Authors:
Barreca, D
Morazzoni, F
Rizzi, GA
Scotti, R
Tondello, E
Citation: D. Barreca et al., Molecular oxygen interaction with Bi2O3: a spectroscopic and spectromagnetic investigation, PHYS CHEM P, 3(9), 2001, pp. 1743-1749
Authors:
Barreca, D
Battiston, GA
Casellato, U
Gerbasi, R
Roncari, E
Tondello, E
Zanella, P
Citation: D. Barreca et al., Nanophased ZrO2-CeO2 or TiO2-ZrO2-CeO2 films by CVD as catalysts for hydrocarbon complete combustion, J PHYS IV, 11(PR3), 2001, pp. 453-460
Authors:
Barreca, D
Battiston, GA
Carta, G
Gerbasi, R
Rossetto, G
Tondello, E
Zanella, P
Citation: D. Barreca et al., Al2O3 growth optimisation using aluminium dimethylisopropoxide as precursor as a function of reaction conditions and reacting gases, J PHYS IV, 11(PR3), 2001, pp. 539-546
Authors:
Barison, S
Barreca, D
Daolio, S
Fabrizio, M
Tondello, E
Citation: S. Barison et al., An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry, RAP C MASS, 15(17), 2001, pp. 1621-1624
Authors:
Barreca, D
Massignan, C
Daolio, S
Fabrizio, M
Piccirillo, C
Armelao, L
Tondello, E
Citation: D. Barreca et al., Composition and microstructure of cobalt oxide thin films obtained from a novel cobalt(II) precursor by chemical vapor deposition, CHEM MATER, 13(2), 2001, pp. 588-593
Authors:
Di Noto, V
Barreca, D
Furlan, C
Armelao, L
Citation: V. Di Noto et al., Zeolitic inorganic-organic polymer electrolytes: A material based on poly(ethylene glycol) 600, SnCl4 and K4Fe(CN)(6), POLYM ADV T, 11(3), 2000, pp. 108-121
Authors:
Barreca, D
Battiston, GA
Gerbasi, R
Tondello, E
Citation: D. Barreca et al., Al2O3 thin films from aluminium dimethylisopropoxide by metal-organic chemical vapour deposition, J MAT CHEM, 10(9), 2000, pp. 2127-2130
Authors:
Barison, S
Barreca, D
Daolio, S
Fabrizio, M
Piccirillo, C
Citation: S. Barison et al., Secondary ion mass spectrometric investigation on ruthenium oxide systems:a comparison between poly- and nanocrystalline deposits, RAP C MASS, 14(14), 2000, pp. 1179-1183
Authors:
Barreca, D
Armelao, L
Caccavale, F
Di Noto, V
Gregori, A
Rizzi, GA
Tondello, E
Citation: D. Barreca et al., Highly oriented V2O5 nanocrystalline thin films by plasma-enhanced chemical vapor deposition, CHEM MATER, 12(1), 2000, pp. 98-103
Authors:
Losurdo, M
Bruno, G
Barreca, D
Tondello, E
Citation: M. Losurdo et al., Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure, APPL PHYS L, 77(8), 2000, pp. 1129-1131
Authors:
Barreca, D
Buchberger, A
Daolio, S
Depero, LE
Fabrizio, M
Morandini, F
Rizzi, GA
Sangaletti, L
Tondello, E
Citation: D. Barreca et al., A Ru(II) eta(3)-allylic complex as a novel precursor for the CVD of Ru- and RuO2-nanostructured thin films, LANGMUIR, 15(13), 1999, pp. 4537-4543
Authors:
Barreca, D
Depero, LE
Franzato, E
Rizzi, GA
Sangaletti, L
Tondello, E
Vettori, U
Citation: D. Barreca et al., Vanadyl precursors used to modify the properties of vanadium oxide thin films obtained by chemical vapor deposition, J ELCHEM SO, 146(2), 1999, pp. 551-558