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Results:
1-23
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Results: 23
Authors:
BOLLE N
HERTOGEN P
ADRIAENSSENS GJ
SENEMAUD C
GHEORGHIUDELAROCQUE A
Citation: N. Bolle et al., COPPER-INDUCED CHANGES IN THE PROPERTIES OF ARSENIC CHALCOGENIDES, Semiconductors (Woodbury, N.Y.), 32(8), 1998, pp. 873-878
Authors:
BERTRAND N
DREVILLON B
GHEORGHIU A
SENEMAUD C
MARTINU L
KLEMBERGSAPIEHA JE
Citation: N. Bertrand et al., ADHESION IMPROVEMENT OF PLASMA-DEPOSITED SILICA THIN-FILMS ON STAINLESS-STEEL SUBSTRATE STUDIED BY X-RAY PHOTOEMISSION SPECTROSCOPY AND IN-SITU INFRARED ELLIPSOMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 6-12
Authors:
OMENETTO N
MERMET JM
TURK GC
MOORE DS
VODINH T
BUTLER LRP
URE AM
GAUGLITZ G
MELHUISH WH
MILLER JN
NOGAR NS
SCHRADER B
SENEMAUD C
VELTHORST NH
ZANDER M
ADAMS F
ANDREANI AM
BACON JR
COUFAL HJ
HIEFTJE GM
IMASAKA T
LUKOSZ W
STURGEON R
VELTHORST NL
WILKINSON J
WILLIS JP
YEUNG E
DANZER K
VALCARCEL M
GILBERT B
RUBESKA I
BEZUR L
DE AK
ULUBELEN A
ZACHARIAS PS
RADEMEYER CJ
VOLKA K
CURTIUS AJ
PARK J
ZIMMER K
PSZONICKI L
BATISTONI DZ
Citation: N. Omenetto et al., NOMENCLATURE, SYMBOLS, UNITS AND THEIR USAGE IN SPECTROCHEMICAL ANALYSIS - XIV - LASER-BASED ATOMIC SPECTROSCOPY - A NEW NOTATION FOR SPECTROCHEMICAL PROCESSES - (IUPAC RECOMMENDATIONS 1997), Pure and applied chemistry, 70(2), 1998, pp. 517-526
Authors:
LAROCQUE AGD
BERTRAND N
BONNEFONT PA
BULKIN P
DREVILLON B
SENEMAUD C
Citation: Agd. Larocque et al., X-RAY PHOTOELECTRON-SPECTRA OF ADHESION-ENHANCED A-SI-H ON STAINLESS-STEEL INDUCED BY PLASMA TREATMENTS, Journal of non-crystalline solids, 230, 1998, pp. 59-62
Authors:
SENEMAUD C
GHEORGHIUDELAROCQUE A
BONNEFONT PA
HEITZ T
GODET C
BOUREE JE
Citation: C. Senemaud et al., LOCAL ORDER STUDIES OF C-RICH AMORPHOUS SILICON-CARBON THIN-FILMS, Journal of non-crystalline solids, 230, 1998, pp. 447-451
Authors:
GHEORGHIU A
DUFOUR G
SENEMAUD C
HERLIN N
MUSSET E
CAUCHETIER M
ARMAND X
Citation: A. Gheorghiu et al., LOCAL ATOMIC CONFIGURATION IN LASER SYNTHESIZED SI C/N POWDERS STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY/, Journal de physique. III, 7(3), 1997, pp. 529-535
Authors:
LIPPENS PE
OLIVIERFOURCADE J
JUMAS JC
GHEORGHIU A
DUPONT S
SENEMAUD C
Citation: Pe. Lippens et al., ELECTRONIC-PROPERTIES OF THE CRYSTALLINE PHASES OF THE SB2S3-TL2S SYSTEM, Physical review. B, Condensed matter, 56(20), 1997, pp. 13054-13065
Authors:
GHEORGHIU A
SENEMAUD C
BELINFERRE E
DANKHAZI Z
MAGAUDMARTINAGE L
PAPACONSTANTOPOULOS DA
Citation: A. Gheorghiu et al., COMPARISON OF THEORETICAL AND EXPERIMENTAL ELECTRONIC DISTRIBUTIONS OF SI-NI AND SI-ER ALLOYS, Journal of physics. Condensed matter, 8(6), 1996, pp. 719-728
Authors:
DUPONT S
GHEORGHIU A
SENEMAUD C
MARIOT JM
HAGUE CF
LIPPENS PE
OLIVIERFOURCADE J
JUMAS JC
Citation: S. Dupont et al., S-K-BETA X-RAY-FLUORESCENCE SPECTRA OF THE TL-2-S-SB2S3 CHALCOGENIDE SYSTEM, Journal of physics. Condensed matter, 8(43), 1996, pp. 8421-8428
Authors:
VALLON S
BRENOT R
HOFRICHTER A
DREVILLON B
GHEORGHIU A
SENEMAUD C
KLEMBERGSAPIEHA JE
MARTINU L
PONCINEPAILLARD F
Citation: S. Vallon et al., ADHESION MECHANISMS OF SILICA LAYERS ON PLASMA-TREATED POLYMERS .2. POLYPROPYLENE, Journal of adhesion science and technology, 10(12), 1996, pp. 1313-1332
Authors:
DRISSKHODJA M
GHEORGHIU A
DUFOUR G
ROULET H
SENEMAUD C
CAUCHETIER M
Citation: M. Drisskhodja et al., ELECTRONIC-STRUCTURE OF NANOMETRIC SI C, SI/N, AND SI/C/N POWDERS STUDIED BY BOTH X-RAY-PHOTOELECTRON AND SOFT-X-RAY SPECTROSCOPIES/, Physical review. B, Condensed matter, 53(8), 1996, pp. 4287-4293
Authors:
ADRIAENSSENS GJ
GHEORGHIU A
SENEMAUD C
QAMHIEH N
BOLLE N
SLEECKX E
NAGELS P
Citation: Gj. Adriaenssens et al., COMPARISON BETWEEN ELECTRICAL-PROPERTIES AND ELECTRONIC-STRUCTURE OF VARIOUSLY-PREPARED GERMANIUM SELENIDE FILMS, Journal of non-crystalline solids, 200, 1996, pp. 675-679
Authors:
SENEMAUD C
Citation: C. Senemaud, ELECTRONIC-STRUCTURE OF AMORPHOUS-SEMICONDUCTORS STUDIED BY BOTH X-RAY PHOTOELECTRON AND SOFT-X-RAY SPECTROSCOPIES, Journal of non-crystalline solids, 200, 1996, pp. 85-90
Authors:
CARDINAUD C
ZARRABIAN M
GHEORGHIU A
SENEMAUD C
BOUNOUH Y
THEYE ML
Citation: C. Cardinaud et al., DESCRIPTION OF THE ELECTRONIC DENSITY-OF-STATES OF A-C-H FILMS WITH LOW AND HIGH OPTICAL GAPS, DIAMOND AND RELATED MATERIALS, 4(7), 1995, pp. 897-902
Authors:
GHEORGHIU A
LAMPRE I
DUPONT S
SENEMAUD C
RAGHNI MAE
LIPPENS PE
OLIVIERFOURCADE J
Citation: A. Gheorghiu et al., ELECTRONIC-STRUCTURE OF CHALCOGENIDE COMPOUNDS FROM THE SYSTEM TL2S-SB2S3 STUDIED BY XPS AND XES, Journal of alloys and compounds, 228(2), 1995, pp. 143-147
Authors:
KANDIL KM
KOTKATA MF
THEYE ML
GHEORGHIU A
SENEMAUD C
DIXMIER J
Citation: Km. Kandil et al., CHEMICAL AND STRUCTURAL STUDIES OF DISORDER AND DEFECTS IN ALPHA-GESE2 FILMS AS A FUNCTION OF THERMAL ANNEALING, Physical review. B, Condensed matter, 51(24), 1995, pp. 17565-17573
Authors:
GHEORGHIU A
SENEMAUD C
ASAL R
DAVIS EA
Citation: A. Gheorghiu et al., STUDY OF THE ELECTRONIC-STRUCTURE OF A-SI1-YNIY-H ALLOYS BY XPS AND XES, Journal of non-crystalline solids, 182(3), 1995, pp. 293-301
Authors:
THEYE ML
GHEORGHIU A
SENEMAUD C
KOTKATA MF
KANDIL KM
Citation: Ml. Theye et al., STUDIES OF SHORT-RANGE ORDER IN AMORPHOUS GEXSE100-X COMPOUNDS BY X-RAY PHOTOELECTRON-SPECTROSCOPY, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 69(2), 1994, pp. 209-222
Authors:
VALLON S
DREVILLON B
ROSTAING JC
SENEMAUD C
GHEORGHIU A
Citation: S. Vallon et al., USE OF PLASMA TREATMENT TO IMPROVE ADHESI ON OF HYDROGENATED AMORPHOUS-SILICON ALLOYS TO POLYMERS, Le Vide, (268), 1993, pp. 46-48
Authors:
VALLON S
DREVILLON B
SENEMAUD C
GHEORGHIU A
YAKOVLEV V
Citation: S. Vallon et al., ADHESION OF A THIN SILICON-OXIDE FILM ON A POLYCARBONATE SUBSTRATE, Journal of electron spectroscopy and related phenomena, 64-5, 1993, pp. 849-856
Authors:
SENEMAUD C
GHEORGHIU A
AMOURA L
ETEMADI R
SHIRAI H
GODET C
FANG M
GUJRATHI S
Citation: C. Senemaud et al., LOCAL ORDER AND H-BONDING IN N-RICH AMORPHOUS-SILICON NITRIDE, Journal of non-crystalline solids, 166, 1993, pp. 1073-1076
Authors:
GHEORGHIU A
SENEMAUD C
ASAL R
DAVIS EA
Citation: A. Gheorghiu et al., DENSITY-OF-STATES OF A-SI1-YNIY-H ALLOYS DETERMINED BY X-RAY AND OPTICAL SPECTROSCOPIES, Journal of non-crystalline solids, 166, 1993, pp. 1097-1100
Authors:
SENEMAUD C
DRISSKHODJA M
GHEORGHIU A
HAREL S
DUFOUR G
ROULET H
Citation: C. Senemaud et al., ELECTRONIC-STRUCTURE OF SILICON-NITRIDE STUDIED BY BOTH SOFT-X-RAY SPECTROSCOPY AND PHOTOELECTRON-SPECTROSCOPY, Journal of applied physics, 74(8), 1993, pp. 5042-5046
Risultati:
1-23
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