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Results:
1-22
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Results: 22
Authors:
MAYER D
HALLMEIER KH
CHASSE T
SZARGAN R
Citation: D. Mayer et al., SXPS ANALYSIS OF PASSIVATION AND COMPLEXATION ON THE CDS (10(1)OVER-BAR-0) SURFACE, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 689-692
Authors:
SCHOMANN S
CHASSE T
Citation: S. Schomann et T. Chasse, SURFACTANT AND ORDERING EFFECTS OF ARSENIC INTERLAYERS AT THE PB INP(110) INTERFACE/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(5), 1998, pp. 2990-2994
Authors:
ZERULLA D
UHLIG I
SZARGAN R
CHASSE T
Citation: D. Zerulla et al., COMPETING INTERACTION OF DIFFERENT THIOL SPECIES ON GOLD SURFACES, Surface science, 404(1-3), 1998, pp. 604-608
Authors:
CHASSE T
CHASSE A
PEISERT H
STREUBEL P
Citation: T. Chasse et al., SULFUR-MODIFIED SURFACE OF INP(001) - EVIDENCE FOR SULFUR INCORPORATION AND SURFACE OXIDATION, Applied physics A: Materials science & processing, 65(6), 1997, pp. 543-549
Authors:
PEISERT H
STREUBEL P
CHASSE T
SZARGAN R
Citation: H. Peisert et al., CHEMICAL-STABILITY OF (NH4)(2)S-PASSIVATED INP(001) SURFACES - INVESTIGATIONS BY XPS AND XPD, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 201-203
INFLUENCE OF SURFACE OXIDATION ON THE PHOTOELECTRON DIFFRACTION INTENSITIES FROM INP SINGLE-CRYSTALS
Authors:
NEFEDOV YI
FEDOROVA IS
SZARGAN R
CHASSE T
PEISERT H
Citation: Yi. Nefedov et al., INFLUENCE OF SURFACE OXIDATION ON THE PHOTOELECTRON DIFFRACTION INTENSITIES FROM INP SINGLE-CRYSTALS, Journal of electron spectroscopy and related phenomena, 87(1), 1997, pp. 73-79
Authors:
FRANKE R
CHASSE T
REINHOLD J
STREUBEL P
SZARGAN R
Citation: R. Franke et al., EXTENDED FENSKE-HALL LCAO MO CALCULATIONS OF CORE-LEVEL SHIFTS IN SOLID P COMPOUNDS, Chemical physics, 220(3), 1997, pp. 299-310
Authors:
TEKNOS TN
METSON R
CHASSE T
BALERCIA G
DICKERSIN GR
Citation: Tn. Teknos et al., NEW DEVELOPMENTS IN THE DIAGNOSIS OF KARTAGENERS-SYNDROME, Otolaryngology and head and neck surgery, 116(1), 1997, pp. 68-74
Authors:
CHASSE T
NEUHOLD G
PAGGEL JJ
HORN K
Citation: T. Chasse et al., INVESTIGATION OF THE SN GAP(110) INTERFACE BY CORE-LEVEL PHOTOEMISSION - INTERFACE REACTION, GROWTH-MORPHOLOGY AND SURFACE PHOTOVOLTAGE EFFECTS/, Applied surface science, 115(4), 1997, pp. 326-335
Authors:
NEFEDOV VI
FEDOROVA IS
PEISERT H
STREUBEL P
CHASSE T
SZARGAN R
Citation: Vi. Nefedov et al., THE INFLUENCE OF THE AMORPHOUS OVERLAYER ON THE PHOTOELECTRON DIFFRACTION INTENSITIES OF THE SINGLE-CRYSTAL, Doklady Akademii nauk. Rossijskaa akademia nauk, 348(3), 1996, pp. 339-342
Authors:
NEUHOLD G
CHASSE T
PAGGEL JJ
HORN K
Citation: G. Neuhold et al., OBSERVATION OF A CS-INDUCED STATE IN THE BAND-GAP OF GAP(110) - ALKALI-METAL BONDING AND FERMI-LEVEL PINNING, Physical review. B, Condensed matter, 54(12), 1996, pp. 8623-8626
Authors:
SCHOMANN S
SCHMIDT K
PEISERT H
CHASSE T
HORN K
Citation: S. Schomann et al., ELECTRONIC AND SURFACTANT EFFECTS OF AS INTERLAYERS AT AG INP(110) INTERFACES/, Surface science, 352, 1996, pp. 855-860
Authors:
SZARGAN R
UHLIG I
CHASSE T
NEFEDOV VI
FEDOROVA IS
YARZHEMSKY VG
Citation: R. Szargan et al., THE INFLUENCE OF ELASTIC-SCATTERING IN OVERLAYERS ON PED FROM PBS SINGLE-CRYSTALS, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 709-714
Authors:
STREUBEL P
PEISERT H
HESSE R
CHASSE T
SZARGAN R
Citation: P. Streubel et al., CHEMICAL BONDING STUDIES ON UV OZONE-TREATED AND (NH4)(2)S-TREATED INP(001) SURFACES BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY/, Surface and interface analysis, 23(9), 1995, pp. 581-588
Authors:
CHASSE T
PEISERT H
STREUBEL P
SZARGAN R
Citation: T. Chasse et al., SULFURIZATION OF INP(001) SURFACES STUDIED BY X-RAY PHOTOELECTRON ANDX-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPIES (XPS XAES)/, Surface science, 333, 1995, pp. 434-440
Authors:
CHASSE T
NEUHOLD G
HORN K
Citation: T. Chasse et al., INVESTIGATION OF THE AS INP(110) INTERFACE BY HIGH-RESOLUTION PHOTOEMISSION/, Surface science, 333, 1995, pp. 511-516
Authors:
CHASSE T
NEUHOLD G
PAGGEL JJ
HORN K
Citation: T. Chasse et al., EVIDENCE FOR SURFACE DERELAXATION INDUCED BY METALS ON III-V COMPOUNDSEMICONDUCTORS - CS INP(110)/, Surface science, 333, 1995, pp. 528-533
Authors:
PEISERT H
CHASSE T
STREUBEL P
MEISEL A
SZARGAN R
Citation: H. Peisert et al., RELAXATION ENERGIES IN XPS AND XAES OF SOLID SULFUR-COMPOUNDS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 321-328
Authors:
CHASSE T
PAGGEL J
NEUHOLD G
THEIS W
HORN K
Citation: T. Chasse et al., PHOTOEMISSION-STUDY OF THE CS GAP(110) INTERFACE AT LOW-TEMPERATURES/, Surface science, 309, 1994, pp. 295-302
Authors:
CHASSE T
PEISERT H
STREUBEL P
SZARGAN R
MEISEL A
Citation: T. Chasse et al., XPS BINDING-ENERGIES OF DEEP CORE LEVELS AND THE AUGER PARAMETER - ANAPPLICATION TO SOLID SULFUR-COMPOUNDS, Acta Physica Polonica. A, 83(6), 1993, pp. 793-802
Authors:
CHASSE T
FRANKE R
URBAN C
FRANZHELD R
STREUBEL P
MEISEL A
Citation: T. Chasse et al., X-RAY PHOTOELECTRON SPECTROSCOPIC CORE-LEVEL SHIFTS OF PHOSPHORUS IN PHOSPHATES AND NATIVE OXIDE LAYERS ON INP(100) - APPLICATIONS OF THE AUGER PARAMETER CONCEPT, Journal of electron spectroscopy and related phenomena, 62(3), 1993, pp. 287-308
Authors:
LUDWIG MH
MEYER E
HEYMANN G
CHASSE T
Citation: Mh. Ludwig et al., ELECTRICAL-PROPERTIES OF RH N-GAAS CONTACTS - A COMPARISON OF DIFFERENT PREPARATION METHODS/, Applied surface science, 68(4), 1993, pp. 445-451
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