh, JP Ahuja, R Dutt, RN Kanjilal, D Guha, A Biswas, A Raychaudhuri, AK
Citation: A. Tripathi et al., Development of an in situ ultra-high-vacuum scanning tunneling microscope in the beamline of the 15 MV tandem accelerator for studies of surface modification by a swift heavy ion beam, REV SCI INS, 72(10), 2001, pp. 3884-3890

Authors: Singh, JP Singh, R Mishra, NC Kanjilal, D Ganesan, V
Citation: Jp. Singh et al., Temperature-dependent roughness of electronically excited InP surfaces, J APPL PHYS, 90(12), 2001, pp. 5968-5972

Authors: Sarkar, A Ghosh, S Barua, P Joshi, R Ahuja, R Rao, S Krishnan, SA Malyadri, AJ Kumar, R Gargari, S Chopra, S Kanjilal, D Datta, SK Roy, A Bhowmik, RK Tilbrook, IR Clifft, BE
Citation: A. Sarkar et al., Single-gap multi-harmonic buncher for NSC pelletron, I J PA PHYS, 39(1-2), 2001, pp. 15-19

Authors: Kanjilal, D Madhu, T Rodrigues, GO Rao, UK Safvan, CP Roy, A
Citation: D. Kanjilal et al., Development of a low energy ion beam facility at NSC, I J PA PHYS, 39(1-2), 2001, pp. 25-28

Authors: Gargari, S Chopra, S Joshi, R Ojha, S Sota, M Barua, P Patel, V Prasad, J Kumar, R Singh, B Panwar, NS Singh, MP Datta, SK Kanjilal, D
Citation: S. Gargari et al., Vacuum leak problem in low energy of pelletron, I J PA PHYS, 39(1-2), 2001, pp. 78-80

Authors: Chopra, S Pawar, NS Singh, MP Kumar, R Prasad, J Patel, VP Pal, R Kumar, B Ojha, S Sota, M Barua, P Gargari, S Joshi, R Kanjilal, D Datta, SK
Citation: S. Chopra et al., Improvement in gas stripping capability by installation of turbo molecularpump system in the terminal of 15 UD pelletron, I J PA PHYS, 39(1-2), 2001, pp. 84-86

Authors: Joshi, R Patel, V Barua, P Sota, M Gargari, S Panwar, NS Singh, B Singh, MP Kumar, R Prasad, J Chopra, S Datta, SK Kanjilal, D
Citation: R. Joshi et al., Modifications and developments done for the problems encountered in NSC pelletron, I J PA PHYS, 39(1-2), 2001, pp. 87-95

Authors: Jayavel, P Asokan, K Kanjilal, D Kumar, J
Citation: P. Jayavel et al., Investigations on the annealing behavior of high-energy carbon irradiated Au/n-GaAs Schottky barrier diodes, MAT SC S PR, 3(3), 2000, pp. 195-199

Authors: Singh, R Arora, SK Singh, JP Singh, F Kanjilal, D
Citation: R. Singh et al., Effect of swift heavy ion irradiation on the electrical characteristics ofAg/n-Si Schottky diode, I J ENG M S, 7(5-6), 2000, pp. 298-302

Authors: Singh, JP Mishra, NC Singh, R Singh, F Ganesan, V Kanjilal, D
Citation: Jp. Singh et al., Ion beam induced mass transport and correlated structure formation on semiconductor surfaces, I J ENG M S, 7(5-6), 2000, pp. 310-319

Authors: Narsale, AM Damle, AR Ali, YP Kanjilal, D Arora, BM Shah, AP Lokhre, SG Salvi, VP
Citation: Am. Narsale et al., Annealing effects on electrical characteristics of 100 MeV Si-28 implantation in GaAs, J MAT S-M E, 11(5), 2000, pp. 439-443

Authors: Banerjee, T Kumar, R Kanjilal, D Ramasamy, S
Citation: T. Banerjee et al., Fluctuation induced conductivity studies of 100 MeV oxygen ion irradiated Pb doped Bi-2223 superconductors, PHYSICA C, 341, 2000, pp. 1185-1186

Authors: Singh, R Arora, SK Tyagi, R Agarwal, SK Kanjilal, D
Citation: R. Singh et al., Temperature dependence of current-voltage characteristics of Au/n-GaAs epitaxial Schottky diode, B MATER SCI, 23(6), 2000, pp. 471-474

Authors: Damle, AR Narsale, AM Ali, YP Arora, BM Gokhale, MR Kanjilal, D Salvi, VP
Citation: Ar. Damle et al., Near-infrared transmission characteristics of GaAs implanted with high energy (100 Mev) Si-28 ions, NUCL INST B, 168(2), 2000, pp. 229-236

Authors: Pradhan, AK Gu, GD Nakao, K Koshizuka, N Kanjilal, D
Citation: Ak. Pradhan et al., Enhancement of interlayer coupling in Bi2Sr2CaCu2O8+y crystals upon heavy-ion irradiation, PHYS REV B, 61(21), 2000, pp. 14374-14377

Authors: Singh, JP Tripathi, A Kanjilal, D
Citation: Jp. Singh et al., In situ STM studies of HOPG surface after 200 MeV Au+13 ion irradiation, VACUUM, 57(3), 2000, pp. 319-325

Authors: Banerjee, T Viswanath, RN Kanjilal, D Kumar, R Ramasamy, S
Citation: T. Banerjee et al., Positron lifetime studies of 100-MeV oxygen irradiated Pb-doped Bi-2223 superconductors, SOL ST COMM, 114(12), 2000, pp. 655-659

Authors: Singh, JP Singh, R Kanjilal, D Mishra, NC Ganesan, V
Citation: Jp. Singh et al., Electronic excitation induced mass transport on 200 MeV Ag-107(+14) ion irradiated Si surface, J APPL PHYS, 87(6), 2000, pp. 2742-2746

Authors: Kumar, R Arora, SK Kanjilal, D Mehta, GK Bathe, R Date, SK Shinde, SR Saraf, LV Ogale, SB Patil, SI
Citation: R. Kumar et al., Swift heavy ion irradiation effects on transport properties of epitaxial thin films of La1-xCaxMnO3, RADIAT EFF, 147(3), 1999, pp. 187-197

Authors: Narayan, H Samanta, SB Agrawal, HM Kushwaha, RPS Kanjilal, D Sharma, SK Narlikar, AV
Citation: H. Narayan et al., An SEM and STM investigation of surface smoothing in 130 MeV Si-irradiatedmetglass MG2705M, J PHYS-COND, 11(13), 1999, pp. 2679-2688
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