Authors:
SMITH KE
DUDA LC
STAGARESCU CB
DOWNES J
KORAKAKIS D
SINGH R
MOUSTAKAS TD
GUO JH
NORDGREN J
Citation: Ke. Smith et al., SOFT-X-RAY EMISSION STUDIES OF THE BULK ELECTRONIC-STRUCTURE OF ALN, GAN, AND AL0.5GA0.5N, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2250-2253
Authors:
DOPPALAPUDI D
BASU SN
LUDWIG KF
MOUSTAKAS TD
Citation: D. Doppalapudi et al., PHASE-SEPARATION AND ORDERING IN INGAN ALLOYS GROWN BY MOLECULAR-BEAMEPITAXY, Journal of applied physics, 84(3), 1998, pp. 1389-1395
Citation: M. Katsikini et al., EXPERIMENTAL-DETERMINATION OF THE N-P-PARTIAL DENSITY-OF-STATES IN THE CONDUCTION-BAND OF GAN - DETERMINATION OF THE POLYTYPE FRACTIONS IN MIXED-PHASE SAMPLES, Journal of applied physics, 83(3), 1998, pp. 1437-1445
Citation: D. Korakakis et al., X-RAY CHARACTERIZATION OF GAN ALGAN MULTIPLE-QUANTUM WELLS FOR ULTRAVIOLET-LASER DIODES/, Applied physics letters, 72(9), 1998, pp. 1004-1006
Authors:
TORVIK JT
PANKOVE JI
ILIOPOULOS E
NG HM
MOUSTAKAS TD
Citation: Jt. Torvik et al., OPTICAL-PROPERTIES OF GAN GROWN OVER SIO2 ON SIC SUBSTRATES BY MOLECULAR-BEAM EPITAXY, Applied physics letters, 72(2), 1998, pp. 244-245
Citation: Lt. Romano et al., STRUCTURE OF GAN FILMS GROWN BY MOLECULAR-BEAM EPITAXY ON (0001)SAPPHIRE, Journal of electronic materials, 26(3), 1997, pp. 285-289
Authors:
KATSIKINI M
PALOURA EC
FIEBERERDMANN M
KALOMIROS J
MOUSTAKAS TD
AMANO H
AKASAKI I
Citation: M. Katsikini et al., N-K-EDGE X-RAY-ABSORPTION STUDY OF HETEROEPITAXIAL GAN FILMS, Physical review. B, Condensed matter, 56(20), 1997, pp. 13380-13386
Authors:
SINGH R
DOPPALAPUDI D
MOUSTAKAS TD
ROMANO LT
Citation: R. Singh et al., PHASE-SEPARATION IN INGAN THICK-FILMS AND FORMATION OF INGAN GAN DOUBLE HETEROSTRUCTURES IN THE ENTIRE ALLOY COMPOSITION/, Applied physics letters, 70(9), 1997, pp. 1089-1091
Authors:
STAGARESCU CB
DUDA LC
SMITH KE
GUO JH
NORDGREN J
SINGH R
MOUSTAKAS TD
Citation: Cb. Stagarescu et al., ELECTRONIC-STRUCTURE OF GAN MEASURED USING SOFT-X-RAY EMISSION AND ABSORPTION, Physical review. B, Condensed matter, 54(24), 1996, pp. 17335-17338
Authors:
AMBACHER O
RIEGER W
ANSMANN P
ANGERER H
MOUSTAKAS TD
STUTZMANN M
Citation: O. Ambacher et al., SUB-BANDGAP ABSORPTION OF GALLIUM NITRIDE DETERMINED BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY, Solid state communications, 97(5), 1996, pp. 365-370
Authors:
VAUDO RP
GOEPFERT D
MOUSTAKAS TD
BEYEA DM
FREY TJ
MEEHAN K
Citation: Rp. Vaudo et al., CHARACTERISTICS OF LIGHT-EMITTING-DIODES BASED ON GAN P-N-JUNCTIONS GROWN BY PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY, Journal of applied physics, 79(5), 1996, pp. 2779-2783
Citation: M. Katsikini et al., APPLICATION OF NEAR-EDGE X-RAY-ABSORPTION FINE-STRUCTURE FOR THE IDENTIFICATION OF HEXAGONAL AND CUBIC POLYTYPES IN EPITAXIAL GAN, Applied physics letters, 69(27), 1996, pp. 4206-4208
Citation: R. Singh et al., GROWTH AND PROPERTIES OF INXGA1-XN ALYGA1-YN MULTIQUANTUM WELLS DEVELOPED BY MOLECULAR-BEAM EPITAXY/, Applied physics letters, 69(16), 1996, pp. 2388-2390
Authors:
LOGOTHETIDIS S
PETALAS J
CARDONA M
MOUSTAKAS TD
Citation: S. Logothetidis et al., THE OPTICAL-PROPERTIES AND ELECTRONIC-TRANSITIONS OF CUBIC AND HEXAGONAL GAN FILMS BETWEEN 1.5-EV AND 10-EV, Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 65-69