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STELMAKH VF
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VARICHENKO VS
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DOMRES R
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CHELYADINSKII AR
MARTINOVITSH VA
Citation: Vs. Varichenko et al., EPR, XRD AND OPTICAL REFLECTIVITY STUDIES OF RADIATION-DAMAGE IN SILICON AFTER HIGH-ENERGY IMPLANTATION OF NI IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 94(3), 1994, pp. 240-244
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