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Results: 1-22 |
Results: 22

Authors: NAWAZ R ELLIOTT M WILKS SP WILLIAMS RH BLAND SW DAVIES JI
Citation: R. Nawaz et al., SCHOTTKY-BARRIER HEIGHT ENHANCEMENT ON N-IN0.53GA0.47AS USING DELTA-DOPING, Applied surface science, 123, 1998, pp. 467-470

Authors: CAMMACK DS MCGREGOR SM MCCHESNEY JJ CLARK SA DUNSTAN PR BURGESS SR WILKS SP PEIRO F FERRER JC CORNET A MORANTE JR KESTLE A WESTWOOD DI ELLIOTT M
Citation: Ds. Cammack et al., AN INVESTIGATION OF THE PROPERTIES OF INTIMATE IN-INXGA1-XAS(100) INTERFACES FORMED AT ROOM AND CRYOGENIC TEMPERATURES, Applied surface science, 123, 1998, pp. 501-507

Authors: WILKS SP BURGESS S DUNSTAN P PAN M PRITCHARD MA WILLIAMS RH CAMMACK D CLARK SA WESTWOOD DI
Citation: Sp. Wilks et al., BAND ENGINEERING AT THE GAAS-ALGAAS HETEROJUNCTION USING ULTRA-THIN SI AND BE DIPOLE LAYERS - A COMPARISON OF MODIFICATION TECHNIQUES, Applied surface science, 123, 1998, pp. 528-532

Authors: DUNSTAN PR WILKS SP BURGESS SR PAN M WILLIAMS RH CAMMACK DS CLARK SA
Citation: Pr. Dunstan et al., THE ELECTRONIC AND STRUCTURAL-PROPERTIES OF THE SILICON-GALLIUM ARSENIDE(110) INTERFACE, Applied surface science, 123, 1998, pp. 533-537

Authors: CAMMACK DS CLARK SA DUNSTAN PR PAN M WILKS SP ELLIOTT M
Citation: Ds. Cammack et al., FORMATION OF IN- AND AU-IN-0.52 AL-0.48 AS(100) INTERFACES - A SOFT-X-RAY PHOTOEMISSION SPECTROSCOPY STUDY, Journal of applied physics, 84(8), 1998, pp. 4443-4447

Authors: PAN M WILKS SP DUNSTAN PR PRITCHARD M WILLIAMS RH CAMMACK DS CLARK SA
Citation: M. Pan et al., MODIFICATION OF BAND OFFSETS BY A ZNSE INTRALAYER AT THE SI GE(111) INTERFACE/, Applied physics letters, 72(21), 1998, pp. 2707-2709

Authors: WILKS SP KESTLE A
Citation: Sp. Wilks et A. Kestle, THE CONTROL AND MODIFICATION OF SEMICONDUCTOR INTERFACES USING THIN MULTIQUANTUM BARRIER WELL (MQB/W) REFLECTORS/, Applied surface science, 117, 1997, pp. 334-341

Authors: CAMMACK DS MCGREGOR SM MCCHESNEY JJ DHARMADASA IM CLARK SA DUNSTAN PR BURGESS SR WILKS SP ELIOTT M
Citation: Ds. Cammack et al., PHOTOEMISSION-STUDY OF THE FORMATION OF INTIMATE IN-INGAAS(100) CONTACTS AT ROOM AND CRYOGENIC TEMPERATURES, Journal of applied physics, 81(12), 1997, pp. 7876-7879

Authors: BURGESS SR COWIE BCC WILKS SP DUNSTAN PR DUNSCOMBE CJ WILLIAMS RH
Citation: Sr. Burgess et al., A SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF TELLURIUMADSORBED ONTO SI(100), Applied surface science, 104, 1996, pp. 152-157

Authors: CLARK SA WILKS SP KESTLE A WESTWOOD DI ELLIOTT M
Citation: Sa. Clark et al., IMPROVEMENTS TO THE SCHOTTKY-BARRIER HEIGHTS OF INTIMATE METAL-INGAASCONTACTS BY LOW-TEMPERATURE METALLIZATION, Surface science, 352, 1996, pp. 850-854

Authors: CLARK SA WILKS SP WILLIAMS RH JOHNSON AD WHITEHOUSE CR
Citation: Sa. Clark et al., METAL-IN80AL20SB INTERFACE FORMATION - AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2289-2292

Authors: KESTLE A WILKS SP WESTWOOD DI KE M ELLIOTT M
Citation: A. Kestle et al., THE CONTROL AND MODIFICATION OF METAL-SEMICONDUCTOR INTERFACES USING MULTI QUANTUM BARRIERS, Materials science & engineering. B, Solid-state materials for advanced technology, 35(1-3), 1995, pp. 145-148

Authors: NAWAZ R BRYANT AL ELLIOTT M WESTWOOD DI WILKS SP
Citation: R. Nawaz et al., EXAMINATION OF INTERNALLY DELTA-DOPED GALLIUM-ARSENIDE RESONANT-TUNNELING STRUCTURES, Materials science & engineering. B, Solid-state materials for advanced technology, 35(1-3), 1995, pp. 353-356

Authors: WILLIAMS JP WILKS SP WILLIAMS RH TARRY HA
Citation: Jp. Williams et al., AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE INTERACTION AND CHEMICAL PASSIVATION OF CHEMICALLY ETCHED (100) ORIENTED HG1-XCDXTE (X=0.226) UTILIZING CHROMIUM AND ALUMINUM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2676-2683

Authors: WILKS SP WILLIAMS RH
Citation: Sp. Wilks et Rh. Williams, SENSITIVITY ANALYSIS OF DIPOLE LAYERS AT SEMICONDUCTORS INTERFACES, Journal of electron spectroscopy and related phenomena, 72, 1995, pp. 49-54

Authors: CLARK SA CAIRNS JW WILKS SP WILLIAMS RH JOHNSON AD WHITEHOUSE CR
Citation: Sa. Clark et al., ANTIMONY CAPPING AND DECAPPING OF INALSB(100), Surface science, 336(1-2), 1995, pp. 193-198

Authors: CLARK SA DUNSCOMBE CJ WOOLF DA WILKS SP WILLIAMS RH
Citation: Sa. Clark et al., ARSENIC CAPPING AND DECAPPING OF INYAL1-YAS(100) GROWN BY MOLECULAR-BEAM EPITAXY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 551-554

Authors: CLARK SA WILKS SP WILLIAMS RH LUO JK PEIRO F PEREZRODRIGUEZ A CORNET A MORANTE JR
Citation: Sa. Clark et al., THE CHARACTERISTICS OF INTIMATE AU-INYAL1-Y SCHOTTKY DIODES - A MISMATCH DEPENDENCE STUDY, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 433-438

Authors: WILKS SP WILLIAMS RH WILLIAMS JP TARRY HA
Citation: Sp. Wilks et al., AN XPS STUDY OF METAL-CDXHG1-XTE(CMT X=0.225) INTERFACES FOR SURFACESPREPARED IN VACUUM (110) AND BY CHEMICAL ETCHING (100) - A COMPARISONOF THE INTERFACIAL STABILITY, Semiconductor science and technology, 9(9), 1994, pp. 1706-1712

Authors: WILKS SP CORNISH AE ELLIOTT M WOOLF DA WESTWOOD DI WILLIAMS RH
Citation: Sp. Wilks et al., INVESTIGATION OF SILICON DELTA-DOPED GALLIUM-ARSENIDE USING THE SHUBNIKOV-DE HAAS EFFECT AND THEORETICAL MODELING, Journal of applied physics, 76(6), 1994, pp. 3583-3588

Authors: CLARK SA WILKS SP MORRIS JI WOOLF DA WILLIAMS RH
Citation: Sa. Clark et al., AN INVESTIGATION OF THE ELECTRICAL AND CHEMICAL-PROPERTIES OF INTIMATE METAL-INYAL1-YAS(100) INTERFACES, Journal of applied physics, 75(5), 1994, pp. 2481-2488

Authors: HOOPER SE WILKS SP ELLIOT M WESTWOOD DI WOOLF DA WILLIAMS RH
Citation: Se. Hooper et al., EVALUATION OF OHMIC CONTACTS TO GAAS(100) AND (111)B USING INAS GAAS SHORT-PERIOD SUPERLATTICE AND INGAAS INTERMEDIATE LAYERS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1727-1730
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