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Results: 1-25/59
Authors:
TIWALD TE
THOMPSON DW
WOOLLAM JA
Citation: Te. Tiwald et al., OPTICAL DETERMINATION OF SHALLOW CARRIER PROFILES USING FOURIER-TRANSFORM INFRARED ELLIPSOMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 312-315
Authors:
GAO X
HALE J
HECKENS S
WOOLLAM JA
Citation: X. Gao et al., STUDIES OF METALLIC MULTILAYER STRUCTURES, OPTICAL-PROPERTIES, AND OXIDATION USING IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 429-435
Authors:
ZOLLNER S
CARREJO JP
TIWALD TE
WOOLLAM JA
Citation: S. Zollner et al., THE ORIGIN OF THE BERREMAN EFFECT IN SIC HOMOSTRUCTURES, Physica status solidi. b, Basic research, 208(1), 1998, pp. 3-4
Authors:
KIRKPATRICK SR
ROHDE SL
MIHUT DM
KURRUPPU ML
SWANSON JR
THOMSON D
WOOLLAM JA
Citation: Sr. Kirkpatrick et al., PROCESS MONITORING AND CONTROL OF LOW-TEMPERATURE REACTIVELY SPUTTERED ALN, Thin solid films, 332(1-2), 1998, pp. 16-20
Authors:
HALE JS
DEVRIES M
DWORAK B
WOOLLAM JA
Citation: Js. Hale et al., VISIBLE AND INFRARED OPTICAL-CONSTANTS OF ELECTROCHROMIC MATERIALS FOR EMISSIVITY MODULATION APPLICATIONS, Thin solid films, 313, 1998, pp. 205-209
Authors:
THOMPSON DW
DEVRIES MJ
TIWALD TE
WOOLLAM JA
Citation: Dw. Thompson et al., DETERMINATION OF OPTICAL ANISOTROPY IN CALCITE FROM ULTRAVIOLET TO MIDINFRARED BY GENERALIZED ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 341-346
Authors:
GAO X
GLENN DW
WOOLLAM JA
Citation: X. Gao et al., IN-SITU ELLIPSOMETRIC DIAGNOSTICS OF MULTILAYER THIN-FILM DEPOSITION DURING SPUTTERING, Thin solid films, 313, 1998, pp. 511-515
Authors:
TIWALD TE
THOMPSON DW
WOOLLAM JA
PAULSON W
HANCE R
Citation: Te. Tiwald et al., APPLICATION OF IR VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY TO THE DETERMINATION OF FREE-CARRIER CONCENTRATION DEPTH PROFILES, Thin solid films, 313, 1998, pp. 661-666
Authors:
SNYDER PG
TIWALD TE
THOMPSON DW
IANNO NJ
WOOLLAM JA
MAUK MG
SHELLENBARGER ZA
Citation: Pg. Snyder et al., INFRARED FREE-CARRIER RESPONSE OF IN0.15GA0.85AS0.17SB0.83 EPILAYERS ON GASB, Thin solid films, 313, 1998, pp. 667-670
Authors:
SCHUBERT M
FRANKE E
NEUMANN H
TIWALD TE
THOMPSON DW
WOOLLAM JA
HAHN J
Citation: M. Schubert et al., OPTICAL INVESTIGATIONS OF MIXED-PHASE BORON-NITRIDE THIN-FILMS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 692-696
Authors:
BUNGAY CL
TIWALD TE
THOMPSON DW
DEVRIES MJ
WOOLLAM JA
ELMAN JF
Citation: Cl. Bungay et al., IR ELLIPSOMETRY STUDIES OF POLYMERS AND OXYGEN PLASMA-TREATED POLYMERS, Thin solid films, 313, 1998, pp. 713-717
Authors:
TIWALD TE
THOMPSON DW
WOOLLAM JA
PEPPER SV
Citation: Te. Tiwald et al., DETERMINATION OF THE MID-IR OPTICAL-CONSTANTS OF WATER AND LUBRICANTSUSING IR ELLIPSOMETRY COMBINED WITH AN ATR CELL, Thin solid films, 313, 1998, pp. 718-721
Authors:
FRANKE E
SCHUBERT M
HECHT JD
NEUMANN H
TIWALD TE
THOMPSON DW
YAO H
WOOLLAM JA
HAHN J
Citation: E. Franke et al., IN-SITU INFRARED AND VISIBLE-LIGHT ELLIPSOMETRIC INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS AT ELEVATED-TEMPERATURES, Journal of applied physics, 84(1), 1998, pp. 526-532
Authors:
HERZINGER CM
JOHS B
MCGAHAN WA
WOOLLAM JA
PAULSON W
Citation: Cm. Herzinger et al., ELLIPSOMETRIC DETERMINATION OF OPTICAL-CONSTANTS FOR SILICON AND THERMALLY GROWN SILICON DIOXIDE VIA A MULTISAMPLE, MULTIWAVELENGTH, MULTI-ANGLE INVESTIGATION, Journal of applied physics, 83(6), 1998, pp. 3323-3336
Authors:
MELDRIM JM
KIRBY RD
DEVRIES MJ
WOOLLAM JA
SELLMYER DJ
Citation: Jm. Meldrim et al., MAGNETIC AND MAGNETOOPTIC STUDY OF A LAYERED CO PT - DYSPROSIUM-IRON-GARNET SYSTEM/, IEEE transactions on magnetics, 34(4), 1998, pp. 1991-1993
Authors:
SYNOWICKI RA
HALE JS
KUBIK RD
NAFIS S
WOOLLAM JA
Citation: Ra. Synowicki et al., MICROSTRUCTURAL CHARACTERIZATION OF SIOX SURFACE CONTAMINANTS ON ASHED ALUMINUM THIN-FILMS, Surface & coatings technology, 90(1-2), 1997, pp. 150-155
Authors:
SCHUBERT M
RHEINLANDER B
FRANKE E
NEUMANN H
TIWALD TE
WOOLLAM JA
HAHN J
RICHTER F
Citation: M. Schubert et al., INFRARED OPTICAL-PROPERTIES OF MIXED-PHASE THIN-FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY USING BORON-NITRIDE AS AN EXAMPLE, Physical review. B, Condensed matter, 56(20), 1997, pp. 13306-13313
Authors:
WIERMAN KW
HILFIKER JN
SABIRYANOV RF
JASWAL SS
KIRBY RD
WOOLLAM JA
Citation: Kw. Wierman et al., OPTICAL AND MAGNETOOPTICAL CONSTANTS OF MNPT3, Physical review. B, Condensed matter, 55(5), 1997, pp. 3093-3099
Authors:
BENSON JD
CORNFELD AB
MARTINKA M
DINAN JH
JOHS B
HE P
WOOLLAM JA
Citation: Jd. Benson et al., ELLIPSOMETRIC ANALYSIS OF CDZNTE PREPARATION FOR HGCDTE MBE GROWTH, Journal of crystal growth, 175, 1997, pp. 659-664
Authors:
GAO X
GLENN DW
HECKENS S
THOMPSON DW
WOOLLAM JA
Citation: X. Gao et al., SPECTROSCOPIC ELLIPSOMETRY AND MAGNETOOPTIC KERR EFFECTS IN CO PT MULTILAYERS/, Journal of applied physics, 82(9), 1997, pp. 4525-4531
Authors:
FRANKE E
SCHUBERT M
NEUMANN H
TIWALD TE
THOMPSON DW
WOOLLAM JA
HAHN J
RICHTER F
Citation: E. Franke et al., PHASE AND MICROSTRUCTURE INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY IN THE VISIBLE AND INFRARED SPECTRAL RANGE, Journal of applied physics, 82(6), 1997, pp. 2906-2911
Authors:
WIERMAN KW
HILFIKER JN
SABIRYANOV RF
JASWAL SS
KIRBY RD
WOOLLAM JA
Citation: Kw. Wierman et al., OPTICAL AND MAGNETOOPTICAL PROPERTIES OF MNPT3 FILMS, Journal of applied physics, 81(8), 1997, pp. 5674-5674
Authors:
GAO X
HECKENS S
WOOLLAM JA
Citation: X. Gao et al., IN-SITU ELLIPSOMETRIC CONTROL OF MAGNETIC MULTILAYER DEPOSITION, Journal of applied physics, 81(8), 1997, pp. 3845-3845
Authors:
GAO X
THOMPSON DW
WOOLLAM JA
Citation: X. Gao et al., DETERMINATION OF THE INTERFACIAL MAGNETOOPTICAL EFFECTS IN CO PT MULTILAYER STRUCTURES/, Applied physics letters, 70(24), 1997, pp. 3203-3205
Authors:
FRANKE E
NEUMANN H
SCHUBERT M
TIWALD TE
WOOLLAM JA
HAHN J
Citation: E. Franke et al., INFRARED ELLIPSOMETRY ON HEXAGONAL AND CUBIC BORON-NITRIDE THIN-FILMS, Applied physics letters, 70(13), 1997, pp. 1668-1670