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Results: 1-25/38
Authors:
Venger, EF
Goncharenko, AV
Zavadskii, SN
Citation: Ef. Venger et al., Dielectric response of a crystal with a damaged surface layer in the longitudinal-transverse splitting region, PHYS SOL ST, 43(6), 2001, pp. 1178-1181
Authors:
Venger, EF
Konakova, RV
Okhrimenko, OB
Sapko, SY
Shekhovtsov, LV
Ivanov, VN
Citation: Ef. Venger et al., The transition layer in TiB2-GaAs and Au-TiB2-GaAs Schottky contacts, SEMICONDUCT, 35(4), 2001, pp. 427-432
Authors:
Shirshov, YM
Snopok, BA
Samoylov, AV
Kiyanovskij, AP
Venger, EF
Nabok, AV
Ray, AK
Citation: Ym. Shirshov et al., Analysis of the response of planar polarization interferometer to molecular layer formation: fibrinogen adsorption on silicon nitride surface, BIOSENS BIO, 16(6), 2001, pp. 381-390
Authors:
Goncharenko, AN
Lozovski, VZ
Venger, EF
Citation: An. Goncharenko et al., Effective dielectric response of a shape-distributed particle system, J PHYS-COND, 13(35), 2001, pp. 8217-8234
Authors:
Boltovets, NS
Kholevchuk, VV
Konakova, RV
Mitin, VF
Venger, EF
Citation: Ns. Boltovets et al., Ge-film resistance and Si-based diode temperature microsensors for cryogenic applications, SENS ACTU-A, 92(1-3), 2001, pp. 191-196
Authors:
Budzulyak, SI
Dotsenko, YP
Ermakov, VM
Kolomoets, VV
Korbutyak, DV
Venger, EF
Fukuzawa, M
Yamada, M
Liarokapis, E
Citation: Si. Budzulyak et al., Defect states in transmutation-doped gamma-irradiated Cz-Si crystals underhigh uniaxial pressure, PHYSICA B, 302, 2001, pp. 12-16
Authors:
Dvoynenko, MM
Goncharenko, AV
Romaniuk, VR
Venger, EF
Citation: Mm. Dvoynenko et al., Effects of dimension on optical transmittance of semicontinuous gold films, PHYSICA B, 299(1-2), 2001, pp. 88-93
Authors:
Yaremko, AM
Venger, EF
Ratajczak, H
Mozdor, EV
Piryatinski, AY
Citation: Am. Yaremko et al., High order nonlinearities and many photon effects in the exciton spectrum region of organic based crystals, SYNTH METAL, 121(1-3), 2001, pp. 1763-1764
Authors:
Budzulyak, SI
Gorin, AE
Ermakov, VM
Kolomoets, VV
Venger, EF
Verma, P
Yamada, M
Liarokapis, E
Tunstall, DP
Citation: Si. Budzulyak et al., Strain-induced MI transition in n-Si and n-Ge: Physical mechanisms and transport phenomena, PHYS ST S-B, 223(2), 2001, pp. 519-523
Authors:
Holiney, RY
Matveeva, LA
Venger, EF
Litvinenko, OA
Karachevtseva, LA
Citation: Ry. Holiney et al., Electroreflectance study of macroporous silicon surfaces (vol 172, pg 214,2001), APPL SURF S, 180(1-2), 2001, pp. 184-184
Authors:
Holiney, RY
Matveeva, LA
Venger, EF
Livinenko, AO
Karachevtseva, LA
Citation: Ry. Holiney et al., Electroreflectance study of macroporous silicon surfaces, APPL SURF S, 172(3-4), 2001, pp. 214-219
Authors:
Dmitruk, NL
Klopfleisch, M
Mayeva, OI
Mamykin, SV
Venger, EF
Yastrubchak, OB
Citation: Nl. Dmitruk et al., Multilayer diffraction gratings Al/GaAs as polaritonic photodetectors, PHYS ST S-A, 184(1), 2001, pp. 165-174
Authors:
Shekhovtsov, LV
Venger, EF
Semenova, GN
Sadof'ev, YG
Korsunskaya, NE
Semtsiv, MP
Sapko, SY
Citation: Lv. Shekhovtsov et al., Features of the long-term photo EMF relaxation in a heteroepitaxial ZnSe-GaAs structure, TECH PHYS L, 26(3), 2000, pp. 190-192
Authors:
Budzulyak, SI
Venger, EF
Dotsenko, YP
Ermakov, VN
Kolomoets, VV
Machulin, VF
Panasyuk, LI
Citation: Si. Budzulyak et al., Breakdown of shallow-level donors in Si and Ge on the insulating side of astrain-induced metal-insulator transition, SEMICONDUCT, 34(9), 2000, pp. 1021-1023
Authors:
Venger, EF
Gasan-zade, SG
Strikha, MV
Staryi, SV
Shepel'skii, GA
Citation: Ef. Venger et al., Far infrared stimulated and spontaneous radiation in uniaxially deformed zero-gap Hg1-xCdxTe, SEMICONDUCT, 34(7), 2000, pp. 763-767
Authors:
Venger, EF
Sadof'ev, YG
Semenova, GN
Korsunskaya, NE
Klad'ko, VP
Semtsiv, MP
Borkovskaya, LV
Citation: Ef. Venger et al., Emission associated with extended defects in epitaxial ZnTe/GaAs layers and multilayer structures, SEMICONDUCT, 34(1), 2000, pp. 11-16
Authors:
Shwarts, YM
Borblik, VL
Kulish, NR
Venger, EF
Sokolov, VN
Citation: Ym. Shwarts et al., Limiting characteristics of diode temperature sensors, SENS ACTU-A, 86(3), 2000, pp. 197-205
Authors:
Gorbach, TY
Holiney, RY
Matveeva, LA
Svechnikov, SV
Venger, EF
Kuzma, M
Wisz, G
Citation: Ty. Gorbach et al., Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTePLD films, MAT SCI E B, 71, 2000, pp. 288-291
Authors:
Dmitruk, NL
Ermolovich, IB
Konakova, RV
Lytvyn, OS
Lytvyn, PM
Milenin, VV
Prokopenko, IV
Venger, EF
Voitsikhovskyi, DI
Boltovets, NS
Ivanov, VN
Citation: Nl. Dmitruk et al., On the nature of transition layer and heat tolerance of TiBx/GaAs-based contacts, APPL SURF S, 166(1-4), 2000, pp. 520-525
Authors:
Gorbach, TY
Matveeva, LA
Smertenko, PS
Svechnikov, SV
Venger, EF
Kuzma, M
Wisz, G
Ciach, R
Rakowska, A
Citation: Ty. Gorbach et al., Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTePLD films on silicon patterned substrates, THIN SOL FI, 380(1-2), 2000, pp. 256-258
Authors:
Venger, EF
Sadof'ev, YG
Semenova, GN
Korsunskaya, NE
Klad'ko, VP
Shechovtsov, LV
Semtsiv, MP
Borkovskaya, LV
Sapko, SY
Citation: Ef. Venger et al., Lateral and depth inhomogeneities in Zn-based heterostructures grown on GaAs by MBE, THIN SOL FI, 367(1-2), 2000, pp. 184-188
Authors:
Goncharenko, AV
Lozovski, VZ
Venger, EF
Citation: Av. Goncharenko et al., Lichtenecker's equation: applicability and limitations, OPT COMMUN, 174(1-4), 2000, pp. 19-32
Authors:
Venger, EF
Popov, VB
Serdega, BK
Shinkar, VV
Citation: Ef. Venger et al., Effect of nonreciprocity in the state of polarization of an electromagnetic wave traveling in an inhomogeneously anisotropic crystal, OPT SPECTRO, 89(5), 2000, pp. 746-750
Authors:
Holiney, RY
Fedorenko, LL
Matveeva, LA
Strilchenko, IY
Venger, EF
Yusupov, NM
Citation: Ry. Holiney et al., Electroreflectance of porous layers obtained by stain etching of laser modified silicon, J PHYS D, 33(22), 2000, pp. 2875-2879
Authors:
Goncharenko, AV
Semenov, YG
Venger, EF
Citation: Av. Goncharenko et al., Effective scattering cross section of an assembly of small ellipsoidal particles, J OPT SOC A, 16(3), 1999, pp. 517-522