AAAAAA
Results:
1-24
|
Results: 24
Authors:
OESTERSCHULZE E
Citation: E. Oesterschulze, NOVEL PROBES FOR SCANNING PROBE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 3-9
Authors:
LEINHOS T
STOPKA M
OESTERSCHULZE E
Citation: T. Leinhos et al., MICROMACHINED FABRICATION OF SI CANTILEVERS WITH SCHOTTKY DIODES INTEGRATED IN THE TIP, Applied physics A: Materials science & processing, 66, 1998, pp. 65-69
Authors:
MIHALCEA C
SCHOLZ W
MALAVE A
ALBERT D
KULISCH W
OESTERSCHULZE E
Citation: C. Mihalcea et al., FABRICATION OF MONOLITHIC DIAMOND PROBES FOR SCANNING PROBE MICROSCOPY APPLICATIONS, Applied physics A: Materials science & processing, 66, 1998, pp. 87-90
Authors:
WERNER S
RUDOW O
MIHALCEA C
OESTERSCHULZE E
Citation: S. Werner et al., CANTILEVER PROBES WITH APERTURE TIPS FOR POLARIZATION-SENSITIVE SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 367-370
Authors:
HEISIG S
OESTERSCHULZE E
Citation: S. Heisig et E. Oesterschulze, GALLIUM-ARSENIDE PROBES FOR SCANNING NEAR-FIELD PROBE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 385-390
Authors:
OESTERSCHULZE E
RUDOW O
MIHALCEA C
SCHOLZ W
WERNER S
Citation: E. Oesterschulze et al., CANTILEVER PROBES FOR SNOM APPLICATIONS WITH SINGLE AND DOUBLE APERTURE TIPS, Ultramicroscopy, 71(1-4), 1998, pp. 85-92
Authors:
HEISIG S
DANZEBRINK HU
LEYK A
MERTIN W
MUNSTER S
OESTERSCHULZE E
Citation: S. Heisig et al., MONOLITHIC GALLIUM-ARSENIDE CANTILEVER FOR SCANNING NEAR-FIELD MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 99-105
Authors:
KULISCH W
MALAVE A
LIPPOLD G
SCHOLZ W
MIHALCEA C
OESTERSCHULZE E
Citation: W. Kulisch et al., FABRICATION OF INTEGRATED DIAMOND CANTILEVERS WITH TIPS FOR SPM APPLICATIONS, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 906-911
Authors:
OESTERSCHULZE E
Citation: E. Oesterschulze, THE POTENTIAL OF THE SCANNING PROBE MICROSCOPY FOR THIN-FILM CHARACTERIZATION, Surface & coatings technology, 97(1-3), 1997, pp. 694-706
Authors:
MUNSTER S
WERNER S
MIHALCEA C
SCHOLZ W
OESTERSCHULZE E
Citation: S. Munster et al., NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of Microscopy, 186, 1997, pp. 17-22
Authors:
OESTERSCHULZE E
SCHOLZ W
MIHALCEA C
ALBERT D
SOBISCH B
KULISCH W
Citation: E. Oesterschulze et al., FABRICATION OF SMALL DIAMOND TIPS FOR SCANNING PROBE MICROSCOPY APPLICATION, Applied physics letters, 70(4), 1997, pp. 435-437
Authors:
BERNAL MP
BURR GW
COUFAL H
GRYGIER RK
HOFFNAGLE JA
JEFFERSON CM
OESTERSCHULZE E
SHELBY RM
SINCERBOX GT
QUINTANILLA M
Citation: Mp. Bernal et al., EFFECTS OF MULTILEVEL PHASE MASKS ON INTERPIXEL CROSS-TALK IN DIGITALHOLOGRAPHIC STORAGE, Applied optics, 36(14), 1997, pp. 3107-3115
Authors:
OESTERSCHULZE E
STOPKA M
ACKERMANN L
SCHOLZ W
WERNER S
Citation: E. Oesterschulze et al., THERMAL IMAGING OF THIN-FILMS BY SCANNING THERMAL MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 832-837
Authors:
LINNEMANN R
GOTSZALK T
RANGELOW IW
DUMANIA P
OESTERSCHULZE E
Citation: R. Linnemann et al., ATOMIC-FORCE MICROSCOPY AND LATERAL FORCE MICROSCOPY USING PIEZORESISTIVE CANTILEVERS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 856-860
Authors:
HADJIISKI L
MUNSTER S
OESTERSCHULZE E
KASSING R
Citation: L. Hadjiiski et al., NEURAL-NETWORK CORRECTION OF NONLINEARITIES IN SCANNING PROBE MICROSCOPE IMAGES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1563-1568
Authors:
OESTERSCHULZE E
STOPKA M
Citation: E. Oesterschulze et M. Stopka, PHOTOTHERMAL IMAGING BY SCANNING THERMAL MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1172-1177
Authors:
OESTERSCHULZE E
STOPKA M
Citation: E. Oesterschulze et M. Stopka, IMAGING OF THERMAL-PROPERTIES AND TOPOGRAPHY BY COMBINED SCANNING THERMAL AND SCANNING-TUNNELING-MICROSCOPY, Microelectronic engineering, 31(1-4), 1996, pp. 241-248
Authors:
KOLZER J
OESTERSCHULZE E
DEBOY G
Citation: J. Kolzer et al., THERMAL IMAGING AND MEASUREMENT TECHNIQUES FOR ELECTRONIC MATERIALS AND DEVICES, Microelectronic engineering, 31(1-4), 1996, pp. 251-270
Authors:
MIHALCEA C
SCHOLZ W
WERNER S
MUNSTER S
OESTERSCHULZE E
KASSING R
Citation: C. Mihalcea et al., MULTIPURPOSE SENSOR TIPS FOR SCANNING NEAR-FIELD MICROSCOPY, Applied physics letters, 68(25), 1996, pp. 3531-3533
Authors:
STOPKA M
HADJIISKI L
OESTERSCHULZE E
KASSING R
Citation: M. Stopka et al., SURFACE INVESTIGATIONS BY SCANNING THERMAL MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2153-2156
Authors:
HADJIISKI L
LINNEMANN R
STOPKA M
OESTERSCHULZE E
RANGELOW I
KASSING R
Citation: L. Hadjiiski et al., APPLICATION OF NEURAL NETWORKS TO A SCANNING PROBE MICROSCOPY SYSTEM, Thin solid films, 264(2), 1995, pp. 291-297
Authors:
STOPKA M
OESTERSCHULZE E
SCHULTE J
KASSING R
Citation: M. Stopka et al., PHOTOTHERMAL SCANNING NEAR-FIELD MICROSCOPY, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 226-228
Authors:
OESTERSCHULZE E
STOPKA M
KASSING R
Citation: E. Oesterschulze et al., PHOTOTHERMAL CHARACTERIZATION OF SOLIDS AND THIN-FILMS BY OPTICAL ANDSCANNING PROBE TECHNIQUES, Microelectronic engineering, 24(1-4), 1994, pp. 107-112
Authors:
OESTERSCHULZE E
STOPKA M
TOCHTROPMAYR M
MASSELI K
KASSING R
Citation: E. Oesterschulze et al., NONDESTRUCTIVE EVALUATION OF SOLIDS AND DEPOSITED FILMS BY THERMAL-WAVE INTERFEROMETRY, Applied surface science, 69(1-4), 1993, pp. 65-68
Risultati:
1-24
|