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Wolverson, D
Strauf, S
Michler, P
Gutowski, J
Klude, M
Ohkawa, K
Hommel, D
Tournie, E
Faurie, JP
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Authors:
Schulz, O
Strassburg, M
Pohl, UW
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Itoh, S
Nakano, K
Ishibashi, A
Klude, M
Hommel, D
Citation: O. Schulz et al., Optimised implantation-induced disordering for lowering the threshold current density of II-VI laser diodes, PHYS ST S-A, 180(1), 2000, pp. 213-216
Authors:
Strauf, S
Michler, P
Gutowski, J
Klude, M
Hommel, D
Citation: S. Strauf et al., Shallow donors in ultrathin nitrogen-doped ZnSe layers - a novel or a disregarded compensation mechanism in II-VI device structures?, J CRYST GR, 214, 2000, pp. 497-501
Authors:
Legge, M
Bacher, G
Forchel, A
Klude, M
Fehrer, M
Hommel, D
Citation: M. Legge et al., Low threshold II-VI laser diodes with transversal and longitudinal single-mode emission, J CRYST GR, 214, 2000, pp. 1045-1048
Authors:
Wenisch, H
Fehrer, M
Klude, M
Ohkawa, K
Hommel, D
Citation: H. Wenisch et al., Internal photoluminescence in ZnSe homoepitaxy and application in blue-green-orange mixed-color light-emitting diodes, J CRYST GR, 214, 2000, pp. 1075-1079