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Results: 1-25/28
Authors:
KIM E
BERISHEV I
BENSAOULA A
LEE S
PERRY SS
WATERS K
SCHULTZ JA
Citation: E. Kim et al., SURFACE-COMPOSITION AND MORPHOLOGY OF CHEMICAL BEAM EPITAXY-GROWN GANTHIN-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1270-1274
Authors:
BARBACCI DC
RUSSELL DH
SCHULTZ JA
HOLOCEK J
ULRICH S
BURTON W
VANSTIPDONK M
Citation: Dc. Barbacci et al., MULTIANODE DETECTION IN ELECTROSPRAY-IONIZATION TIME-OF-FLIGHT MASS-SPECTROMETRY, Journal of the American Society for Mass Spectrometry, 9(12), 1998, pp. 1328-1333
Authors:
BAUDIN K
DEPRUN C
LEBEYEC Y
SCHULTZ JA
SCHOPPMANN C
SCHWEIKERT EA
Citation: K. Baudin et al., A SPONTANEOUS DESORPTION SOURCE FOR POLYATOMIC ION PRODUCTION, Rapid communications in mass spectrometry, 12(13), 1998, pp. 852-856
Authors:
SMENTKOWSKI VS
HOLECEK JC
SCHULTZ JA
KRAUSS AR
GRUEN DM
Citation: Vs. Smentkowski et al., USE OF REACTIVE ION SPUTTERING TO PRODUCE CLEAN GERMANIUM SURFACES INA CARBON-RICH ENVIRONMENT - AN ION-SCATTERING STUDY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1779-1784
Authors:
SCHULTZ JA
Citation: Ja. Schultz, A HISTORY OF GERMAN LITERATURE FROM THE TIME IMMEMORIAL TO THE EARLY-MODERN AGE, VOL 1, FROM THE BEGINNINGS TO THE HIGH-MIDDLE-AGES, PT 1, THE BEGINNINGS, ATTEMPTS AT VERNACULAR LITERACY IN THE EARLY-MIDDLE-AGES (CA.700-1050 60) - GERMAN - HEINZLE,J/, The Journal of English and Germanic philology, 97(1), 1998, pp. 71-74
Authors:
AUCIELLO O
KRAUSS AR
IM J
SCHULTZ JA
Citation: O. Auciello et al., STUDIES OF MULTICOMPONENT OXIDE-FILMS AND LAYERED HETEROSTRUCTURE GROWTH-PROCESSES VIA IN-SITU, TIME-OF-FLIGHT ION-SCATTERING AND DIRECT RECOIL SPECTROSCOPY, Annual review of materials science, 28, 1998, pp. 375-396
Authors:
KHABASHESKU VN
MARGRAVE JL
WATERS K
SCHULTZ JA
Citation: Vn. Khabashesku et al., MATRIX-ISOLATION FOURIER-TRANSFORM INFRARED SPECTROSCOPIC STUDY OF ENERGETIC NITROGEN FLUXES APPLIED TO FABRICATION OF NITRIDE THIN-FILMS -OBSERVATION OF N-3 RADICAL AND QUANTITATIVE ESTIMATION OF MATRIX-ISOLATED N ATOMS, Journal of applied physics, 82(4), 1997, pp. 1921-1924
Authors:
SCHULTZ JA
Citation: Ja. Schultz, ROMANCING THE GRAIL - GENRE, SCIENCE, AND QUEST IN WOLFRAM 'PARZIVAL'- GROSS,A, The German quarterly, 70(1), 1997, pp. 75-76
Authors:
KIM E
BERISHEV I
BENSAOULA A
LEE S
PERRY SS
WATERS K
SCHULTZ JA
Citation: E. Kim et al., NUCLEATION AND GROWTH OF CHEMICAL BEAM EPITAXY GALLIUM NITRIDE THIN-FILMS, Applied physics letters, 71(21), 1997, pp. 3072-3074
Authors:
SCHULTZ JA
Citation: Ja. Schultz, MEDIEVAL LISTENING AND READING - THE PRIMARY RECEPTION OF GERMAN LITERATURE 800-1300 - GREEN,DH, The Journal of English and Germanic philology, 95(4), 1996, pp. 593-595
Authors:
SCHULTZ JA
ULRICH S
WOOLVERTON L
BURTON W
WATERS K
KLEIN C
WOLLNIK H
Citation: Ja. Schultz et al., FAST POSITION-SENSITIVE DETECTION APPLIED TO TIME-OF-FLIGHT ION-SCATTERING AND RECOIL SPECTROSCOPY FOR REALTIME MONITORING OF SURFACE-COMPOSITION AND CRYSTALLOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 758-765
IN-SITU ANALYSIS OF THIN-FILM DEPOSITION PROCESS USING TIME-OF-FLIGHT(TOF) ION-BEAM ANALYSIS-METHODS
Authors:
IM J
KRAUSS AR
LIN YP
SCHULTZ JA
AUCIELLO OH
GRUEN DM
CHANG RPH
Citation: J. Im et al., IN-SITU ANALYSIS OF THIN-FILM DEPOSITION PROCESS USING TIME-OF-FLIGHT(TOF) ION-BEAM ANALYSIS-METHODS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 772-781
Authors:
LU M
BOUSETTA A
BENSAOULA A
WATERS K
SCHULTZ JA
Citation: M. Lu et al., ELECTRICAL-PROPERTIES OF BORON-NITRIDE THIN-FILMS GROWN BY NEUTRALIZED NITROGEN ION-ASSISTED VAPOR-DEPOSITION, Applied physics letters, 68(5), 1996, pp. 622-624
TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES
Authors:
KRAUSS AR
AUCIELLO O
SCHULTZ JA
Citation: Ar. Krauss et al., TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES, MRS bulletin, 20(5), 1995, pp. 18-23
Authors:
HAMMOND MS
SCHULTZ JA
KRAUSS AR
Citation: Ms. Hammond et al., SURFACE-ANALYSIS AT LOW TO ULTRAHIGH-VACUUM BY ION-SCATTERING AND DIRECT RECOIL SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1136-1144
NO GIRLS, NO BOYS, NO FAMILIES - ON THE CONSTRUCTION OF CHILDHOOD IN TEXTS OF THE GERMAN MIDDLE-AGES
Authors:
SCHULTZ JA
Citation: Ja. Schultz, NO GIRLS, NO BOYS, NO FAMILIES - ON THE CONSTRUCTION OF CHILDHOOD IN TEXTS OF THE GERMAN MIDDLE-AGES, The Journal of English and Germanic philology, 94(1), 1995, pp. 59-81
Authors:
FAWCETT SB
PAINEANDREWS A
FRANCISCO VT
SCHULTZ JA
RICHTER KP
LEWIS RK
WILLIAMS EL
HARRIS KJ
BERKLEY JY
FISHER JL
LOPEZ CM
Citation: Sb. Fawcett et al., USING EMPOWERMENT THEORY IN COLLABORATIVE PARTNERSHIPS FOR COMMUNITY-HEALTH AND DEVELOPMENT, American journal of community psychology, 23(5), 1995, pp. 677-697
Authors:
KRAUSS AR
IM J
SCHULTZ JA
SMENTKOWSKI VS
WATERS K
ZUIKER CD
GRUEN DM
CHANG RPH
Citation: Ar. Krauss et al., PULSED ION-BEAM CHARACTERIZATION OF CVD DIAMOND SURFACES UNDER THIN-FILM DEPOSITION CONDITIONS, Thin solid films, 270(1-2), 1995, pp. 130-136
Authors:
SIBI MP
STESSMAN CC
SCHULTZ JA
CHRISTENSEN JW
LU JL
MARVIN M
Citation: Mp. Sibi et al., A CONVENIENT SYNTHESIS OF N-METHOXY-N-METHYLAMIDES FROM CARBOXYLIC-ACIDS, Synthetic communications, 25(8), 1995, pp. 1255-1264
Authors:
SCHULTZ JA
Citation: Ja. Schultz, THEORY OF GESTURE IN THE MIDDLE-AGES - AN ANALYSIS OF NONVERBAL EXPRESSION IN THE MIDDLE-HIGH-GERMAN EPIC - 'ROLANDSLIED', 'ENEASROMAN', 'TRISTAN' - GERMAN - SCHUBERT,MJ, The German quarterly, 68(4), 1995, pp. 459-460
Authors:
CHIANG CM
GATES SM
BENSAOULA A
SCHULTZ JA
Citation: Cm. Chiang et al., HYDROGEN DESORPTION AND AMMONIA ADSORPTION ON POLYCRYSTALLINE GAN SURFACES, Chemical physics letters, 246(3), 1995, pp. 275-278
Authors:
TAFERNER WT
FREUNDLICH A
BENSAOULA A
IGNATIEV A
WATERS K
EIPERSSMITH K
GUEHENNEUC M
SCHULTZ JA
Citation: Wt. Taferner et al., IN-SITU OBSERVATIONS OF GE(001) AND GE SI(001) USING LOW-ENERGY ION-SCATTERING/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(6), 1994, pp. 3012-3017
Authors:
KRAUSS AR
LIN Y
AUCIELLO O
LAMICH GJ
GRUEN DM
SCHULTZ JA
CHANG RPH
Citation: Ar. Krauss et al., PULSED ION-BEAM SURFACE-ANALYSIS AS A MEANS OF IN-SITU REAL-TIME ANALYSIS OF THIN-FILMS DURING GROWTH, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1943-1957
Authors:
LIN YP
KRAUSS AR
AUCIELLO O
NISHINO Y
GRUEN DM
CHANG RPH
SCHULTZ JA
Citation: Yp. Lin et al., STUDIES OF THIN-FILM GROWTH, ADSORPTION, AND OXIDATION BY IN-SITU, REAL-TIME, AND EX-SITU ION-BEAM ANALYSIS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1557-1564
Authors:
LIN YP
KRAUSS AR
CHANG RPH
AUCIELLO OH
GRUEN DM
SCHULTZ JA
Citation: Yp. Lin et al., ATMOSPHERE INFLUENCE ON IN-SITU ION-BEAM ANALYSIS OF THIN-FILM GROWTH, Thin solid films, 253(1-2), 1994, pp. 247-253