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Hingerl, K
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Authors:
Balderas-Navarro, RE
Hingerl, K
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Stifter, D
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Authors:
Balderas-Navarro, RE
Hingerl, K
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Stifter, D
Bonanni, A
Sitter, H
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Authors:
Bonanni, A
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Citation: A. Bonanni et al., Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn, THIN SOL FI, 367(1-2), 2000, pp. 216-219
Authors:
Bonanni, A
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Stifter, D
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Citation: A. Bonanni et al., In situ reflectance difference spectroscopy of intra-Mn transitions in highly N-doped II-VI diluted magnetic semiconductors, J CRYST GR, 214, 2000, pp. 163-166
Authors:
Stifter, D
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Hingerl, K
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Authors:
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Hingerl, K
Citation: A. Bonanni et al., Reflectance difference spectroscopy and magneto-optical analysis of digital magnetic heterostructures, J VAC SCI B, 17(4), 1999, pp. 1722-1727
Authors:
Bonanni, A
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Citation: A. Bonanni et al., Reflectance difference spectroscopy of Mn intra-ion transitions in p-dopeddiluted magnetic semiconductors, PHYS ST S-B, 215(1), 1999, pp. 47-52
Authors:
Stifter, D
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Schmid, M
Hingerl, K
Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy: nitrogen-plasma doping of MBEgrown ZnTe layers, J CRYST GR, 202, 1999, pp. 132-136
Authors:
Bonanni, A
Stifter, D
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Citation: A. Bonanni et al., In situ characterization of the growth dynamics in molecular beam epitaxy (MBE) of Mn-based II-VI compounds: self-organized Mn structures on CdTe, J CRYST GR, 202, 1999, pp. 707-710
Authors:
Bonanni, A
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Citation: A. Bonanni et al., Control of morphology changes in self-assembled Mn-based nanostructures overgrown with mismatched material, APPL PHYS L, 74(24), 1999, pp. 3732-3734
Authors:
Stifter, D
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Hingerl, K
Bonanni, A
Garcia-Rocha, M
Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy, APPL PHYS L, 73(26), 1998, pp. 3857-3859