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Results: 1-18 |
Results: 18

Authors: Hingerl, K Balderas-Navarro, RE Bonanni, A Stifter, D
Citation: K. Hingerl et al., Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data, J VAC SCI B, 19(4), 2001, pp. 1650-1657

Authors: Horvath, ZJ Makhniy, VP Demych, MV Van Tuyen, V Balazs, J Reti, I Gorley, PM Ulyanitsky, KS Horley, PP Stifter, D Sitter, H Dozsa, L
Citation: Zj. Horvath et al., Electrical and photoelectrical behaviour of CdTe structures, MAT SCI E B, 80(1-3), 2001, pp. 156-159

Authors: Balderas-Navarro, RE Hingerl, K Bonanni, A Sitter, H Stifter, D
Citation: Re. Balderas-navarro et al., In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy, APPL PHYS L, 78(23), 2001, pp. 3615-3617

Authors: Balderas-Navarro, RE Hingerl, K Hilber, W Stifter, D Bonanni, A Sitter, H
Citation: Re. Balderas-navarro et al., In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy, J VAC SCI B, 18(4), 2000, pp. 2224-2228

Authors: Ferrand, D Bourgognon, C Cibert, J Wasiela, A Tatarenko, S d'Aubigne, YM Bonnani, A Stifter, D Sitter, H van Khoi, L Kolesnik, S Jaroszynski, J Sawicki, M Andrearczyk, T Dietl, T
Citation: D. Ferrand et al., Indication of ferromagnetic ordering in p-Zn1-xMnxTe, PHYSICA B, 284, 2000, pp. 1177-1178

Authors: Hingerl, K Balderas-Navarro, RE Hilber, W Bonanni, A Stifter, D
Citation: K. Hingerl et al., Surface-stress-induced optical bulk anisotropy, PHYS REV B, 62(19), 2000, pp. 13048-13052

Authors: Stifter, D Bonanni, A Garcia-Rocha, M Schmid, M Hingerl, K Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE, THIN SOL FI, 373(1-2), 2000, pp. 41-45

Authors: Bonanni, A Hingerl, K Sitter, H Stifter, D
Citation: A. Bonanni et al., Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn, THIN SOL FI, 367(1-2), 2000, pp. 216-219

Authors: Bonanni, A Hingerl, K Hilber, W Stifter, D Sitter, H
Citation: A. Bonanni et al., In situ reflectance difference spectroscopy of intra-Mn transitions in highly N-doped II-VI diluted magnetic semiconductors, J CRYST GR, 214, 2000, pp. 163-166

Authors: Stifter, D Schmid, M Hingerl, K Bonanni, A Garcia-Rocha, M Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of II-VI compounds: A real time study of N plasma doping during molecular beam epitaxy, J VAC SCI B, 17(4), 1999, pp. 1697-1701

Authors: Bonanni, A Prechtl, G Heiss, W Schinagl, F Holl, S Krenn, H Sitter, H Stifter, D Hingerl, K
Citation: A. Bonanni et al., Reflectance difference spectroscopy and magneto-optical analysis of digital magnetic heterostructures, J VAC SCI B, 17(4), 1999, pp. 1722-1727

Authors: Matt, G Brabec, CJ Manh, TN Stifter, D Sitter, H Sariciftci, NS
Citation: G. Matt et al., Fullerene-oligophenyl bilayers grown by hot wall epitaxy, SYNTH METAL, 101(1-3), 1999, pp. 656-657

Authors: Bonanni, A Hingerl, K Sitter, H Stifter, D
Citation: A. Bonanni et al., Reflectance difference spectroscopy of Mn intra-ion transitions in p-dopeddiluted magnetic semiconductors, PHYS ST S-B, 215(1), 1999, pp. 47-52

Authors: Stifter, D Bonanni, A Garcia-Rocha, M Schmid, M Hingerl, K Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy: nitrogen-plasma doping of MBEgrown ZnTe layers, J CRYST GR, 202, 1999, pp. 132-136

Authors: Bonanni, A Stifter, D Hingerl, K Seyringer, H Sitter, H
Citation: A. Bonanni et al., In situ characterization of the growth dynamics in molecular beam epitaxy (MBE) of Mn-based II-VI compounds: self-organized Mn structures on CdTe, J CRYST GR, 202, 1999, pp. 707-710

Authors: Heiss, W Prechtl, G Stifter, D Sitter, H Springholz, G Riemann, T Bertram, F Rudloff, D Christen, J Bley, G Neukirch, U Gutowski, J Liu, J
Citation: W. Heiss et al., Luminescence of ZnCdSe/ZnSe ridge quantum wires, APPL PHYS L, 75(7), 1999, pp. 974-976

Authors: Bonanni, A Seyringer, H Sitter, H Stifter, D Hingerl, K
Citation: A. Bonanni et al., Control of morphology changes in self-assembled Mn-based nanostructures overgrown with mismatched material, APPL PHYS L, 74(24), 1999, pp. 3732-3734

Authors: Stifter, D Schmid, M Hingerl, K Bonanni, A Garcia-Rocha, M Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy, APPL PHYS L, 73(26), 1998, pp. 3857-3859
Risultati: 1-18 |