Citation: Ns. Savkina et al., The effect of high-temperature epitaxial SiC layer growth on the structureof porous silicon carbide, SEMICONDUCT, 35(2), 2001, pp. 153-157
Authors:
Sorokin, LM
Tregubova, AS
Shcheglov, MP
Lebedev, AA
Savkina, NS
Citation: Lm. Sorokin et al., Structural defects in 6H-SiC substrates and their effect on the sublimation growth of epitaxial layers in vacuum, PHYS SOL ST, 42(8), 2000, pp. 1422-1426
Authors:
Lebedev, AA
Davydov, DV
Savkina, NS
Tregubova, AS
Shcheglov, MP
Yakimova, R
Syvajarvi, M
Janzen, E
Citation: Aa. Lebedev et al., Structural defects and deep-level centers in 4H-SiC epilayers grown by sublimational epitaxy in vacuum, SEMICONDUCT, 34(10), 2000, pp. 1133-1136
Authors:
Savkina, NS
Lebedev, AA
Davydov, DV
Strel'chuk, AM
Tregubova, AS
Raynaud, C
Chante, JP
Locatelli, ML
Planson, D
Milan, J
Godignon, P
Campos, FJ
Mestres, N
Pascual, J
Brezeanu, G
Badila, M
Citation: Ns. Savkina et al., Low-doped 6H-SiC n-type epilayers grown by sublimation epitaxy, MAT SCI E B, 77(1), 2000, pp. 50-54
Authors:
Brezeanu, G
Badila, M
Tudor, B
Godignon, P
Millan, J
Locatelli, ML
Chante, JP
Lebedev, A
Savkina, NS
Citation: G. Brezeanu et al., Electrical characteristics modeling of large area boron compensated 6H-SiCpn structures, SOL ST ELEC, 44(4), 2000, pp. 571-579
Authors:
Strel'chuk, AM
Kozlovski, VV
Savkina, NS
Rastegaeva, MG
Andreev, AN
Citation: Am. Strel'Chuk et al., Influence of proton irradiation on recombination current in 6H-SiC pn structures, MAT SCI E B, 61-2, 1999, pp. 441-445